JPH0336704A - Thick-film hybrid integrated circuit element and adjusting method for resistance thereof - Google Patents

Thick-film hybrid integrated circuit element and adjusting method for resistance thereof

Info

Publication number
JPH0336704A
JPH0336704A JP1172252A JP17225289A JPH0336704A JP H0336704 A JPH0336704 A JP H0336704A JP 1172252 A JP1172252 A JP 1172252A JP 17225289 A JP17225289 A JP 17225289A JP H0336704 A JPH0336704 A JP H0336704A
Authority
JP
Japan
Prior art keywords
resistor
resistance value
resistance
value
trimming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1172252A
Other languages
Japanese (ja)
Inventor
Itsuro Uchida
内田 逸郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1172252A priority Critical patent/JPH0336704A/en
Publication of JPH0336704A publication Critical patent/JPH0336704A/en
Pending legal-status Critical Current

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  • Parts Printed On Printed Circuit Boards (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)

Abstract

PURPOSE:To enable resistance to be adjusted freely after baked a resistor by providing an auxiliary conductor which is in conduction state with the resistor formed between parallel electrode parts to the resistor for reducing resistance of the resistor. CONSTITUTION:An electrode part 1 is an electrode where a resistor element is connected to and has a main constituent such as Ag/Pd. A resistor 2 has a main constituent of RuO, etc., and areas between the parallel electrode parts 1 are connected, thus forming the resistor element. By cutting one part of the resistor 2 and by forming a trimming part 2, the resistance can be increased. An auxiliary conductor 4 is, for example, a polymer-type conductive paste with a main constituent such as silver powder. The resistance is adjusted by providing the resistor 2 between the parallel electrode parts 1. If the resistance after baked is lower than a specified value, it is increased to a specified value by trimming. If it is higher, for example, the above paste layer is provided on the resistor 2, it is baked at 150-250 deg.C, the auxiliary conductor 4 is formed, the resistance of the resistor 2 is reduced to a proper value, and then compensation is made by trimming. Also, compensation in this case is possible only at the auxiliary conductor 4.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はテレビジラン受像機、テープレコーダ等に使用
される厚膜混成集積回路素子及びその抵抗値の調整方法
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a thick film hybrid integrated circuit element used in television receivers, tape recorders, etc., and a method for adjusting its resistance value.

従来の技術 第4図を用いて従来の厚膜混成集積回路素子である抵抗
体構造について説明する。第4図において電極部lは抵
抗体素子を接続する電極であり、例えばAg/Pd等を
主成分とする。抵抗体2は例えばRu○等を主成分とす
る抵抗体材料を用いて並列する電極部lの間を接続し、
抵抗体素子を形成した部分である。トリミング部3はレ
ーザー光線等で抵抗体2の1部を熱で溶かし切れ目を入
れて電流を流れに<<シ、抵抗値を上げた所である。す
なわち、抵抗体2を端子電極である電極部1に重なるよ
うに形成し、抵抗体2を乾燥させた後、例えばRu○の
の場合800°C以上の高温で焼成する。焼成後の抵抗
値は所定値に対して最小で約50%、最大で約120%
の幅でばらつく、特に所定値に対して100%未満の値
を示したものについてはレーザー光線等により抵抗体2
をトリごソゲすることで、抵抗値を上げて補正を行い、
所定値まで調整可能であったが、焼成後の値が所定値を
越えるものについては抵抗値の補正が出来ない為に回路
の特性が出す、全く利用できないものになっていた。
BACKGROUND OF THE INVENTION A resistor structure which is a conventional thick film hybrid integrated circuit element will be described with reference to FIG. In FIG. 4, an electrode portion l is an electrode for connecting a resistor element, and is mainly composed of, for example, Ag/Pd. The resistor 2 connects the parallel electrode parts l using a resistor material whose main component is, for example, Ru○,
This is the part where the resistor element is formed. The trimming part 3 is a part where a part of the resistor 2 is melted with heat using a laser beam or the like and a cut is made to allow current to flow and increase the resistance value. That is, the resistor 2 is formed so as to overlap the electrode portion 1, which is a terminal electrode, and after the resistor 2 is dried, it is fired at a high temperature of 800° C. or more in the case of Ru○, for example. The resistance value after firing is a minimum of approximately 50% and a maximum of approximately 120% of the specified value.
If the resistance value varies within a range, especially if it shows a value less than 100% of the predetermined value, the resistor 2 can be removed using a laser beam, etc.
By adjusting the resistance value, increase the resistance value and correct it.
Although it was possible to adjust the resistance up to a predetermined value, if the value after firing exceeded the predetermined value, the resistance value could not be corrected and the circuit characteristics would be affected, making it completely unusable.

