JPH0348614B2 - - Google Patents

Info

Publication number
JPH0348614B2
JPH0348614B2 JP59205154A JP20515484A JPH0348614B2 JP H0348614 B2 JPH0348614 B2 JP H0348614B2 JP 59205154 A JP59205154 A JP 59205154A JP 20515484 A JP20515484 A JP 20515484A JP H0348614 B2 JPH0348614 B2 JP H0348614B2
Authority
JP
Japan
Prior art keywords
slit
piece
movable
piezoelectric element
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59205154A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6182649A (ja
Inventor
Wataru Ogawa
Shinzo Tanaka
Yasuyoshi Oota
Katsuaki Shirato
Kozo Shimazu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59205154A priority Critical patent/JPS6182649A/ja
Publication of JPS6182649A publication Critical patent/JPS6182649A/ja
Publication of JPH0348614B2 publication Critical patent/JPH0348614B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP59205154A 1984-09-29 1984-09-29 スリツト機構 Granted JPS6182649A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59205154A JPS6182649A (ja) 1984-09-29 1984-09-29 スリツト機構

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59205154A JPS6182649A (ja) 1984-09-29 1984-09-29 スリツト機構

Publications (2)

Publication Number Publication Date
JPS6182649A JPS6182649A (ja) 1986-04-26
JPH0348614B2 true JPH0348614B2 (un) 1991-07-25

Family

ID=16502311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59205154A Granted JPS6182649A (ja) 1984-09-29 1984-09-29 スリツト機構

Country Status (1)

Country Link
JP (1) JPS6182649A (un)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63127200A (ja) * 1986-11-17 1988-05-31 株式会社島津製作所 スリツト装置
DE10323923A1 (de) * 2003-05-22 2004-12-16 Carl Zeiss Jena Gmbh Einstellbares Pinhole, insbesondere für ein Laser-Scanning-Mikroskop
DE10323922A1 (de) 2003-05-22 2004-12-16 Carl Zeiss Jena Gmbh Einstellbares Pinhole
CN109001116B (zh) * 2018-08-02 2020-09-29 佛山市方垣机仪设备有限公司 一种入射狭缝调节机构及应用其的原子发射光谱仪

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60177542A (ja) * 1984-02-22 1985-09-11 Murata Mfg Co Ltd 質量分析装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60177542A (ja) * 1984-02-22 1985-09-11 Murata Mfg Co Ltd 質量分析装置

Also Published As

Publication number Publication date
JPS6182649A (ja) 1986-04-26

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