JPH0317377B2 - - Google Patents

Info

Publication number
JPH0317377B2
JPH0317377B2 JP61281897A JP28189786A JPH0317377B2 JP H0317377 B2 JPH0317377 B2 JP H0317377B2 JP 61281897 A JP61281897 A JP 61281897A JP 28189786 A JP28189786 A JP 28189786A JP H0317377 B2 JPH0317377 B2 JP H0317377B2
Authority
JP
Japan
Prior art keywords
discharge
wire
ball
ball diameter
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61281897A
Other languages
Japanese (ja)
Other versions
JPS63136640A (en
Inventor
Hiroshi Miura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Original Assignee
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Seiki Co Ltd filed Critical Toshiba Seiki Co Ltd
Priority to JP61281897A priority Critical patent/JPS63136640A/en
Publication of JPS63136640A publication Critical patent/JPS63136640A/en
Publication of JPH0317377B2 publication Critical patent/JPH0317377B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85009Pre-treatment of the connector or the bonding area
    • H01L2224/8503Reshaping, e.g. forming the ball or the wedge of the wire connector
    • H01L2224/85035Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball"
    • H01L2224/85045Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball" using a corona discharge, e.g. electronic flame off [EFO]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、半導体製造装置におけるワイヤボン
デイング用のボール形成装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a ball forming apparatus for wire bonding in semiconductor manufacturing equipment.

[従来の技術] 第5図はワイヤボンデイング装置を示す模式図
であり、ワイヤ1は、クランパー2およびボンデ
イングツール3を通して、ヒーター4の上に載置
されたペレツト5およびリードフレーム6にボン
デイングされる。続いて、クランパー2によつて
ワイヤ1をもち上げると、リードフレーム6にボ
ンデイングした部分でワイヤ1が切断され、その
先端部は破線で示す位置に戻される。また、ワイ
ヤ先端部1Aの側方には、電源を内蔵する放電発
生装置7とともに電気トーチを形成する電極8が
配置され、ワイヤ先端部1Aと電極8との間に高
電圧を印加することによつて放電を発生させ、ワ
イヤ先端部1Aにボール1Bを形成する。このボ
ール1Bはペレツト5に対するボンデイングを好
適ならしめるものであるが、その前提としてペレ
ツト5のボンデイングパツド面積の変更、ワイヤ
1の直径の変更等に応じて適正なボール径が要求
される。
[Prior Art] FIG. 5 is a schematic diagram showing a wire bonding apparatus, in which a wire 1 is bonded to a pellet 5 and a lead frame 6 placed on a heater 4 through a clamper 2 and a bonding tool 3. . Subsequently, when the wire 1 is lifted up by the clamper 2, the wire 1 is cut at the portion bonded to the lead frame 6, and its tip is returned to the position shown by the broken line. Further, on the side of the wire tip 1A, an electrode 8 that forms an electric torch together with a discharge generator 7 containing a built-in power source is arranged, and a high voltage is applied between the wire tip 1A and the electrode 8. Thus, a discharge is generated and a ball 1B is formed at the wire tip 1A. This ball 1B is suitable for bonding to the pellet 5, but as a premise, an appropriate ball diameter is required in accordance with changes in the bonding pad area of the pellet 5, changes in the diameter of the wire 1, etc.

そこで従来、ワイヤ1の電極8の間に定電圧を
印加したり、定電流回路を付加して放電時の電流
を一定制御する等の放電発生方法の採用により、
ボール径の適正化を図つている。
Therefore, conventionally, by adopting a discharge generation method such as applying a constant voltage between the electrodes 8 of the wire 1 or adding a constant current circuit to control the current during discharge,
Efforts are being made to optimize the ball diameter.

上記のように、ボール径の適正化を図るべく、
放電発生方法に改良が加えられたとしても、ボン
デイングに際しては適正なボールが形成されたこ
との確認、すなわちボール径の良否判定を行なう
とともに、適正ボール径のボールをより確実に形
成することが必要である。
As mentioned above, in order to optimize the ball diameter,
Even if improvements are made to the discharge generation method, it is necessary to confirm that a proper ball has been formed during bonding, that is, to judge whether the ball diameter is good or bad, and to more reliably form a ball with the proper ball diameter. It is.

