JPH0372379U - - Google Patents
Info
- Publication number
- JPH0372379U JPH0372379U JP13265289U JP13265289U JPH0372379U JP H0372379 U JPH0372379 U JP H0372379U JP 13265289 U JP13265289 U JP 13265289U JP 13265289 U JP13265289 U JP 13265289U JP H0372379 U JPH0372379 U JP H0372379U
- Authority
- JP
- Japan
- Prior art keywords
- correction data
- delay
- circuit
- channel
- delay compensation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13265289U JPH0742149Y2 (ja) | 1989-11-15 | 1989-11-15 | Ic試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13265289U JPH0742149Y2 (ja) | 1989-11-15 | 1989-11-15 | Ic試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0372379U true JPH0372379U (enrdf_load_stackoverflow) | 1991-07-22 |
JPH0742149Y2 JPH0742149Y2 (ja) | 1995-09-27 |
Family
ID=31680100
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13265289U Expired - Lifetime JPH0742149Y2 (ja) | 1989-11-15 | 1989-11-15 | Ic試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0742149Y2 (enrdf_load_stackoverflow) |
-
1989
- 1989-11-15 JP JP13265289U patent/JPH0742149Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0742149Y2 (ja) | 1995-09-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE296463T1 (de) | Vorrichtung zum parallelen prüfen von halbleiterschaltkreisen | |
JPS5388517A (en) | Noise eliminating circuit of solid state pickup device | |
WO1999017121A3 (en) | Format sensitive timing calibration for an integrated circuit tester | |
JPH0372379U (enrdf_load_stackoverflow) | ||
EP0389683A3 (en) | Apparatus and method for regulating a measurement system | |
JPS6110214Y2 (enrdf_load_stackoverflow) | ||
JPS6478581A (en) | Picture blurring corrector for video camera | |
JPS547371A (en) | Electronic watch | |
JPS6012925U (ja) | 田植機の施肥装置 | |
JPH0352682U (enrdf_load_stackoverflow) | ||
FR2366575A1 (fr) | Dispositif de mesure du facteur de qualite d'elements de circuits oscillants | |
JPH01152272U (enrdf_load_stackoverflow) | ||
JPS644191A (en) | Noise evaluation device for solid-state camera | |
JPS647636A (en) | Semiconductor integrated circuit device with gate array and memory | |
JPS5369546A (en) | Method and apparatus for memory unit test | |
JPH0360087U (enrdf_load_stackoverflow) | ||
JPH039041U (enrdf_load_stackoverflow) | ||
JPH0481080U (enrdf_load_stackoverflow) | ||
JPS60136200U (ja) | チツプ基板検査装置 | |
JPS6473349A (en) | Printing simulation device | |
JPH02675U (enrdf_load_stackoverflow) | ||
JPS5596766A (en) | Noise reduction circuit in solid image pickup device | |
JPH0334258B2 (enrdf_load_stackoverflow) | ||
JPS5446476A (en) | Integrated-circuit package | |
JPS5798843A (en) | Device for checking external appearance of lamp |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |