JPH0340300A - Sample-and-hold circuit - Google Patents

Sample-and-hold circuit

Info

Publication number
JPH0340300A
JPH0340300A JP1173015A JP17301589A JPH0340300A JP H0340300 A JPH0340300 A JP H0340300A JP 1173015 A JP1173015 A JP 1173015A JP 17301589 A JP17301589 A JP 17301589A JP H0340300 A JPH0340300 A JP H0340300A
Authority
JP
Japan
Prior art keywords
input terminal
sample
hold circuit
electric charge
analog switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1173015A
Other languages
Japanese (ja)
Inventor
Mamoru Seike
守 清家
Shinji Kinuyama
真二 衣山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1173015A priority Critical patent/JPH0340300A/en
Publication of JPH0340300A publication Critical patent/JPH0340300A/en
Pending legal-status Critical Current

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  • Analogue/Digital Conversion (AREA)

Abstract

PURPOSE:To simplify configuration and to reduce an offset voltage by canceling a spike electric charge, which is generated when an analog switch is changed over from ON to OFF, with a compensating circuit composed of a complementary MOS Tr. CONSTITUTION:A pMOS Tr 3' and an nMOS Tr 4' constitute the electric charge compensating circuit 8 of a spike voltage. When the potential of a clock input terminal A is changed from 'H' to 'L', namely, when an analog switch 7 is changed from ON to OFF, the spike electric charge to inject from a gate electrode to source and drain is generated. However, the charge is canceled by an electric charge compensating circuit 8 and the offset voltage by the analog switch 7 is not added to the electric charge to be charged in a capacitor 6. Thus, a sample-and-hold circuit, for which the offset voltage is reduced, can be obtained.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、オフセット電圧を軽減する相補型MO8型ト
ランジスタにより形成するサンプルホールド回路に関す
る。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a sample-and-hold circuit formed by complementary MO8 type transistors that reduces offset voltage.

(従来の技術) 第2図は従来のサンプルホールド回路を示し、1.2は
オペアンプ、3はpMOSトランジスタ(以後、トラン
ジスタをTrと記す)、4はnMO8Tr、5はインバ
ータ、6は容量である。またINはアナログ信号入力端
子、o u ’rは出力端子、Aはサンプリングクロッ
ク(以下、単にクロックという)入力端子である。
(Prior art) Fig. 2 shows a conventional sample and hold circuit, in which 1.2 is an operational amplifier, 3 is a pMOS transistor (hereinafter, the transistor is referred to as Tr), 4 is nMO8Tr, 5 is an inverter, and 6 is a capacitor. . Further, IN is an analog signal input terminal, o u 'r is an output terminal, and A is a sampling clock (hereinafter simply referred to as clock) input terminal.

この構成のサンプルホールド回路は、まずアナログ信号
入力端子INに、任意のアナログ信号を印加し、クロッ
ク入力端子Aにハイレベル電位II HI+を印加する
と、上記p M OS T r 3およびnMO3Tr
4からなるアナログスイッチ7がオンとなって、容′M
、6が入力端子INの゛電位に充電される。つぎにクロ
ック入力端子AをHL I+レベルにすると、上記アナ
ログスイッチ7はオフとなり、容量6が保持した前記電
位を出力端子OUTに出力する。
The sample hold circuit with this configuration first applies an arbitrary analog signal to the analog signal input terminal IN, and then applies a high-level potential II HI+ to the clock input terminal A.
The analog switch 7 consisting of 4 is turned on, and the
, 6 are charged to the potential of the input terminal IN. Next, when the clock input terminal A is set to the HL I+ level, the analog switch 7 is turned off, and the potential held by the capacitor 6 is outputted to the output terminal OUT.

(発明が解決しようとする課題) しかしながら、第2図のサンプルホールド回路は、アナ
ログスイッチ7が、オンからオフに切換わる時スパイク
電荷がゲートからソースおよびドレインに印加されてオ
フセット電圧が発生する。
(Problems to be Solved by the Invention) However, in the sample and hold circuit shown in FIG. 2, when the analog switch 7 is switched from on to off, spike charges are applied from the gate to the source and drain, and an offset voltage is generated.

すなわち、容量6に充電される電位は、アナログ信号入
力端子INの電位と前記のスパイク電荷により発生する
オフセット電圧との合計になり。
That is, the potential charged in the capacitor 6 is the sum of the potential of the analog signal input terminal IN and the offset voltage generated by the spike charge.

