JPH0334159B2 - - Google Patents

Info

Publication number
JPH0334159B2
JPH0334159B2 JP61280624A JP28062486A JPH0334159B2 JP H0334159 B2 JPH0334159 B2 JP H0334159B2 JP 61280624 A JP61280624 A JP 61280624A JP 28062486 A JP28062486 A JP 28062486A JP H0334159 B2 JPH0334159 B2 JP H0334159B2
Authority
JP
Japan
Prior art keywords
failure analysis
chip select
analysis memory
gates
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61280624A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63136398A (ja
Inventor
Akio Shimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asia Electronics Co
Original Assignee
Asia Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asia Electronics Co filed Critical Asia Electronics Co
Priority to JP61280624A priority Critical patent/JPS63136398A/ja
Publication of JPS63136398A publication Critical patent/JPS63136398A/ja
Publication of JPH0334159B2 publication Critical patent/JPH0334159B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP61280624A 1986-11-27 1986-11-27 不良解析メモリのリセツト,プリセツト回路 Granted JPS63136398A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61280624A JPS63136398A (ja) 1986-11-27 1986-11-27 不良解析メモリのリセツト,プリセツト回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61280624A JPS63136398A (ja) 1986-11-27 1986-11-27 不良解析メモリのリセツト,プリセツト回路

Publications (2)

Publication Number Publication Date
JPS63136398A JPS63136398A (ja) 1988-06-08
JPH0334159B2 true JPH0334159B2 (enrdf_load_stackoverflow) 1991-05-21

Family

ID=17627643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61280624A Granted JPS63136398A (ja) 1986-11-27 1986-11-27 不良解析メモリのリセツト,プリセツト回路

Country Status (1)

Country Link
JP (1) JPS63136398A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS63136398A (ja) 1988-06-08

Similar Documents

Publication Publication Date Title
JPS6114539B2 (enrdf_load_stackoverflow)
KR100286491B1 (ko) 반도체장치와 반도체장치의 검사방법 및 반도체장치의 검사장치
JPS63102098A (ja) 集積回路
JPS6231439B2 (enrdf_load_stackoverflow)
JP3338526B2 (ja) 半導体メモリの試験装置
JPH0412854B2 (enrdf_load_stackoverflow)
KR20020033560A (ko) 불량열 프로그램 소모 시간 회피 방법
KR940010665B1 (ko) 다이나믹메모리장치 및 그 번인방법
JPH0750450B2 (ja) 冗長メモリアレイ
JPS61292299A (ja) オンチツプメモリテスト容易化回路
JPS61292300A (ja) オンチツプメモリテスト容易化回路
JPH0334159B2 (enrdf_load_stackoverflow)
JPH08203278A (ja) 半導体メモリ
JP2583055B2 (ja) Icテストシステム
JPH04270979A (ja) プログラマブル論理素子及びその試験方法
JPS6366798A (ja) 半導体記憶装置
JPS6044702B2 (ja) 半導体装置
JPH01151100A (ja) 不揮発性半導体記憶装置
JP2002042485A (ja) 半導体メモリ試験装置
JP2583056B2 (ja) Icテストシステム
JPH0743840Y2 (ja) 半導体メモリ
JPH05342113A (ja) 組み込み型システムのramの故障検出方法
JP2877505B2 (ja) Lsi実装ボード及びデータ処理装置
JPH11288598A (ja) 半導体記憶装置のテスト装置
JPH1186595A (ja) 半導体メモリ試験装置