従来のボール径の良否判定方法は、放電中のあ
る一瞬のタイミングで電流が流れているか否か、
あるいは放電ギヤツプ間にかかる電圧が異常でな
いかを検出することにより、放電状態をモニター
し、この放電状態が異常であれば、ボール径も異
常であるものと判定している。しかし、この方法
は放電状態の検出タイミングが放電中のある一瞬
に限られるため、そのタイミング以外での放電状
態は無視されることとなり、判定精度が悪い。
The conventional method for determining whether the ball diameter is good or bad is to check whether or not current is flowing at a certain instant during discharge.
Alternatively, the discharge state is monitored by detecting whether the voltage applied across the discharge gap is abnormal, and if the discharge state is abnormal, it is determined that the ball diameter is also abnormal. However, in this method, the detection timing of the discharge state is limited to a certain instant during the discharge, and therefore the discharge state at other times is ignored, resulting in poor determination accuracy.

そこで、従来、特開昭60−206145号公報に記載
されるように、放電状態の検出タイミングを無数
に設定し、判定精度の向上を図る方法も提案され
ている。
Therefore, as described in Japanese Patent Application Laid-Open No. 60-206145, a method has been proposed in which the detection timing of the discharge state is set at an infinite number of times to improve the determination accuracy.

[発明が解決しようとする問題点] しかしながら、放電状態の検出タイミングを無
数に設定し、各タイミングの放電状態を検出する
場合には、無数の検出タイミング信号を発生させ
る必要があり、複雑な制御回路を必要とすること
となつて、装置構成が極めて複雑化する。
[Problems to be Solved by the Invention] However, when setting an infinite number of discharge state detection timings and detecting the discharge state at each timing, it is necessary to generate an infinite number of detection timing signals, which requires complicated control. Since a circuit is required, the device configuration becomes extremely complicated.

本発明は、簡素な装置構成により、ボール径の
判定精度を向上可能とすることを目的とする。
An object of the present invention is to improve the accuracy of ball diameter determination with a simple device configuration.

[問題点を解決するための手段] 本発明の第1は、ワイヤの先端部と電極との間
に放電を発生させて、ワイヤの先端部にボールを
形成するワイヤボンデイング用のボール形成装置
において、ワイヤに与えるべき放電電流と放電指
令時間を設定する放電条件設定手段と、放電条件
設定手段が設定した上記設定放電電流を上記設定
放電指令時間だけワイヤに流す放電発生手段と、
放電時にワイヤを含む放電回路中に流れる放電電
流の有無を検出し、その検出結果を2値化信号と
して出力する電流有無検出手段と、電流有無検出
手段の出力値を積分する積分器と、一定のボール
径が形成されるべき状態下における上記積分器の
積分値をグツドレベルとして予め定める正常放電
状態設定手段と、放電条件設定手段の設定放電指
令時間を経過した時点で積分器の積分値を該グツ
ドレベルと比較し、ボール径が一定値に達したか
否かを判定するボール径判定手段とを有してなる
ことを特徴とするのである。
[Means for Solving the Problems] A first aspect of the present invention is a ball forming device for wire bonding that generates a discharge between the tip of the wire and an electrode to form a ball at the tip of the wire. , a discharge condition setting means for setting a discharge current to be applied to the wire and a discharge command time; a discharge generating means for causing the set discharge current set by the discharge condition setting means to flow through the wire for the set discharge command time;
Current presence detection means detects the presence or absence of a discharge current flowing in a discharge circuit including a wire during discharge and outputs the detection result as a binary signal; and an integrator integrates the output value of the current presence detection means; Normal discharge condition setting means predetermines the integral value of the integrator as a good level under a condition in which a ball diameter of The ball diameter determining means compares the ball diameter with a good level and determines whether the ball diameter has reached a certain value.