そこで上記のような従来の抵抗値のバラツキという問題
点に対して第5図を用いて詳しく説明する。理想的な抵
抗体材料ならば、同一条件で焼成を操り返せば必ず同じ
値が出るはずである。しかし現在の材料では、同一の条
件で焼成を行っても最大で120%、最小で50%の値
しか示さない。そこで最大の120%で抵抗体焼威藝が
行われる場合を想定し、所定値の80%を仮の所定値と
して、回路素子設計を行う。こうすれば、120%の割
合で抵抗体焼成が行われたとしても、理論的には0.8
X1.2 =0.96とほぼ所定値が出るようになるわ
けである。しかし、最小の50%で抵抗体焼成が行われ
た場合、0.8X0.5 =0.4と40%しか抵抗値
が出ない為にトリミングにより150%の抵抗(+!!
補正をかけなければならず、生産性が極端に悪くなって
いた。
Therefore, the problem of the conventional resistance value variation as described above will be explained in detail using FIG. 5. If the resistor material is ideal, the same value should be produced if the firing is repeated under the same conditions. However, with current materials, even if fired under the same conditions, the maximum value is only 120% and the minimum value is only 50%. Therefore, assuming a case where the resistor burnout is performed at a maximum of 120%, the circuit element is designed using 80% of the predetermined value as a provisional predetermined value. In this way, even if the resistor is fired at a rate of 120%, theoretically the firing rate will be 0.8%.
This means that X1.2 = 0.96, which is almost the predetermined value. However, when the resistor is fired at the minimum 50%, the resistance value is only 40% (0.8X0.5 = 0.4), so trimming increases the resistance by 150% (+!!
Corrections had to be made, and productivity was extremely poor.

発明が解決しようとする課題 そこで上記のような従来の抵抗値のばらつきに対して焼
成後の値が所定値を越えないような抵抗体の焼成を試み
ているが、抵抗値のばらつきを小さくできる焼成方法及
び抵抗体材料はまだ開発されておらず、焼成後にトリミ
ングによって抵抗値を調整できるよう抵抗体の形成を行
わなければならなかった。しかも所定の値よりも50%
以上低い抵抗体をトリミングすることは、何度もトリミ
ングを繰り返すことであるから、生産性が非常に悪いと
いう問題点を有していた。そこでトリミング量をできる
だけ少なくしてやることで生産性を上げてやることので
きる厚膜混成集積回路素子の開発が待たれていた。
Problems to be Solved by the Invention Therefore, attempts have been made to fire a resistor in which the value after firing does not exceed a predetermined value in response to the conventional variation in resistance value as described above, but it is possible to reduce the variation in resistance value. The firing method and resistor material have not yet been developed, and the resistor must be formed after firing so that the resistance value can be adjusted by trimming. Moreover, it is 50% higher than the predetermined value.
Trimming a resistor with such a low resistance involves repeating the trimming many times, which poses a problem in that productivity is extremely low. Therefore, the development of a thick film hybrid integrated circuit element that can increase productivity by minimizing the amount of trimming has been awaited.

本発明は上記の課題に鑑み、従来の欠点を補うような生
産性の高い厚Wg4混威集積回路素子の抵抗体構造及び
その抵抗値調整方法を実現しようとするものである。
In view of the above-mentioned problems, the present invention aims to realize a resistor structure of a Wg4 mixed integrated circuit element with high productivity and a method for adjusting its resistance value, which compensates for the drawbacks of the conventional resistor.

