JPH0356469B2 - - Google Patents
Info
- Publication number
- JPH0356469B2 JPH0356469B2 JP57208471A JP20847182A JPH0356469B2 JP H0356469 B2 JPH0356469 B2 JP H0356469B2 JP 57208471 A JP57208471 A JP 57208471A JP 20847182 A JP20847182 A JP 20847182A JP H0356469 B2 JPH0356469 B2 JP H0356469B2
- Authority
- JP
- Japan
- Prior art keywords
- rinsing
- ipa
- resist
- chloroacrylate
- copolymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57208471A JPS5999720A (ja) | 1982-11-30 | 1982-11-30 | レジスト像形成方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57208471A JPS5999720A (ja) | 1982-11-30 | 1982-11-30 | レジスト像形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5999720A JPS5999720A (ja) | 1984-06-08 |
| JPH0356469B2 true JPH0356469B2 (enExample) | 1991-08-28 |
Family
ID=16556720
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57208471A Granted JPS5999720A (ja) | 1982-11-30 | 1982-11-30 | レジスト像形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5999720A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69032464T2 (de) * | 1989-10-19 | 1998-11-12 | Fujitsu Ltd | Verfahren zur Herstellung von Photolackmustern |
| JP2007191399A (ja) * | 2006-01-17 | 2007-08-02 | Arakawa Chem Ind Co Ltd | 脂環式化合物およびその製造方法 |
| JP6379293B2 (ja) * | 2015-06-23 | 2018-08-22 | 富士フイルム株式会社 | パターン形成方法、及び電子デバイスの製造方法 |
-
1982
- 1982-11-30 JP JP57208471A patent/JPS5999720A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5999720A (ja) | 1984-06-08 |
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