本発明の第2は、ワイヤの先端部と電極との間
に放電を発生させて、ワイヤの先端部にボールを
形成するワイヤボンデイング用のボール形成装置
において、ワイヤに与えるべき放電電流と放電指
令時間を設定する放電条件設定手段と、放電条件
設定手段が設定した上記設定放電電流を上記設定
放電指令時間だけはワイヤに流し得る放電発生手
段と、放電時にワイヤを含む放電回路中に流れる
放電電流の有無を検出し、その検出結果を2値化
信号として出力する電流有無検出手段と、電流有
無検出手段の出力値を積分する積分器と、一定の
ボール径が形成されるべき状態下における上記積
分器の積分値をグツドレベルとして予め定める正
常放電状態設定手段と、積分器の積分値をグツド
レベルと比較し、ボール径が一定値に達したか否
かを判定するボール径判定手段とを有し、ボール
径が一定値に達したことをボール径判定手段が判
定したことを条件に、放電発生手段による放電を
終了することを特徴としたものである。
The second aspect of the present invention is a ball forming device for wire bonding that generates a discharge between the tip of the wire and an electrode to form a ball at the tip of the wire, and the discharge current and discharge command to be given to the wire. discharge condition setting means for setting a time; discharge generating means for allowing the set discharge current set by the discharge condition setting means to flow through the wire for the set discharge command time; and discharge current flowing in a discharge circuit including the wire during discharge. a current presence/absence detection means for detecting the presence or absence of the ball and outputting the detection result as a binary signal; an integrator for integrating the output value of the current presence/absence detection means; It has a normal discharge state setting means that predetermines the integral value of the integrator as a good level, and a ball diameter determining means that compares the integral value of the integrator with the good level and determines whether the ball diameter has reached a certain value. The present invention is characterized in that the discharge by the discharge generating means is terminated on condition that the ball diameter determining means determines that the ball diameter has reached a certain value.

[作用] ボール径は放電時にワイヤに与えられる電荷
量、すなわち放電電流と放電時間の積によつて決
定される。そこで、本発明の第1によれば、一定
のボール径を形成するためにワイヤに与えるべき
電荷量が、放電電流と放電指令時間として放電条
件設定手段に設定されると、放電発生手段が上記
放電電流を設定放電指令時間だけワイヤに流す。
さらに、電流有無検出手段がワイヤを含む放電回
路中に流れる放電電流の有無を検出し、放電電流
が流れている間、論理レベル“1”の信号を出力
し、積分器は上記“1”を積分する。これによ
り、ワイヤに形成されるボール径の変更に対応し
て、放電電流を変化させて該ワイヤに与えるべき
電荷量を変化させた時にも、積分器が累積する積
分値の増加率は一定となる。したがつて、設定放
電指令時間を経過した時点で積分器の積分値を正
常放電状態設定手段に予め設定したグツドレベル
と比較することにより、ボール径が当初定めた径
に達しているか否かを判定できる。これにより、
複雑な制御回路を必要とすることなく簡素な装置
構成により、また、各種のボール径に応じたボー
ル径判定基準、すなわちグツドレベルの細かな調
整を必要とすることなく、各種サイズのボール径
を高精度かつ容易に判定できる。
[Operation] The ball diameter is determined by the amount of charge given to the wire during discharge, that is, the product of discharge current and discharge time. Therefore, according to the first aspect of the present invention, when the amount of charge to be given to the wire in order to form a constant ball diameter is set in the discharge condition setting means as the discharge current and the discharge command time, the discharge generating means A discharge current is passed through the wire for the set discharge command time.
Further, the current presence/absence detection means detects the presence or absence of a discharge current flowing in the discharge circuit including the wire, and outputs a signal of logic level "1" while the discharge current is flowing, and the integrator outputs a signal of logic level "1". Integrate. As a result, even when the amount of charge to be applied to the wire is changed by changing the discharge current in response to a change in the diameter of the ball formed on the wire, the rate of increase in the integral value accumulated by the integrator remains constant. Become. Therefore, when the set discharge command time has elapsed, it is determined whether the ball diameter has reached the initially determined diameter by comparing the integrated value of the integrator with the good level preset in the normal discharge state setting means. can. This results in
It is possible to increase the ball diameter of various sizes with a simple device configuration without the need for a complicated control circuit, and without the need for detailed adjustment of the ball diameter judgment criteria, that is, the ball diameter level, according to the various ball diameters. Can be determined accurately and easily.