課題を解決するための手段 上記!lBを解決するために本発明は、並列した電極部
の間に形成された抵抗体と、その抵抗体の抵抗値を調整
するために前記抵抗体と導通状態にある補助導体を備え
たことを特徴とする。そしてこの構造によれば、抵抗体
の抵抗値が所定値よりも低く出た場合は抵抗体をトリミ
ングしてやることで抵抗値を上げて抵抗値の調整を行う
、又、抵抗値が高く出た場合は抵抗体導通状態にあるよ
うに補助導体を形成し抵抗体の抵抗値を一旦所定値より
も下げる、そしてトリミングしてやることで抵抗値の調
整が行えるという、抵抗値の値を自由に上下させるこ、
とができる抵抗値調整方法を特徴とする。
Above are the means to solve the problem! In order to solve the problem, the present invention includes a resistor formed between parallel electrode parts, and an auxiliary conductor that is in conduction with the resistor in order to adjust the resistance value of the resistor. Features. According to this structure, if the resistance value of the resistor becomes lower than a predetermined value, the resistance value is adjusted by trimming the resistor to increase the resistance value. This method allows you to freely raise or lower the resistance value by forming an auxiliary conductor so that the resistor is in a conductive state, lowering the resistance value of the resistor once below a predetermined value, and then trimming it. ,
It features a resistance value adjustment method that allows.

作用 本発明によれば、並列した電極部の間に形成された抵抗
体の抵抗値をまず測定し、抵抗値が所定値よりも低く出
た場合は、抵抗体をトリミングすることにより、抵抗値
の調整を行う、抵抗値が所定値よりも高く出た場合は抵
抗体と導通状態にある為、並列した電極部の抵抗値は下
がることになる。よって電極間の抵抗値を測定しながら
補助導体形成を行えばトリミングを行う時間が大幅に短
縮できる。このように、トリミングによる抵抗値を上げ
る補正、補助導体利用による抵抗値を下げる補正を行う
ことにより仮の所定値を考慮した回路素子設計の必要は
なくなり、そのまま所定値で回路素子設計できる。この
ように、トリミングによる抵抗値を上げる補正、補助導
体を抵抗体と導通状態にあるように形成し、抵抗値を下
げる補正の2者を組み合わせることによって電極間の抵
抗値を自由に操作でき、トリミング量が減少し作業性が
飛躍的に向上する。
According to the present invention, the resistance value of the resistor formed between the parallel electrode parts is first measured, and if the resistance value is lower than a predetermined value, the resistance value is adjusted by trimming the resistor. If the resistance value is higher than a predetermined value, the resistance value of the parallel electrode portion will decrease because it is in a state of conduction with the resistor. Therefore, if the auxiliary conductor is formed while measuring the resistance value between the electrodes, the time required for trimming can be significantly shortened. In this way, by performing the correction to increase the resistance value by trimming and the correction to decrease the resistance value by using the auxiliary conductor, it is no longer necessary to design the circuit element in consideration of a temporary predetermined value, and the circuit element can be designed using the predetermined value as is. In this way, the resistance value between the electrodes can be freely manipulated by combining the correction to increase the resistance value by trimming, and the correction to reduce the resistance value by forming the auxiliary conductor so that it is in a conductive state with the resistor. The amount of trimming is reduced and work efficiency is dramatically improved.

実施例 以下、本発明の実施例を第1図から第3図を用いて説明
する。第1図において電極部lは抵抗体素子を接続する
電極である、例えばAg/Pd等を主成分とする。抵抗
体2は、例えばRuO等を主成分とする抵抗体材料を用
いて並列する電極部lの間を接続し、抵抗体素子を形成
した部分である。トリミング部3はレーザー光線等で抵
抗体2の1部を熱で溶かし切れ目を入れて電流を流れに
<<シ抵抗値を上げた所である。補助導体4は例えばポ
リマー型鼻電ペーストであり、主成分は銀粉末等を主成
分とする。
Embodiments Hereinafter, embodiments of the present invention will be explained using FIGS. 1 to 3. In FIG. 1, an electrode portion l is an electrode for connecting a resistor element, and is mainly composed of, for example, Ag/Pd. The resistor 2 is a portion in which a resistor element is formed by connecting parallel electrode portions l using a resistor material mainly composed of, for example, RuO. The trimming part 3 is a part where a part of the resistor 2 is melted with heat using a laser beam or the like, and a cut is made to increase the resistance value by allowing current to flow therethrough. The auxiliary conductor 4 is, for example, a polymer type nasal electrode paste, and its main component is silver powder or the like.

