JPH03117783U - - Google Patents

Info

Publication number
JPH03117783U
JPH03117783U JP2798190U JP2798190U JPH03117783U JP H03117783 U JPH03117783 U JP H03117783U JP 2798190 U JP2798190 U JP 2798190U JP 2798190 U JP2798190 U JP 2798190U JP H03117783 U JPH03117783 U JP H03117783U
Authority
JP
Japan
Prior art keywords
data
memory
input terminal
test
selects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2798190U
Other languages
English (en)
Japanese (ja)
Other versions
JP2545719Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990027981U priority Critical patent/JP2545719Y2/ja
Publication of JPH03117783U publication Critical patent/JPH03117783U/ja
Application granted granted Critical
Publication of JP2545719Y2 publication Critical patent/JP2545719Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP1990027981U 1990-03-19 1990-03-19 メモリ試験データ選択回路 Expired - Lifetime JP2545719Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990027981U JP2545719Y2 (ja) 1990-03-19 1990-03-19 メモリ試験データ選択回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990027981U JP2545719Y2 (ja) 1990-03-19 1990-03-19 メモリ試験データ選択回路

Publications (2)

Publication Number Publication Date
JPH03117783U true JPH03117783U (enExample) 1991-12-05
JP2545719Y2 JP2545719Y2 (ja) 1997-08-27

Family

ID=31530809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990027981U Expired - Lifetime JP2545719Y2 (ja) 1990-03-19 1990-03-19 メモリ試験データ選択回路

Country Status (1)

Country Link
JP (1) JP2545719Y2 (enExample)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292297A (ja) * 1985-06-19 1986-12-23 Hitachi Ltd Ｉｃの検査装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292297A (ja) * 1985-06-19 1986-12-23 Hitachi Ltd Ｉｃの検査装置

Also Published As

Publication number Publication date
JP2545719Y2 (ja) 1997-08-27

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