さらに本発明の第2によれば、上述した本発明
の第1におけると比べ、ボール径が一定値に達し
たことをボール径判定手段が判定したことを条件
に、放電発生手段による放電を終了するようにし
たので、適正なボールが形成された後すぐにボン
デイング作業が開始でき、全体としてのボンデイ
ングスピードを短縮することも可能となる。
Furthermore, according to the second aspect of the present invention, compared to the first aspect of the present invention described above, the discharge by the discharge generating means is terminated on the condition that the ball diameter determining means determines that the ball diameter has reached a certain value. As a result, the bonding work can be started immediately after a proper ball is formed, and the overall bonding speed can be shortened.

[実施例] 第1図は本発明の第1実施例に係るボール形成
装置を示すブロツク図、第2図はボール形成装置
に用いられる制御波形を示す波形図、第3図A,
Bは電荷量相当値の積分状態を説明する模式図で
ある。
[Embodiment] Fig. 1 is a block diagram showing a ball forming device according to a first embodiment of the present invention, Fig. 2 is a waveform diagram showing control waveforms used in the ball forming device, Fig. 3A,
B is a schematic diagram illustrating the integration state of the charge amount equivalent value.

ボール形成装置10は、放電条件設定部(放電
条件設定手段)11、放電発生装置(放電発生手
段)12、放電電流検出部13、電流有無検出部
(電流有無検出手段)14、積分器15、正常放
電状態設定部(正常放電状態設定手段)16、ボ
ール径判定部(ボール径判定手段)17を備えて
いる。また、ボール形成装置10は、放電電圧検
出部18、電圧有無検出部19を備えている。
The ball forming device 10 includes a discharge condition setting section (discharge condition setting means) 11, a discharge generation device (discharge generation means) 12, a discharge current detection section 13, a current presence/absence detection section (current presence/absence detection means) 14, an integrator 15, A normal discharge state setting section (normal discharge state setting means) 16 and a ball diameter determination section (ball diameter determination means) 17 are provided. The ball forming device 10 also includes a discharge voltage detection section 18 and a voltage presence/absence detection section 19.

放電発生装置12は、定電流電源回路を内蔵し
ており、放電指令A1〜A3に基づいて、ワイヤ
21の先端部21Aと電極22の間に放電を発生
させ、ワイヤ先端部21Aにボールを形成する。
この例では、放電指令A1による放電状態は正
常、放電指令A2による放電状態は放電ギヤツプ
が広すぎる不良状態(オープン)、放電指令A3
による放電状態はワイヤ21が電極22に接触し
た不良状態(シヨート)にあるものとする。
The discharge generator 12 has a built-in constant current power supply circuit, and generates a discharge between the tip 21A of the wire 21 and the electrode 22 based on the discharge commands A1 to A3 to form a ball at the tip 21A of the wire. do.
In this example, the discharge state according to the discharge command A1 is normal, the discharge state according to the discharge command A2 is a faulty state (open) where the discharge gap is too wide, and the discharge state according to the discharge command A3 is a faulty state (open).
It is assumed that the discharge state is in a defective state (shoot) in which the wire 21 is in contact with the electrode 22.