次に抵抗値の調整方法について述べる。まず、抵抗体2
を並列する電極部lの間に形成する。焼成後の抵抗値は
所定値に対して最小で約50%、最大で約120%の値
を示す、そこで所定値に対して低く値を示した抵抗体2
については、トリミングにより抵抗値の補正を行い、所
定値まで抵抗値を上げてやる。
Next, a method for adjusting the resistance value will be described. First, resistor 2
is formed between the parallel electrode parts l. The resistance value after firing shows a minimum of about 50% and a maximum of about 120% of the predetermined value, so resistor 2 shows a value lower than the predetermined value.
, the resistance value is corrected by trimming to raise the resistance value to a predetermined value.

次に所定値に対して高く値を示した抵抗体との抵抗値の
補正方法について述べる。抵抗体2の抵抗値を一旦、所
定値よりも下げてやる為に、まず抵抗体2と導通状態に
ある補助導体4の形成を抵抗体2上に行う0例えばポリ
マー導体を補助導体4に用いる場合、抵抗体2上に形成
されたポリマー導体は150〜250°Cで十数分で焼
成される。抵抗体2がRuO等を主成分とする場合は8
00°C以上で焼成されている為に、補助導体9の形成
を行っても抵抗値変化は数%である事が確認されており
、何ら支障はない、又、補助導体4の抵抗体2上での形
成位置について、第1図に示すように、抵抗体2とは直
接導通状態にあるが、電極部lとは直接導通状態にない
位置、もしくは第3図に示すように、抵抗体2及び電極
部1と直接導通状態にある位置に形成が可能である。こ
のように抵抗体2の抵抗値を所定値よりも一旦下げる為
に抵抗体2と導通のある状態で補助導体4を形成し、抵
抗体2の抵抗値を適当な値まで下げ、抵抗体2のトリミ
ングを行って抵抗値の補正を行う、又、補助導体4のみ
で、所定値よりも高い値の出た抵抗体2の抵抗値補正も
可能である。
Next, a method of correcting the resistance value of a resistor that exhibits a value higher than a predetermined value will be described. In order to temporarily lower the resistance value of the resistor 2 below a predetermined value, first form an auxiliary conductor 4 on the resistor 2 that is in electrical continuity with the resistor 2. For example, use a polymer conductor as the auxiliary conductor 4. In this case, the polymer conductor formed on the resistor 2 is fired at 150 to 250° C. for a few ten minutes. 8 if the resistor 2 has RuO etc. as its main component.
Because it is fired at 00°C or higher, it has been confirmed that even if the auxiliary conductor 9 is formed, the change in resistance value is only a few percent, and there is no problem. As for the formation position above, as shown in FIG. 1, it is in direct conduction with the resistor 2 but not in direct conduction with the electrode part l, or as shown in FIG. 2 and the electrode portion 1 at a position that is in direct electrical conduction. In this way, in order to temporarily lower the resistance value of the resistor 2 below a predetermined value, the auxiliary conductor 4 is formed in a state where it is electrically connected to the resistor 2, and the resistance value of the resistor 2 is lowered to an appropriate value. It is also possible to correct the resistance value of the resistor 2 whose value is higher than a predetermined value using only the auxiliary conductor 4.

以上のように、並列した電極部lの間に形成された抵抗
体2の抵抗値が所定値に対してどのような値を示したと
しても補助導体4を抵抗体2と普通状態にあるように形
成して抵抗体2の抵抗値を下げてやったり、トリミング
により抵抗体2の抵抗値を上げてやることで、抵抗体2
の抵抗値は自由に操作できるという抵抗値調整方法を提
供することができる。
As described above, no matter what value the resistance value of the resistor 2 formed between the parallel electrode parts l shows with respect to a predetermined value, the auxiliary conductor 4 is kept in the normal state with the resistor 2. The resistance value of resistor 2 can be lowered by forming a
It is possible to provide a resistance value adjustment method in which the resistance value of can be freely manipulated.

