JPH0345529B2 - - Google Patents
Info
- Publication number
- JPH0345529B2 JPH0345529B2 JP57126415A JP12641582A JPH0345529B2 JP H0345529 B2 JPH0345529 B2 JP H0345529B2 JP 57126415 A JP57126415 A JP 57126415A JP 12641582 A JP12641582 A JP 12641582A JP H0345529 B2 JPH0345529 B2 JP H0345529B2
- Authority
- JP
- Japan
- Prior art keywords
- photoresist
- substrate
- film thickness
- rotating
- seconds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57126415A JPS5916333A (ja) | 1982-07-19 | 1982-07-19 | レジストの塗布方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57126415A JPS5916333A (ja) | 1982-07-19 | 1982-07-19 | レジストの塗布方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5916333A JPS5916333A (ja) | 1984-01-27 |
| JPH0345529B2 true JPH0345529B2 (enExample) | 1991-07-11 |
Family
ID=14934596
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57126415A Granted JPS5916333A (ja) | 1982-07-19 | 1982-07-19 | レジストの塗布方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5916333A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101515510B1 (ko) * | 2013-12-09 | 2015-04-27 | 전자부품연구원 | 태양광 모듈에 적층된 부유물 측정 시스템 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6197923A (ja) * | 1984-10-19 | 1986-05-16 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| JPS6334925A (ja) * | 1986-07-29 | 1988-02-15 | Nec Corp | フオトレジスト膜の形成方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5226214A (en) * | 1975-08-25 | 1977-02-26 | Hitachi Ltd | Method for coating resist |
-
1982
- 1982-07-19 JP JP57126415A patent/JPS5916333A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101515510B1 (ko) * | 2013-12-09 | 2015-04-27 | 전자부품연구원 | 태양광 모듈에 적층된 부유물 측정 시스템 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5916333A (ja) | 1984-01-27 |
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