ここで、放電条件設定部11は、一定のボール
径を形成するためにワイヤ21に与えるべき電荷
量を、放電電流Iと放電指令時間Tとして設定
し、上記放電発生装置12は、放電条件設定部1
1が設定した設定放電電流Iを設定放電指令時間
Tだけワイヤ21に流す。第3図A,Bは、ワイ
ヤ21に与えるべき電荷量を、今放電指令時間T
は一定T1とし、放電電流の変化によつて変化さ
せる例であり、例えばボール径小の場合には放電
電流をI1、ボール径大の場合には放電電流をI
2(>I1)という具合である。もちろん放電指
令時間Tも変化させ得る。
Here, the discharge condition setting unit 11 sets the amount of charge that should be given to the wire 21 in order to form a constant ball diameter as the discharge current I and the discharge command time T, and the discharge generating device 12 sets the discharge condition setting unit 11. Part 1
A set discharge current I set by No. 1 is caused to flow through the wire 21 for a set discharge command time T. FIGS. 3A and 3B show the amount of charge to be given to the wire 21 at the current discharge command time T.
In this example, T1 is constant and is changed according to changes in the discharge current. For example, when the ball diameter is small, the discharge current is set to I1, and when the ball diameter is large, the discharge current is set to I1.
2 (>I1). Of course, the discharge command time T can also be changed.

電流有無検出部14は、各放電指令A1〜A3
に対応し、放電電流検出部13から放電電流i1
〜i3を与えられ、その検出結果を2値化信号と
して出力する。すなわち、電流有無検出部14
は、放電状態が正常であつて放電電流i1が流れ
ている時には電流有として論理レベル“1”の信
号を出力し、放電状態がオープンであつて放電電
流i2が流れない時には電流無として論理レベル
“0”の信号を出力する。
The current presence/absence detection unit 14 detects each discharge command A1 to A3.
, the discharge current i1 from the discharge current detection unit 13
~i3, and outputs the detection result as a binary signal. That is, the current presence/absence detection section 14
When the discharge state is normal and the discharge current i1 is flowing, it outputs a logic level "1" signal indicating that there is a current, and when the discharge state is open and the discharge current i2 does not flow, it outputs a logic level signal indicating that there is no current. Outputs a “0” signal.

積分器15は、電流有無検出部14の出力値を
積分、すなわちワイヤ21に与えられる電荷量の
相当値を累積する。
The integrator 15 integrates the output value of the current presence/absence detection section 14, that is, accumulates a value equivalent to the amount of charge applied to the wire 21.

正常放電状態設定部16は、一定のボール径が
形成されるべき状態、すなわちワイヤ21に必要
とされる最低の電荷量が与えられた状態下におけ
る積分器15の積分値を予め定めグツドレベルL
として設定するものである。その設定の仕方につ
いては後述する。
The normal discharge state setting unit 16 predetermines the integral value of the integrator 15 in a state in which a constant ball diameter is to be formed, that is, in a state in which the minimum amount of charge required for the wire 21 is given, and sets it to a good level L.
It is set as . The setting method will be described later.

ボール径判定部17は、放電条件設定部11に
設定される放電指令時間Tを通過した時点で積分
器15の積分値を正常放電状態設定部16に予め
設定されるグツドレベルLと比較し、ボール径が
一定値に達したか否かを判定し、グツド信号Gを
出力する等、判定結果をボンデイング装置に出力
する。
The ball diameter determination unit 17 compares the integral value of the integrator 15 with the good level L preset in the normal discharge state setting unit 16 at the time when the discharge command time T set in the discharge condition setting unit 11 has passed, and determines whether the ball diameter It is determined whether the diameter has reached a certain value and outputs the determination result, such as outputting a good signal G, to the bonding device.

ところで、放電指令時間T1すべてにわたり正
常な放電が行なわれたと仮定し、放電電流検出部
13が検出した放電電流を2値化しないで積分器
によつて積分するものとすれば、積分値の増加率
は第3図Aに示すように放電電流が変化する毎に
変化し、それに応じてボール径判定基準はl1,
l2に示すように細かな調整を必要とする。これ
に対し、本実施例におけるように、放電電流検出
部13が検出した放電電流を2値化して積分する
場合には、放電電流I1,I2にかかわらず、積
分値の増加率は第3図Bに示すように一定とな
る。この特性を利用して、本実施例ではボール径
が一定値に達したか否かを判定するものである。
By the way, if it is assumed that normal discharge is performed over the entire discharge command time T1, and if the discharge current detected by the discharge current detection section 13 is not binarized but is integrated by an integrator, the integral value increases. As shown in Fig. 3A, the rate changes every time the discharge current changes, and the ball diameter determination criteria are changed accordingly.
Fine adjustments are required as shown in 12. On the other hand, when the discharge current detected by the discharge current detection unit 13 is binarized and integrated as in this embodiment, the rate of increase in the integral value is as shown in FIG. 3 regardless of the discharge currents I1 and I2. It becomes constant as shown in B. This characteristic is utilized in this embodiment to determine whether the ball diameter has reached a certain value.

