JPH0333023Y2 - - Google Patents
Info
- Publication number
- JPH0333023Y2 JPH0333023Y2 JP860086U JP860086U JPH0333023Y2 JP H0333023 Y2 JPH0333023 Y2 JP H0333023Y2 JP 860086 U JP860086 U JP 860086U JP 860086 U JP860086 U JP 860086U JP H0333023 Y2 JPH0333023 Y2 JP H0333023Y2
- Authority
- JP
- Japan
- Prior art keywords
- tank
- chamber
- environmental
- test
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 76
- 230000007613 environmental effect Effects 0.000 claims description 37
- 238000007689 inspection Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000012774 insulation material Substances 0.000 description 2
- 239000002023 wood Substances 0.000 description 2
- 241001669679 Eleotris Species 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP860086U JPH0333023Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-01-24 | 1986-01-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP860086U JPH0333023Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-01-24 | 1986-01-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62121579U JPS62121579U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-08-01 |
| JPH0333023Y2 true JPH0333023Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-07-12 |
Family
ID=30793127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP860086U Expired JPH0333023Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-01-24 | 1986-01-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0333023Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007292654A (ja) * | 2006-04-26 | 2007-11-08 | Toyota Motor Corp | 車載用電池の耐久試験装置 |
| JPWO2008142754A1 (ja) * | 2007-05-18 | 2010-08-05 | 株式会社アドバンテスト | 電子部品試験装置及び電子部品試験方法 |
| JP5193917B2 (ja) * | 2009-03-24 | 2013-05-08 | エスペック株式会社 | 温湿度処理装置 |
-
1986
- 1986-01-24 JP JP860086U patent/JPH0333023Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62121579U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-08-01 |
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