JPH0354312B2 - - Google Patents
Info
- Publication number
- JPH0354312B2 JPH0354312B2 JP58141326A JP14132683A JPH0354312B2 JP H0354312 B2 JPH0354312 B2 JP H0354312B2 JP 58141326 A JP58141326 A JP 58141326A JP 14132683 A JP14132683 A JP 14132683A JP H0354312 B2 JPH0354312 B2 JP H0354312B2
- Authority
- JP
- Japan
- Prior art keywords
- self
- probe pins
- pattern
- diagnosis
- printed wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 82
- 238000007689 inspection Methods 0.000 claims description 51
- 238000004092 self-diagnosis Methods 0.000 claims description 44
- 238000000034 method Methods 0.000 claims description 25
- 239000007787 solid Substances 0.000 claims description 19
- 238000012360 testing method Methods 0.000 description 11
- 239000000758 substrate Substances 0.000 description 10
- 238000010586 diagram Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 239000004593 Epoxy Substances 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000011889 copper foil Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000003745 diagnosis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58141326A JPS6033064A (ja) | 1983-08-01 | 1983-08-01 | パターン検査装置の自己診断方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58141326A JPS6033064A (ja) | 1983-08-01 | 1983-08-01 | パターン検査装置の自己診断方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6033064A JPS6033064A (ja) | 1985-02-20 |
| JPH0354312B2 true JPH0354312B2 (h) | 1991-08-19 |
Family
ID=15289327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58141326A Granted JPS6033064A (ja) | 1983-08-01 | 1983-08-01 | パターン検査装置の自己診断方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6033064A (h) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6279997A (ja) * | 1985-10-04 | 1987-04-13 | 沖電気工業株式会社 | センサの機能自己診断方法 |
| KR100544343B1 (ko) * | 2003-07-16 | 2006-01-23 | 주식회사 영테크 | 인쇄회로기판 검사장치 |
| JP7051927B2 (ja) * | 2020-03-31 | 2022-04-11 | 矢崎総業株式会社 | シールド電線の端末処理部の検査装置およびその検査装置の機能診断方法 |
-
1983
- 1983-08-01 JP JP58141326A patent/JPS6033064A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6033064A (ja) | 1985-02-20 |
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