JPH0330831B2 - - Google Patents

Info

Publication number
JPH0330831B2
JPH0330831B2 JP57122613A JP12261382A JPH0330831B2 JP H0330831 B2 JPH0330831 B2 JP H0330831B2 JP 57122613 A JP57122613 A JP 57122613A JP 12261382 A JP12261382 A JP 12261382A JP H0330831 B2 JPH0330831 B2 JP H0330831B2
Authority
JP
Japan
Prior art keywords
amplifier
preselector
interference noise
receiver
noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57122613A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5913963A (ja
Inventor
Koitaro Kasai
Toshio Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57122613A priority Critical patent/JPS5913963A/ja
Publication of JPS5913963A publication Critical patent/JPS5913963A/ja
Publication of JPH0330831B2 publication Critical patent/JPH0330831B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G01R31/3161—Marginal testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP57122613A 1982-07-14 1982-07-14 干渉雑音試験装置 Granted JPS5913963A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57122613A JPS5913963A (ja) 1982-07-14 1982-07-14 干渉雑音試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57122613A JPS5913963A (ja) 1982-07-14 1982-07-14 干渉雑音試験装置

Publications (2)

Publication Number Publication Date
JPS5913963A JPS5913963A (ja) 1984-01-24
JPH0330831B2 true JPH0330831B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-05-01

Family

ID=14840278

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57122613A Granted JPS5913963A (ja) 1982-07-14 1982-07-14 干渉雑音試験装置

Country Status (1)

Country Link
JP (1) JPS5913963A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60158741A (ja) * 1984-01-30 1985-08-20 Yokogawa Hokushin Electric Corp 光デ−タウエイ
JP4526643B2 (ja) * 2000-03-17 2010-08-18 三菱電機株式会社 放射ノイズ測定データ表示方法、放射ノイズ測定システムおよび放射ノイズ測定用プログラム記憶媒体

Also Published As

Publication number Publication date
JPS5913963A (ja) 1984-01-24

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