それがサンプルホールド回路出力として出力端子OUT
から出力される。
It is the output terminal OUT as the sample and hold circuit output.
is output from.

本発明は上記のようなサンプルホールド回路要部を構成
するアナログスイッチのスイッチ動作時に発生するスパ
イク電荷を低減させ、オフセット屯泣の少ない出力のサ
ンプルホールド回路の提供を目的とする。
It is an object of the present invention to provide a sample-and-hold circuit which reduces the spike charges generated during the switching operation of the analog switch constituting the main part of the sample-and-hold circuit as described above, and which outputs less offset noise.

(課題を解決するための手段) 本発明は上記の目的を、反転入力端子と出力端子を接続
し、非反転入力端子を入力端子とする第りのオペアンプ
と、その出力を相補型MO8)−ランジスタで構成した
トランスファーゲートを経て。
(Means for Solving the Problems) The present invention has achieved the above object by providing a first operational amplifier whose inverting input terminal and output terminal are connected and whose input terminal is a non-inverting input terminal, and whose output is a complementary type MO8)- Through a transfer gate made up of transistors.

第2のオペアンプの非反転入力端子に接続するとともに
、容量により接地したサンプルホールド回路において、
上記第2のオペアンプと容量との間に、pMO8トラン
ジスタとnMOSトランジスタを、それらのソースおよ
びドレインを共通に接続して挿入接続したサンプルホー
ルド回路によって達成する。
In the sample hold circuit connected to the non-inverting input terminal of the second operational amplifier and grounded by a capacitor,
This is achieved by a sample and hold circuit in which a pMO8 transistor and an nMOS transistor are inserted and connected between the second operational amplifier and the capacitor, with their sources and drains connected in common.

(作 用) 上記の構成の本発明によれば、アナログ信号がサンプル
ホールドされる時に発生する、スパイク電荷によるオフ
セット電圧が軽減された出力が得られる。
(Function) According to the present invention having the above configuration, an output can be obtained in which an offset voltage due to spike charges that occurs when an analog signal is sampled and held is reduced.

(実施例) 以下、本発明を実施例によって図面を用いて説明する。(Example) Hereinafter, the present invention will be explained by using examples and drawings.

第1図は本発明の一実施例の回路図で3’、 4′はそ
れぞれ、p MOS Tr、 n MOS Trであり
、その他の符号は第2図と同一、または同一機能のもの
を示している。
FIG. 1 is a circuit diagram of an embodiment of the present invention, and 3' and 4' are p MOS Tr and n MOS Tr, respectively, and other symbols are the same as those in FIG. 2 or indicate the same functions. There is.

このように構成する本発明は、クロック入力端子Aにお
ける電位が、IIH”またはIt L 11のときの、
入力端子INのアナログ信号入力に対する出力端子OU
Tの基本動作は第2図の従来例と同じである。ここでp
MO8Tr3′とnMO3Tr4′はスパイク電圧の電
荷補償回路8を構成している。
The present invention configured as described above has the following effect when the potential at the clock input terminal A is IIH" or It L 11.
Output terminal OU for analog signal input of input terminal IN
The basic operation of T is the same as the conventional example shown in FIG. Here p
MO8Tr3' and nMO3Tr4' constitute a spike voltage charge compensation circuit 8.

いま、クロック入力端子Aの電位が1H″′から11 
L IIに変化するとき、言換えるとアナログスイッチ
7がオンからオフに変化する時、そのゲート電極からソ
ースおよびトレインに注入されるスパイク′屯荷を発生
するが、上記電荷補償回路8によって相殺され、容量6
に充電される電荷はアナログスイッチ7によるオフセッ
ト電圧は加算されないことになる。すなわちオフセット
電圧が軽減されたサンプルホールド回路となる。
Now, the potential of clock input terminal A is changing from 1H'' to 11
When the analog switch 7 changes from on to off, in other words, when the analog switch 7 changes from on to off, it generates a spike load that is injected from its gate electrode into the source and train, but this is canceled out by the charge compensation circuit 8. , capacity 6
The offset voltage caused by the analog switch 7 is not added to the charges charged in the . In other words, it becomes a sample hold circuit with reduced offset voltage.

