JPH03193427A - Mold for resin sealed type semiconductor device - Google Patents
Mold for resin sealed type semiconductor deviceInfo
- Publication number
- JPH03193427A JPH03193427A JP33788089A JP33788089A JPH03193427A JP H03193427 A JPH03193427 A JP H03193427A JP 33788089 A JP33788089 A JP 33788089A JP 33788089 A JP33788089 A JP 33788089A JP H03193427 A JPH03193427 A JP H03193427A
- Authority
- JP
- Japan
- Prior art keywords
- mold
- resin
- compressed air
- package
- semiconductor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 22
- 239000011347 resin Substances 0.000 title abstract description 10
- 229920005989 resin Polymers 0.000 title abstract description 10
- 238000000465 moulding Methods 0.000 claims description 4
- 238000007789 sealing Methods 0.000 claims description 3
- 230000000694 effects Effects 0.000 description 5
- 238000005336 cracking Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体素子を封止する樹脂封止型半導体装
置用モールド金型に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a mold for a resin-sealed semiconductor device for sealing a semiconductor element.
第2図(a)〜(e)は半導体素子を4!tWI封止す
る従来のモールド金型により樹脂封止された成形品の離
型工程を示す断面図であり、これらの図において、1お
よび2はモールド金型を構成する上金型および下金型で
あり、3は前記上金型1に形成された上キャビティ、4
は前記下金型2に形成された下キャビティ、5aおよび
5bは前記上金型1および下金型2の各キャビティ3,
4内で樹脂封止されたパッケージ7をモールド金型から
離型させるためのエジェクタビン、6は半導体素子、7
は前記半導体素子6を樹脂封止したパッケージ、8は前
記半導体素子6が搭載されたリードフレームである。FIGS. 2(a) to (e) show 4! semiconductor elements. It is a sectional view showing a mold release process of a molded product resin-sealed with a conventional mold die for tWI sealing, and in these figures, 1 and 2 are an upper die and a lower die constituting the mold die. 3 is an upper cavity formed in the upper mold 1; 4 is an upper cavity formed in the upper mold 1;
5a and 5b are the lower cavities formed in the lower mold 2, and 5a and 5b are the cavities 3 of the upper mold 1 and the lower mold 2, respectively.
4, an ejector bin for releasing the resin-sealed package 7 from the mold; 6, a semiconductor element; 7;
8 is a package in which the semiconductor element 6 is sealed with resin, and 8 is a lead frame on which the semiconductor element 6 is mounted.
次に動作について説明する。Next, the operation will be explained.
リードフレーム8に搭載された半導体素子6は第2図(
−)に示すように、上金型1と下金型2を閉じた状態で
樹脂封止される。The semiconductor element 6 mounted on the lead frame 8 is shown in FIG.
-), the upper mold 1 and the lower mold 2 are sealed with resin in a closed state.
成形品をモールド金型より離型させる動作は、第2図(
b)に示すように、まず、下金型2を下降させると同時
にエジェクタピン5aも下降させ、パッケージ7を上キ
ャビティ3より分離する。この状態ではパッケージ7お
よびリードフレーム8は下金型2上に残される。次に、
第2図(C)に示すように、下金型2に設けられたエジ
ェクタピン5bを上方に動作させることにより、パッケ
ジ7を下キャビティ4より分離させることができる。The operation of releasing the molded product from the mold is shown in Figure 2 (
As shown in b), first, the lower mold 2 is lowered and at the same time the ejector pin 5a is also lowered to separate the package 7 from the upper cavity 3. In this state, the package 7 and lead frame 8 remain on the lower mold 2. next,
As shown in FIG. 2(C), the package 7 can be separated from the lower cavity 4 by moving the ejector pin 5b provided in the lower mold 2 upward.
上記のような従来のモールド金型は、以上のように構成
されているので、成形品を上、下金型1゜2と離型させ
る際に、半導体素子6およびパ・ンケージ7にストレス
を加えていた。このため、パッケージ7の割れや欠けが
発生し、さらには半導体素子6の機能不良を発生させる
などの問題点があった。Since the conventional molding die described above is constructed as described above, stress is not applied to the semiconductor element 6 and the package 7 when the molded product is released from the upper and lower molds 1°2. I was adding it. For this reason, there are problems such as cracking or chipping of the package 7 and further malfunction of the semiconductor element 6.
この発明は、上記のような問題点を解消するためになさ
れたもので、半導体素子およびパッケージにストレスを
加えることなく、成形品を金型から離型させることがで
きるモールド金型を得ることを目的とする。This invention was made in order to solve the above-mentioned problems, and aims to obtain a molding die that can release a molded product from the mold without applying stress to the semiconductor element and package. purpose.
