JPH0325135U - - Google Patents
Info
- Publication number
- JPH0325135U JPH0325135U JP8726189U JP8726189U JPH0325135U JP H0325135 U JPH0325135 U JP H0325135U JP 8726189 U JP8726189 U JP 8726189U JP 8726189 U JP8726189 U JP 8726189U JP H0325135 U JPH0325135 U JP H0325135U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- laser diode
- current
- under test
- diode under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 238000013500 data storage Methods 0.000 claims description 2
- 238000011156 evaluation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8726189U JPH0325135U (es) | 1989-07-24 | 1989-07-24 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8726189U JPH0325135U (es) | 1989-07-24 | 1989-07-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0325135U true JPH0325135U (es) | 1991-03-14 |
Family
ID=31636913
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8726189U Pending JPH0325135U (es) | 1989-07-24 | 1989-07-24 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0325135U (es) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001033513A (ja) * | 1999-07-19 | 2001-02-09 | Nippon Telegr & Teleph Corp <Ntt> | 半導体光素子の特性測定方法及び特性測定プログラムを記録した記録媒体 |
JP2013257266A (ja) * | 2012-06-14 | 2013-12-26 | Sharp Corp | バーンイン装置 |
KR102005711B1 (ko) * | 2019-04-15 | 2019-07-31 | 심재영 | 광모듈 테스트 장치 |
WO2020116236A1 (ja) * | 2018-12-06 | 2020-06-11 | 日本電産リード株式会社 | 検査装置、検査方法、及び検査装置用プログラム |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5849273B2 (ja) * | 1977-11-28 | 1983-11-02 | エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン | 乾式ひげそり器 |
JPS62247582A (ja) * | 1986-04-18 | 1987-10-28 | Fujitsu Ltd | レ−ザダイオ−ド |
JPS62273863A (ja) * | 1986-05-23 | 1987-11-27 | Ricoh Co Ltd | 発光素子アレイの出力制御装置 |
-
1989
- 1989-07-24 JP JP8726189U patent/JPH0325135U/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5849273B2 (ja) * | 1977-11-28 | 1983-11-02 | エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン | 乾式ひげそり器 |
JPS62247582A (ja) * | 1986-04-18 | 1987-10-28 | Fujitsu Ltd | レ−ザダイオ−ド |
JPS62273863A (ja) * | 1986-05-23 | 1987-11-27 | Ricoh Co Ltd | 発光素子アレイの出力制御装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001033513A (ja) * | 1999-07-19 | 2001-02-09 | Nippon Telegr & Teleph Corp <Ntt> | 半導体光素子の特性測定方法及び特性測定プログラムを記録した記録媒体 |
JP2013257266A (ja) * | 2012-06-14 | 2013-12-26 | Sharp Corp | バーンイン装置 |
WO2020116236A1 (ja) * | 2018-12-06 | 2020-06-11 | 日本電産リード株式会社 | 検査装置、検査方法、及び検査装置用プログラム |
JPWO2020116236A1 (ja) * | 2018-12-06 | 2021-10-14 | 日本電産リード株式会社 | 検査装置、検査方法、及び検査装置用プログラム |
KR102005711B1 (ko) * | 2019-04-15 | 2019-07-31 | 심재영 | 광모듈 테스트 장치 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ES458433A1 (es) | Perfeccionamientos en aparatos para medir el diametro de ca-bles yno similares. | |
JPH0325135U (es) | ||
JPS63190975U (es) | ||
JPH0219703Y2 (es) | ||
JPS60115882A (ja) | 測距装置の信号処理回路 | |
JPS63167211A (ja) | 距離検出装置 | |
JPH0167575U (es) | ||
SU574612A1 (ru) | Устройство световой индикации | |
SU729518A2 (ru) | Устройство дл измерени малых токов и малых напр жений | |
JPH01159391U (es) | ||
JPS5928718A (ja) | 遅延回路 | |
JPS61114871U (es) | ||
JPS5844943Y2 (ja) | レ−ザ加工装置 | |
JPH0371669U (es) | ||
JPH03110562U (es) | ||
JPH03130572U (es) | ||
JPS604959U (ja) | 自動測定装置 | |
JPS58154410U (ja) | 変位ヒステリシス測定装置 | |
JPS59168151U (ja) | 螢光光度計用信号処理回路 | |
JPS6196731U (es) | ||
JPH022681U (es) | ||
JPH0221570U (es) | ||
JPS6046038U (ja) | 放射温度計 | |
JPH0353035U (es) | ||
JPS6191173U (es) |