JPH0328015B2 - - Google Patents
Info
- Publication number
- JPH0328015B2 JPH0328015B2 JP56101195A JP10119581A JPH0328015B2 JP H0328015 B2 JPH0328015 B2 JP H0328015B2 JP 56101195 A JP56101195 A JP 56101195A JP 10119581 A JP10119581 A JP 10119581A JP H0328015 B2 JPH0328015 B2 JP H0328015B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
- H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56101195A JPH0328015B2 (ja) | 1981-07-01 | 1981-07-01 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56101195A JPH0328015B2 (ja) | 1981-07-01 | 1981-07-01 | |
US06/393,332 US4494000A (en) | 1981-07-01 | 1982-06-29 | Image distortion-free, image rotation-free electron microscope |
EP82303426A EP0068896B1 (en) | 1981-07-01 | 1982-06-30 | Image distortion-free, image rotation-free electron microscope |
DE8282303426T DE3277263D1 (en) | 1981-07-01 | 1982-06-30 | Image distortion-free, image rotation-free electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS585956A JPS585956A (en) | 1983-01-13 |
JPH0328015B2 true JPH0328015B2 (ja) | 1991-04-17 |
Family
ID=14294160
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56101195A Expired - Lifetime JPH0328015B2 (ja) | 1981-07-01 | 1981-07-01 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4494000A (ja) |
EP (1) | EP0068896B1 (ja) |
JP (1) | JPH0328015B2 (ja) |
DE (1) | DE3277263D1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH041459B2 (ja) * | 1984-06-16 | 1992-01-13 | Nippon Electron Optics Lab | |
JPS6149363A (en) * | 1984-08-16 | 1986-03-11 | Internatl Precision Inc | Image focusing system of electron microscope |
JPH0815060B2 (ja) * | 1985-06-12 | 1996-02-14 | 株式会社日立製作所 | 透過形電子顕微鏡 |
US4907287A (en) * | 1985-10-16 | 1990-03-06 | Hitachi, Ltd. | Image correction system for scanning electron microscope |
JP2702114B2 (ja) * | 1986-10-03 | 1998-01-21 | 株式会社日立製作所 | 電子顕微鏡 |
JPH0766770B2 (ja) * | 1989-03-10 | 1995-07-19 | 株式会社日立製作所 | 電子線照射装置 |
JPH0594798A (ja) * | 1991-05-21 | 1993-04-16 | Jeol Ltd | 焦点深度切り換え可能な電子顕微鏡等の電子光学観察装置 |
JP3453247B2 (ja) * | 1996-05-23 | 2003-10-06 | 日本電子株式会社 | 走査電子顕微鏡およびその制御方法 |
US5627373A (en) * | 1996-06-17 | 1997-05-06 | Hewlett-Packard Company | Automatic electron beam alignment and astigmatism correction in scanning electron microscope |
JP3688160B2 (ja) * | 1999-09-17 | 2005-08-24 | 株式会社日立製作所 | 走査電子顕微鏡 |
JP5106627B2 (ja) * | 2008-04-04 | 2012-12-26 | 株式会社日立製作所 | 回折像取得方法、及び荷電粒子線装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4895768A (ja) * | 1972-03-17 | 1973-12-07 | ||
JPS493293A (ja) * | 1972-04-24 | 1974-01-12 | ||
JPS526073A (en) * | 1975-07-04 | 1977-01-18 | Hitachi Ltd | Magnetic field type electronic lens |
JPS54163671A (en) * | 1978-06-15 | 1979-12-26 | Nippon Electron Optics Lab | Electron microscope that have few rotation of image |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2418349A (en) * | 1945-12-13 | 1947-04-01 | Rca Corp | Method of and means for correcting for distortion in electron lens systems |
NL98715C (ja) * | 1953-09-04 | |||
US3327112A (en) * | 1964-02-25 | 1967-06-20 | Hitachi Ltd | Electron microscope having a light metal layer on the interior walls to prevent x-ray generation |
GB1191191A (en) * | 1968-05-08 | 1970-05-06 | Hitachi Ltd | Improvements in Electron Microscopes |
US3715582A (en) * | 1970-02-13 | 1973-02-06 | Hitachi Ltd | Method of and apparatus for attaining focusing following variation in magnification in electron microscope |
NL7114692A (ja) * | 1970-10-28 | 1972-05-03 | ||
JPS5213713B2 (ja) * | 1971-12-15 | 1977-04-16 |
-
1981
- 1981-07-01 JP JP56101195A patent/JPH0328015B2/ja not_active Expired - Lifetime
-
1982
- 1982-06-29 US US06/393,332 patent/US4494000A/en not_active Expired - Lifetime
- 1982-06-30 EP EP82303426A patent/EP0068896B1/en not_active Expired
- 1982-06-30 DE DE8282303426T patent/DE3277263D1/de not_active Expired
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4895768A (ja) * | 1972-03-17 | 1973-12-07 | ||
JPS493293A (ja) * | 1972-04-24 | 1974-01-12 | ||
JPS526073A (en) * | 1975-07-04 | 1977-01-18 | Hitachi Ltd | Magnetic field type electronic lens |
JPS54163671A (en) * | 1978-06-15 | 1979-12-26 | Nippon Electron Optics Lab | Electron microscope that have few rotation of image |
Also Published As
Publication number | Publication date |
---|---|
EP0068896B1 (en) | 1987-09-09 |
EP0068896A2 (en) | 1983-01-05 |
DE3277263D1 (en) | 1987-10-15 |
US4494000A (en) | 1985-01-15 |
JPS585956A (en) | 1983-01-13 |
EP0068896A3 (en) | 1983-05-25 |