JPH032658U - - Google Patents

Info

Publication number
JPH032658U
JPH032658U JP6260489U JP6260489U JPH032658U JP H032658 U JPH032658 U JP H032658U JP 6260489 U JP6260489 U JP 6260489U JP 6260489 U JP6260489 U JP 6260489U JP H032658 U JPH032658 U JP H032658U
Authority
JP
Japan
Prior art keywords
semiconductor package
terminal
view
hole
bulge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6260489U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6260489U priority Critical patent/JPH032658U/ja
Publication of JPH032658U publication Critical patent/JPH032658U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図はこの考案の一実施例である
半導体パツケージの外観斜視図及び部分側面図、
第3図は本実施例の半導体パツケージの実装状態
を示す部分断面図、第4図は他の実施例の半導体
パツケージの部分側面図、第5図及び第6図は従
来の外観斜視図及び部分側面図、第7図及び第8
図は従来の半導体パツケージの実装状態を示す部
分断面図及び外観斜視図である。 1……半導体パツケージ、4……プリント基板
、4a……スルーホール、6……端子、7……膨
出部。なお、図中同一符号は同一、又は相当部分
を示す。
1 and 2 are an external perspective view and a partial side view of a semiconductor package which is an embodiment of this invention,
FIG. 3 is a partial sectional view showing the mounting state of the semiconductor package of this embodiment, FIG. 4 is a partial side view of the semiconductor package of another embodiment, and FIGS. 5 and 6 are a perspective view and a portion of the conventional external appearance. Side view, Figures 7 and 8
The figures are a partial sectional view and an external perspective view showing the mounting state of a conventional semiconductor package. 1...Semiconductor package, 4...Printed circuit board, 4a...Through hole, 6...Terminal, 7...Bulging portion. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 下面又は側面より下方に突出する端子を備えた
半導体パツケージにおいて、上記端子は弾性を有
するパイプ状部材からなり、当該端子における基
板側スルーホールに対応する個所に、膨出部を形
成したことを特徴とする半導体パツケージ。
A semiconductor package equipped with a terminal protruding downward from the bottom or side surface, wherein the terminal is made of an elastic pipe-like member, and a bulge is formed at a location corresponding to the through hole on the substrate side of the terminal. Semiconductor package.
JP6260489U 1989-05-30 1989-05-30 Pending JPH032658U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6260489U JPH032658U (en) 1989-05-30 1989-05-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6260489U JPH032658U (en) 1989-05-30 1989-05-30

Publications (1)

Publication Number Publication Date
JPH032658U true JPH032658U (en) 1991-01-11

Family

ID=31591906

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6260489U Pending JPH032658U (en) 1989-05-30 1989-05-30

Country Status (1)

Country Link
JP (1) JPH032658U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49145833U (en) * 1973-04-18 1974-12-17
JP2007246094A (en) * 2006-03-13 2007-09-27 Gunze Ltd Workpiece guide device for flexible workpiece
JP2014045070A (en) * 2012-08-27 2014-03-13 Fujitsu Ltd Electronic device, method for manufacturing electronic device, and method for unit test of electronic component

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49145833U (en) * 1973-04-18 1974-12-17
JP2007246094A (en) * 2006-03-13 2007-09-27 Gunze Ltd Workpiece guide device for flexible workpiece
JP2014045070A (en) * 2012-08-27 2014-03-13 Fujitsu Ltd Electronic device, method for manufacturing electronic device, and method for unit test of electronic component

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