ここで、放電条件設定部11に設定される放電
電流、放電指令時間ならびに正常放電状態設定部
16に設定されるグツドレベルLの設定の仕方の
一例を説明する。
Here, an example of how to set the discharge current and discharge command time set in the discharge condition setting section 11 and the good level L set in the normal discharge state setting section 16 will be explained.

まず、初期設定の段階において、作業者は、実
験的にある放電電流iをワイヤ21に流し、ワイ
ヤ21と電流22の間に正常放電を生じせしめな
がら形成されるボールを観察する。そして今必要
とするボール径の最低限の大きさのボールが形成
されるまでの時間が、ボンデイングスピード等の
要素を考慮して適当かどうか判断し、適当と判断
できるまで放電電流iを加減して調整する。な
お、この作業はワイヤ径、必要とするボール径、
放電電流の関係を前もつてデータとして有してい
れば能率的に行なえる。このようにしてまず放電
電流I1が決定され、今必要とするボール径の最
低限の大きさのボールが第3図Bにおける時間
Taで形成されたとすると、ここでグツドレベル
Lが決定される。
First, in the initial setting stage, an operator experimentally applies a certain discharge current i to the wire 21 and observes a ball being formed while causing a normal discharge between the wire 21 and the current 22. Then, determine whether the time it takes to form a ball with the minimum ball diameter currently required is appropriate, taking into account factors such as bonding speed, and adjust the discharge current i until it is determined to be appropriate. Adjust. Note that this work requires the wire diameter, the required ball diameter,
This can be done efficiently if the relationship between the discharge currents is available as data in advance. In this way, the discharge current I1 is first determined, and the ball with the minimum diameter required now is determined at the time shown in FIG. 3B.
Assuming that it is formed by Ta, the good level L is determined here.

さて以上は時間Ta間全てにおいて正常放電が
行なわれた場合を想定したが、実際の放電途中に
おいては一時的に何らかの理由で無放電になり得
ることも考えられる。これらを考慮して、先に決
定した時間Taより長い、すなわち放電指令時間
T1を決定する。この放電指令時間T1の決定に
は、先に述べたボンデイングスピード等の要素を
考慮することとなる。
The above description assumes that normal discharge is performed during the entire time period Ta, but it is conceivable that no discharge may occur temporarily for some reason during actual discharge. Taking these into consideration, the discharge command time T1, which is longer than the previously determined time Ta, is determined. In determining this discharge command time T1, factors such as the bonding speed mentioned above are taken into consideration.

また、次に必要とするボール径が大きい場合、
ワイヤに加える電荷量を多くする必要がある。こ
のためには、放電電流I、放電指令時間Tの少な
くとも一方を増加させればよいわけであり、本実
施例では今までと同じ放電指令時間T1を用いる
こととすると、放電電流Iを大きくすることが必
要となる。このため、作業者は放電電流を今まで
のI1から増加させ、正造放電状態において時間
Taで次に必要とするボール径の最低言の大きさ
のボールができるような電流をI2として放電条
件設定部11に設定することとなる。
Also, if the next required ball diameter is large,
It is necessary to increase the amount of charge applied to the wire. For this purpose, it is sufficient to increase at least one of the discharge current I and the discharge command time T. In this embodiment, if the same discharge command time T1 is used as before, the discharge current I is increased. This is necessary. For this reason, the operator increases the discharge current from the current I1 and increases the time in the normal discharge state.
The current I2 is set in the discharge condition setting unit 11 so that a ball having the minimum diameter next required at Ta is formed.

次に、実際のボンデイング作業において、ボー
ル径が一定値に達したか否かを判定する判定方法
について詳細する。
Next, a method for determining whether the ball diameter has reached a certain value in actual bonding work will be described in detail.