(発明の効果) 以上、説明して明らかなように本発明は5相補型MO8
Trにより構成されたアナログスイッチが、オンからオ
フに切換ねる際に生ずるスパイク電荷を、相補型MO3
Trで構成した補償回路によって相殺させるサンプルホ
ールド回路であり、構成容易でオフセット電圧を軽減す
る効果がある。
(Effects of the Invention) As is clear from the above explanation, the present invention provides a 5-complementary MO8
A complementary MO3
This is a sample-and-hold circuit that is offset by a compensation circuit made up of transistors, and is easy to configure and has the effect of reducing offset voltage.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例のサンプルホールド回路を示
す回路図、第2図は従来のサンプルホールド回路を示す
図である。 1.2 ・・・オペアンプ、 3,3′ ・・・pMO
Sトランジスタ(p M OS Trと略す)、 4,
4′・・・ nMOSトランジスタ(nMO8Trと略
す)、 5 ・・・インバータ、 6 ・・・容量、 
7 ・・・アナログスイッチ、 8 ・・・電荷補償回
路、 IN・・アナログ信号入力端子、 OUT ・・
・出力端子、 A・・・サンプリングクロック入力端子
(タロツク入力端子と略す)。
FIG. 1 is a circuit diagram showing a sample and hold circuit according to an embodiment of the present invention, and FIG. 2 is a diagram showing a conventional sample and hold circuit. 1.2 ... operational amplifier, 3,3' ... pMO
S transistor (abbreviated as pMOS Tr), 4,
4'... nMOS transistor (abbreviated as nMO8Tr), 5... inverter, 6... capacitor,
7...Analog switch, 8...Charge compensation circuit, IN...Analog signal input terminal, OUT...
- Output terminal, A... Sampling clock input terminal (abbreviated as tarok input terminal).

Claims (1)

【特許請求の範囲】[Claims] 反転入力端子と出力端子を接続し、非反転入力端子を入
力端子とする第1のオペアンプと、その出力を相補型M
OSトランジスタで構成したトランスファーゲートを経
て、第2のオペアンプの非反転入力端子に接続するとと
もに、容量により接地したサンプルホールド回路におい
て、上記第2のオペアンプと容量との間に、pMOSト
ランジスタとnMOSトランジスタを、それらのソース
およびドレインを共通に接続して挿入接続したことを特
徴とするサンプルホールド回路。
A first operational amplifier whose inverting input terminal and output terminal are connected and whose non-inverting input terminal is an input terminal;
A pMOS transistor and an nMOS transistor are connected between the second operational amplifier and the capacitor in a sample-and-hold circuit that is connected to the non-inverting input terminal of the second operational amplifier through a transfer gate configured with an OS transistor and grounded by a capacitor. A sample-and-hold circuit is characterized in that the sources and drains thereof are connected in common and inserted.
JP1173015A 1989-07-06 1989-07-06 Sample-and-hold circuit Pending JPH0340300A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1173015A JPH0340300A (en) 1989-07-06 1989-07-06 Sample-and-hold circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1173015A JPH0340300A (en) 1989-07-06 1989-07-06 Sample-and-hold circuit

Publications (1)

Publication Number Publication Date
JPH0340300A true JPH0340300A (en) 1991-02-21

Family

ID=15952619

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1173015A Pending JPH0340300A (en) 1989-07-06 1989-07-06 Sample-and-hold circuit

Country Status (1)

Country Link
JP (1) JPH0340300A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5440263A (en) * 1992-04-30 1995-08-08 Sgs-Thomson Microelectronics, S.A. Voltage threshold detection circuit with very low power consumption
JPH08235891A (en) * 1995-02-24 1996-09-13 Sony Corp Signal processing circuit and charge transfer device using the same
US6561929B2 (en) 2000-08-15 2003-05-13 Bridgestone Sports Co., Ltd. Two-piece golf ball

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5440263A (en) * 1992-04-30 1995-08-08 Sgs-Thomson Microelectronics, S.A. Voltage threshold detection circuit with very low power consumption
US5619165A (en) * 1992-04-30 1997-04-08 Sgs-Thomson Microelectronics, S.A. Voltage threshold detection circuit with very low consumption
JPH08235891A (en) * 1995-02-24 1996-09-13 Sony Corp Signal processing circuit and charge transfer device using the same
US6561929B2 (en) 2000-08-15 2003-05-13 Bridgestone Sports Co., Ltd. Two-piece golf ball

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