JPH036493B2 - - Google Patents
Info
- Publication number
- JPH036493B2 JPH036493B2 JP19641285A JP19641285A JPH036493B2 JP H036493 B2 JPH036493 B2 JP H036493B2 JP 19641285 A JP19641285 A JP 19641285A JP 19641285 A JP19641285 A JP 19641285A JP H036493 B2 JPH036493 B2 JP H036493B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- mask
- circuit pattern
- nitrocellulose
- ultraviolet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60196412A JPS6255654A (ja) | 1985-09-03 | 1985-09-03 | 半導体装置用マスク |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60196412A JPS6255654A (ja) | 1985-09-03 | 1985-09-03 | 半導体装置用マスク |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6255654A JPS6255654A (ja) | 1987-03-11 |
| JPH036493B2 true JPH036493B2 (cg-RX-API-DMAC10.html) | 1991-01-30 |
Family
ID=16357425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60196412A Granted JPS6255654A (ja) | 1985-09-03 | 1985-09-03 | 半導体装置用マスク |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6255654A (cg-RX-API-DMAC10.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL2017914B1 (en) | 2015-12-17 | 2018-01-11 | Asml Holding Nv | Pellicle and pellicle assembly |
-
1985
- 1985-09-03 JP JP60196412A patent/JPS6255654A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6255654A (ja) | 1987-03-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH03209479A (ja) | 露光方法 | |
| US3317320A (en) | Duo resist process | |
| GB2291218A (en) | Phase shift mask | |
| US6743735B2 (en) | Photoresist removal from alignment marks through wafer edge exposure | |
| JP2912338B1 (ja) | ホトマスク | |
| CA1315023C (en) | Photo-mask | |
| JPS58100852A (ja) | フオトマスク | |
| EP0327883A3 (en) | Single coating positive or negative working color proofing system | |
| JPS6255654A (ja) | 半導体装置用マスク | |
| US5928814A (en) | Photomask controlling transmissivity by using an impurity-containing film formed on a transparent substrate | |
| JPH0812416B2 (ja) | マスク | |
| JPS61241756A (ja) | ホトマスク | |
| JPS6250758A (ja) | パタ−ン形成方法 | |
| JPH0635167A (ja) | プリント回路基板露光用フォトマスク | |
| KR0142791B1 (ko) | 레티클구조 | |
| FR2297093A1 (fr) | Procede pour deposer des revetements differents contigus jointifs sur un substrat transparent et produits obtenus | |
| JPH0440456A (ja) | フォトマスクの製造方法 | |
| JPH03150565A (ja) | フォトマスクの製造方法 | |
| JPS63128348A (ja) | マスク修正方法 | |
| JP3108986B2 (ja) | 位相シフトマスクの製造方法 | |
| EP0311399A3 (en) | Registering to a moving web | |
| SU1215081A1 (ru) | Способ изготовлени фотошаблонов | |
| JPS6315249A (ja) | 光学マスクの製造方法 | |
| JPH02166448A (ja) | パターン修正方法 | |
| JPH03156458A (ja) | フォトマスク |