この発明に係る樹脂封止型半導体装置用モールド金型は
、上、下金型に形成された上、下キャビティ内で樹脂刺
止された成形品を前記上、下キャビティ内に圧縮気体を
送り込んで離型させるための所要数の空気通路を前記上
、下金型に形成したものである。In the mold for a resin-sealed semiconductor device according to the present invention, compressed gas is sent into the upper and lower cavities of the molded product that is resin-filled in the upper and lower cavities formed in the upper and lower molds. The required number of air passages for releasing the mold are formed in the upper and lower molds.
この発明においては、金型のキャビティ内に圧縮空気を
送り込むことにより、樹脂封止後の成形品をモールド金
型よりパッケージにストレスを加えずに離型させること
ができる。In this invention, by sending compressed air into the cavity of the mold, the resin-sealed molded product can be released from the mold without applying stress to the package.
以下、乙の発明の一実施例を図面について説明する。 An embodiment of the invention of B will be described below with reference to the drawings.
第1図(a)〜(C)はこの発明の一実施例を示す図で
、モールド金型により半導体素子を樹脂封止したパッケ
ージを離型させるための工程を示す断面図である。FIGS. 1A to 1C are views showing an embodiment of the present invention, and are cross-sectional views showing steps for releasing a package in which a semiconductor element is sealed with resin using a mold.
第1図において、第2図と同一符号は同一構成部分を示
し、9a、9bは前記上、下金型1,2にそれぞれ形成
された空気通路、10a、10bは同じく上、下金型1
,2にそれぞれ設けられた樹脂の流出防止を兼ねたバル
ブである。また、11a。In FIG. 1, the same reference numerals as in FIG. 2 indicate the same constituent parts, 9a and 9b are air passages formed in the upper and lower molds 1 and 2, respectively, and 10a and 10b are the same upper and lower molds 1.
, 2 are valves that also serve to prevent resin from flowing out. Also, 11a.
11bは前記空気通路9a、9bにそれぞれ送り込まれ
る圧縮空気である。Compressed air 11b is sent into the air passages 9a and 9b, respectively.
次に動作について説明する。Next, the operation will be explained.
第1図(a)に示すように、半導体素子6が樹脂封止さ
れた状態においては、上金型1と下金型2は閉じている
。これを型開きする場合、第1図(b)に示すように、
まず、上金型1に設けられた空気通路9aに圧縮空気供
給手段(図示せず)より圧縮空気11aを流し込み、バ
ルブ10aを上方に動作させ、圧縮空気11aを上キャ
ピテイ3に流し込む。この状態で下金型2を下降させる
。As shown in FIG. 1(a), when the semiconductor element 6 is sealed with resin, the upper mold 1 and the lower mold 2 are closed. When opening the mold, as shown in Figure 1(b),
First, compressed air 11a is flowed into the air passage 9a provided in the upper mold 1 from a compressed air supply means (not shown), the valve 10a is operated upward, and the compressed air 11a is flowed into the upper cavity 3. In this state, the lower mold 2 is lowered.
この動作により、パッケージ7が上キャビティ3より離
型される。次に、第1図(C)に示すように、圧縮空気
11bを空気通路9bに送り込みバルブ10bを下方に
動作させ、圧縮空気11bを下キャビティ4に流し込む
。この状態でパッケージ7と下キャビティ4の離型が完
了する。By this operation, the package 7 is released from the upper cavity 3. Next, as shown in FIG. 1(C), the compressed air 11b is sent into the air passage 9b, the valve 10b is operated downward, and the compressed air 11b is flowed into the lower cavity 4. In this state, the mold release of the package 7 and the lower cavity 4 is completed.
なお、上記実施例では、上キャビティ3.下キャビティ
4に各々1個の空気通路9a、9bを設けたが、多数の
空気通路を設け、各々の空気通路に圧縮空気を送り込ん
でも上記実施例と同様の効果を奏する。Note that in the above embodiment, the upper cavity 3. Although one air passage 9a, 9b is provided in each of the lower cavities 4, the same effect as in the above embodiment can be obtained even if a large number of air passages are provided and compressed air is sent into each air passage.
また、上記実施例では、圧縮空気を用いたが、これに限
らず、圧縮ガスでも同様の効果が得られる。Further, although compressed air is used in the above embodiment, the same effect is not limited to this, and similar effects can be obtained with compressed gas.
以上説明したように、この発明は、上、下金型に形成さ
れた上、下キャビティ内で樹脂封止された成形品を前記
上、下キャビティ内に圧縮気体を送り込んで、離型させ
るための所要数の空気通路を上、下金型に形成したので
、この空気通路を介して上、下キャビティ内に圧縮気体
を送り込むことによ抄、半導体素子およびパッケージに
ストレスを加えることなく、成形品を離型させることが
できる。したがって、パッケージの割れや欠け、さらに
は半導体素子の機能不良の発生のない樹脂封止型半導体
装置が得られる効果がある。As explained above, the present invention is capable of releasing a molded product sealed with resin in the upper and lower cavities formed in the upper and lower molds by sending compressed gas into the upper and lower cavities. Since the required number of air passages are formed in the upper and lower molds, compressed gas is sent into the upper and lower cavities through these air passages, allowing molding to be performed without adding stress to the paper, semiconductor elements, and packages. The product can be released from the mold. Therefore, it is possible to obtain a resin-sealed semiconductor device without cracking or chipping of the package or malfunction of the semiconductor element.
