JPH0366624B2 - - Google Patents
Info
- Publication number
- JPH0366624B2 JPH0366624B2 JP57104864A JP10486482A JPH0366624B2 JP H0366624 B2 JPH0366624 B2 JP H0366624B2 JP 57104864 A JP57104864 A JP 57104864A JP 10486482 A JP10486482 A JP 10486482A JP H0366624 B2 JPH0366624 B2 JP H0366624B2
- Authority
- JP
- Japan
- Prior art keywords
- speed clock
- test
- output
- low
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P74/00—
Landscapes
- Design And Manufacture Of Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57104864A JPS58222534A (ja) | 1982-06-18 | 1982-06-18 | 集積回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57104864A JPS58222534A (ja) | 1982-06-18 | 1982-06-18 | 集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58222534A JPS58222534A (ja) | 1983-12-24 |
| JPH0366624B2 true JPH0366624B2 (show.php) | 1991-10-18 |
Family
ID=14392104
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57104864A Granted JPS58222534A (ja) | 1982-06-18 | 1982-06-18 | 集積回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58222534A (show.php) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61191973A (ja) * | 1985-02-20 | 1986-08-26 | Fujitsu Ltd | 試験回路をそなえた半導体集積回路 |
| JPH0810724B2 (ja) * | 1987-08-05 | 1996-01-31 | 富士通株式会社 | ゲ−トアレイ及びメモリを有する半導体集積回路装置 |
| JPH0740059B2 (ja) * | 1988-06-15 | 1995-05-01 | 富士通株式会社 | 超大規模集積回路の試験容易化方法 |
-
1982
- 1982-06-18 JP JP57104864A patent/JPS58222534A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58222534A (ja) | 1983-12-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5997065A (ja) | 論理回路試験装置の試験パタ−ン発生装置 | |
| US7046094B2 (en) | Method and ring oscillator circuit for measuring circuit delays over a wide operating range | |
| JPH0366624B2 (show.php) | ||
| US20040218459A1 (en) | Oscillation based access time measurement | |
| US7065684B1 (en) | Circuits and methods for measuring signal propagation delays on integrated circuits | |
| JPS58201151A (ja) | 集積回路 | |
| US6145087A (en) | Semiconductor integrated device | |
| JP2002196046A (ja) | 半導体集積回路およびそのテスト方法 | |
| JP3847150B2 (ja) | 半導体集積回路とそのジッタ測定方法 | |
| JP2000304816A (ja) | 診断機能付き論理集積回路および論理集積回路の診断方法 | |
| JP3058130B2 (ja) | 高速半導体集積回路装置のテスト回路 | |
| JPS6089937A (ja) | 集積回路装置 | |
| JPH0368878A (ja) | 半導体集積回路装置 | |
| JPH09218246A (ja) | 論理回路の高速動作検証方法 | |
| JPH0627785B2 (ja) | 半導体集積回路 | |
| JP4215860B2 (ja) | タイミングパルス発生回路および半導体試験装置 | |
| JP2599759B2 (ja) | フリップフロップテスト方式 | |
| JP2856169B2 (ja) | スキャンパス回路 | |
| JP3685419B2 (ja) | テスト容易化回路 | |
| JPH0329871A (ja) | 論理集積回路 | |
| JP3698269B2 (ja) | Lsiのディレイ測定方法 | |
| JPH0536752B2 (show.php) | ||
| JPH0526147B2 (show.php) | ||
| CN118966107A (zh) | 一种基于芯片性能的电压控制方法和电压频率检测电路 | |
| JPH02180428A (ja) | リセット回路 |