発明の効果 本発明によれば、並列した電極部の間に形成された抵抗
体に、その抵抗体と導通状態にある補助導体を備えるこ
とで、抵抗体の抵抗値を下げる事が可能となる。よって
抵抗体を焼成した後、抵抗値が所定値よりも低く出た場
合はトリミングにより抵抗値の補正を行い、抵抗値が高
く出た場合は、補助導体を抵抗体上に形成することで抵
抗値を一旦所定値よりも下げて、トリミングにより抵抗
値の補正を行うという方法を採ることによって抵抗値の
操作が自由に行えるようになった。従来では最大で15
0%近くも抵抗値補正していたものが、100%で済み
、又仮の所定値を考慮するといった回路素子設計も必要
なくなり、生産性が飛躍的に向上した。
Effects of the Invention According to the present invention, the resistance value of the resistor can be lowered by providing the resistor formed between the parallel electrode parts with an auxiliary conductor that is in electrical continuity with the resistor. . Therefore, after firing the resistor, if the resistance value is lower than the predetermined value, the resistance value is corrected by trimming, and if the resistance value is high, the resistance value is adjusted by forming an auxiliary conductor on the resistor element. By adopting a method in which the resistance value is once lowered below a predetermined value and the resistance value is corrected by trimming, the resistance value can be freely manipulated. Previously, the maximum was 15
The resistance value correction, which used to be close to 0%, now only needs to be corrected to 100%, and it is no longer necessary to design circuit elements that take temporary predetermined values into consideration, resulting in a dramatic improvement in productivity.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例における厚膜混成集積回路素
子の平面図、第2図は本発明における厚膜混成集積回路
素子の断面図、第3図は本発明における厚膜混成集積回
路素子の他の例の平面図、第4図は従来の厚膜混成集積
回路素子の平面図、第5図a、bは従来の厚膜混成集積
回路素子における抵抗体の所定値と実際の抵抗値との関
係を示す図である。 1・・・・・・電極部、2・・・・・・抵抗体、3・・
・・・・トリミング部、4・・・・・・補助導体。
FIG. 1 is a plan view of a thick film hybrid integrated circuit device according to an embodiment of the present invention, FIG. 2 is a sectional view of a thick film hybrid integrated circuit device according to the present invention, and FIG. 3 is a plan view of a thick film hybrid integrated circuit device according to the present invention. FIG. 4 is a plan view of a conventional thick film hybrid integrated circuit device, and FIGS. It is a figure showing the relationship with a value. 1... Electrode part, 2... Resistor, 3...
...Trimming part, 4...Auxiliary conductor.

Claims (2)

【特許請求の範囲】[Claims] (1)並列した電極部の間に形成された抵抗体と、前記
抵抗体と導通状態にある前記抵抗体の抵抗値を調整する
ための補助導体を備えた事を特徴とする厚膜混成集積回
路素子。
(1) A thick film hybrid integration characterized by comprising a resistor formed between parallel electrode parts and an auxiliary conductor for adjusting the resistance value of the resistor that is in conduction with the resistor. circuit element.
(2)抵抗体の抵抗値を前記抵抗体と導通状態にある補
助導体を用いることで、並列する前記電極部との間の抵
抗値を下げたり、前記抵抗体をトリミングすることで抵
抗値を上げたりする厚膜混成集積回路素子の抵抗値調整
方法。
(2) The resistance value of the resistor can be lowered by using an auxiliary conductor that is in conduction with the resistor to lower the resistance between the parallel electrodes, or by trimming the resistor. A method for adjusting the resistance value of thick film hybrid integrated circuit elements.
JP1172252A 1989-07-03 1989-07-03 Thick-film hybrid integrated circuit element and adjusting method for resistance thereof Pending JPH0336704A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1172252A JPH0336704A (en) 1989-07-03 1989-07-03 Thick-film hybrid integrated circuit element and adjusting method for resistance thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1172252A JPH0336704A (en) 1989-07-03 1989-07-03 Thick-film hybrid integrated circuit element and adjusting method for resistance thereof

Publications (1)

Publication Number Publication Date
JPH0336704A true JPH0336704A (en) 1991-02-18

Family

ID=15938446

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1172252A Pending JPH0336704A (en) 1989-07-03 1989-07-03 Thick-film hybrid integrated circuit element and adjusting method for resistance thereof

Country Status (1)

Country Link
JP (1) JPH0336704A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006526897A (en) * 2003-05-30 2006-11-24 モトローラ・インコーポレイテッド Polymer thick film resistor, design cell, and manufacturing method thereof
JP2021072458A (en) * 2019-10-29 2021-05-06 三菱電機株式会社 Amplitude equalizer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006526897A (en) * 2003-05-30 2006-11-24 モトローラ・インコーポレイテッド Polymer thick film resistor, design cell, and manufacturing method thereof
JP2021072458A (en) * 2019-10-29 2021-05-06 三菱電機株式会社 Amplitude equalizer

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