第1図(a)〜(C)はこの発明の一実施例による離型
動作を示すモールド金型の断面図、第2図(a)〜(C
)は従来の離型動作を示すモールド金型の断面図である
。
図において、1は上金型、2は下金型、3は上キャビテ
ィ、4は下キャビティ、6は半導体素子、7はパッケー
ジ、8はリードフレーム、9 a、9 bは空気通路、
10a、10bはバルブ、11a。
11bは圧縮空気である。
なお、各図中の同一符号は同一または相当部分を示す。FIGS. 1(a) to (C) are cross-sectional views of a mold showing a mold release operation according to an embodiment of the present invention, and FIGS. 2(a) to (C)
) is a sectional view of a mold showing a conventional mold release operation. In the figure, 1 is an upper mold, 2 is a lower mold, 3 is an upper cavity, 4 is a lower cavity, 6 is a semiconductor element, 7 is a package, 8 is a lead frame, 9 a, 9 b are air passages,
10a and 10b are valves, and 11a. 11b is compressed air. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
上、下金型からなるモールド金型において、前記上、下
金型に形成された上、下キャビティ内で樹脂封止された
成形品を前記上、下キャビティ内に圧縮気体を送り込ん
で離型させるための所要数の空気通路を前記上、下金型
に形成したことを特徴とする樹脂封止型半導体装置用モ
ールド金型。In a molding die consisting of upper and lower molds for resin-sealing a semiconductor element mounted on a lead frame, the resin-sealed molded product is placed in the upper and lower cavities formed in the upper and lower molds. 1. A mold for a resin-sealed semiconductor device, characterized in that a required number of air passages are formed in the upper and lower molds for sending compressed gas into the upper and lower cavities to release the mold.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33788089A JPH03193427A (en) | 1989-12-25 | 1989-12-25 | Mold for resin sealed type semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33788089A JPH03193427A (en) | 1989-12-25 | 1989-12-25 | Mold for resin sealed type semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03193427A true JPH03193427A (en) | 1991-08-23 |
Family
ID=18312862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP33788089A Pending JPH03193427A (en) | 1989-12-25 | 1989-12-25 | Mold for resin sealed type semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03193427A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109531930A (en) * | 2017-09-22 | 2019-03-29 | 深圳市美好创亿医疗科技有限公司 | Lid-like product forming mould and moulding process |
-
1989
- 1989-12-25 JP JP33788089A patent/JPH03193427A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109531930A (en) * | 2017-09-22 | 2019-03-29 | 深圳市美好创亿医疗科技有限公司 | Lid-like product forming mould and moulding process |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20130140737A1 (en) | Stacked substrate molding | |
JP4417096B2 (en) | Resin sealing method and resin sealing device | |
JPH03193427A (en) | Mold for resin sealed type semiconductor device | |
JPS58155727A (en) | Mold for resin sealing of semiconductor device | |
US6428731B1 (en) | Mould part, mould and method for encapsulating electronic components mounted on a carrier | |
JP3246037B2 (en) | Transfer mold for semiconductor chip | |
JPS60257528A (en) | Mold for semiconductor sealing | |
JP3092568B2 (en) | Mold for manufacturing resin-encapsulated semiconductor devices | |
JPS60111432A (en) | Metal mold for resin sealing of semiconductor device | |
JPH08108455A (en) | Mold for sealing semiconductor resin | |
JPS62145737A (en) | Low pressure molding die | |
JP2001105111A (en) | Vacuum die casting apparatus | |
JPS61139036A (en) | Apparatus for injecting resin into resin-sealed electronic part | |
JPS63193814A (en) | Mold for transfer molding | |
JP2001024016A (en) | Resin-sealing device for semiconductor package | |
KR0136819Y1 (en) | Tablet of semiconductor package | |
JP3543742B2 (en) | Resin sealing molding equipment | |
KR100526846B1 (en) | Mold for semiconductor package | |
JP2002187175A (en) | Method for taking out semiconductor resin sealed molded article | |
JPH0124613B2 (en) | ||
JPH03232245A (en) | Manufacture of resin-sealed semiconductor device | |
JPH03256712A (en) | Transfer molding machine | |
JPH1050746A (en) | Molding resin seal of electronic component and resin material used therefor | |
JPH05337989A (en) | Resin sealing mold | |
JPH03157943A (en) | Manufacture of resin-sealed semiconductor integrated circuit |