まず、放電状態が正常である場合には、放電指
令A1の全発生期間中、放電電流i1が流れ、放
電指令時間T1経過後における積分値s1はグツド
レベルLを越えるため、グツド信号Gが出力さ
れ、ボール径良が判定される。
First, when the discharge state is normal, the discharge current i1 flows during the entire generation period of the discharge command A1, and the integral value s1 after the elapse of the discharge command time T1 exceeds the good level L, so the good signal G is output. , the ball diameter is determined.

なお、この場合、第3図Bにおいて2点鎖線で
示すように、放電途中に無放電時が存在したとし
ても、放電指令時間T1経過後における積分値
S1′がグツドレベルLを越えている場合、ワイヤ
21には必要電荷量が加えられたものと判断し、
ボール径良と判断される。
In this case, as shown by the two-dot chain line in FIG. 3B, even if there is a non-discharge period during the discharge, the integral value after the discharge command time T1
If S1' exceeds the good level L, it is determined that the necessary amount of charge has been added to the wire 21,
The ball was judged to be in good shape.

しかしながら、放電状態がオープンとなる場合
には、放電指令A2の全発生期間中のうちで上記
オープン状態に至つていない間だけ放電電流i2
が流れても、積分値s2はグツドレベルLに達する
ことができず、ボール径不良が判定される。
However, when the discharge state becomes open, the discharge current i2 is generated only during the period when the discharge command A2 does not reach the open state.
Even if the ball is flowing, the integral value s2 cannot reach the good level L, and it is determined that the ball diameter is defective.

ところで、放電状態がシヨートとなる場合に
は、放電発生装置12が定電流電源回路を用いて
いるため、放電指令A3の全発生期間中、ほとん
ど同一レベルの放電電流i3が流れる。したがつ
て、この場合には、放電電圧検出部18、電圧有
無検出部19の存在により、シヨート発生以後に
おける電流有無検出部14の出力信号を積分器1
5において累積させないものとする。すなわち、
放電電圧検出部18が検出する放電電圧v1〜v3
は、予め定められているシヨートレベルhより小
なるv3となる。そこで、電圧有無検出部19は
放電電圧がシヨートレベルhより大なる時には電
圧有として論理レベル〓1”の信号を出力し、放
電電圧がシヨートレベルhより小なる時には電圧
無として論理レベル〓0”の信号を出力する。積
分器15は、電流有無検出部14の出力信号と、
電圧有無検出部19の出力信号の論理積をとり、
これによりシヨート状態にない時(電圧有)のみ
電流有無検出部14の出力信号を累積可能とす
る。
By the way, when the discharge state is short, since the discharge generating device 12 uses a constant current power supply circuit, the discharge current i3 of almost the same level flows during the entire generation period of the discharge command A3. Therefore, in this case, due to the presence of the discharge voltage detection section 18 and the voltage presence/absence detection section 19, the output signal of the current presence/absence detection section 14 after the occurrence of short is detected by the integrator 1.
5 shall not be accumulated. That is,
Discharge voltages v1 to v3 detected by the discharge voltage detection unit 18
becomes v3, which is smaller than the predetermined shot level h. Therefore, when the discharge voltage is higher than the short level h, the voltage presence/absence detection unit 19 outputs a signal with a logic level of 1" indicating that the voltage is present, and when the discharge voltage is lower than the short level h, it indicates that there is no voltage and outputs a signal with a logic level of 0". Output. The integrator 15 receives the output signal of the current presence/absence detection section 14,
Taking the AND of the output signals of the voltage presence/absence detection section 19,
This allows the output signal of the current presence/absence detection section 14 to be accumulated only when there is no short state (voltage present).

これにより、シヨート発生時の積分器15によ
る積分値s3はグツドレベルLに達することができ
ず、ボール径不良が判定できる。
As a result, the integral value s3 by the integrator 15 when a shot occurs cannot reach the good level L, and it can be determined that the ball diameter is defective.

以下、上記実施例の作用について説明する。 Hereinafter, the operation of the above embodiment will be explained.

まず、放電電流I1の放電指令時間とT1が前
述のようにして放電条件設定部11に設定される
と、放電発生装置12が上記放電電流を設定放電
指令時間だけワイヤ21に流す。さらに、電流有
無検出部14がワイヤ21に流れる放電電流の有
無を検出そ、、放電電流が流れている間、論理レ
ベル〓1”の信号を出力し、積分器15は上記〓
1”を積分する。これにより、ワイヤ21の形成
されるボール径の変更に対応して、該ワイヤ21
に与える放電電流をI2に変化させた場合におい
ても、積分器15が累積する積分値の増加率は一
定となり、放電電流の大きさによらずボール径の
判定に用いられるグツドレベルLは同一とするこ
とができる。したがつて、放電条件設定部11に
予め設定した設定放電指令時間経過後における積
分器15の積分値をグツトレベルLと比較するこ
とにより、ボール型が当初定めた一定値になつて
いるか否かをを判定できる。これにより、上記実
施例によれば、複雑な制御回路を必要とすること
なく簡素な装置構成により、また、各種のボール
径に応じたボール径判定基準の細かな調整を必要
とすることなく、各種サイズのボール径を高精度
かつ容易に判定できる。
First, when the discharge command time and T1 of the discharge current I1 are set in the discharge condition setting section 11 as described above, the discharge generator 12 causes the discharge current to flow through the wire 21 for the set discharge command time. Furthermore, the current presence/absence detection section 14 detects the presence or absence of a discharge current flowing through the wire 21, and outputs a signal with a logic level of 1" while the discharge current is flowing, and the integrator 15 outputs a signal with a logic level of 1".
1". As a result, in response to a change in the diameter of the ball formed in the wire 21, the wire 21
Even when the discharge current applied to the ball is changed to I2, the rate of increase in the integral value accumulated by the integrator 15 remains constant, and the good level L used to determine the ball diameter remains the same regardless of the magnitude of the discharge current. be able to. Therefore, by comparing the integrated value of the integrator 15 after the elapse of the set discharge command time preset in the discharge condition setting section 11 with the gut level L, it is possible to determine whether or not the ball shape has reached the initially determined constant value. can be determined. As a result, according to the above-mentioned embodiment, the device configuration is simple without requiring a complicated control circuit, and without the need for fine adjustment of the ball diameter determination criteria according to various ball diameters. Ball diameters of various sizes can be determined easily and with high precision.

次に、本発明の他の実施例について説明する。
構成については先の実施例とほぼ同じであるた
め、第1図を用いて説明する。この例では、放電
発生装置12は放電条件設定部11に設定される
放電電流Iを設定指令放電時間Tだけはワイヤ2
1に流し得る能力を有している点は変わらない
が、ボール径が一定値に達したことをボール径判
定部17が判定したことを条件に放電を終了させ
る点が相違する。このため、第1図において点線
25で示したように、ボール径判定部17におけ
る判定信号が放電終了信号として放電発生装置1
2に入力されるようになつている。ボール径が一
定値に達したことをボール径判定部17が判定し
たことを条件に放電を終了させる時期について、
まず第1に、第4図Aに示すように、積分器15
の積分値がグツドレベルLに達した時点、すなわ
ちボール径が一定値に達したことをボール径判定
部17が判定した時点で直ちにということが考え
られる。また第2に、第4図Bに示すように、積
分器15の積分値がグツドレベルLに達してから
一定時間(△T)後にということも考えられる。
いずれにしろ、先の実施例の場合は、ボール形成
にあたり、少なくとも放電条件設定部11の設定
した放電指令時間Tは必要としたのに対し、本実
施例においては、ボール径が一定値に達したこと
を条件に放電を終了させるようににしたため、そ
の後すぐにボンデイング作業を行なうことがで
き、全体としてのボンデイングスピードを大幅に
向上させることができるという効果をも有する。
Next, other embodiments of the present invention will be described.
Since the configuration is almost the same as the previous embodiment, it will be explained using FIG. 1. In this example, the discharge generating device 12 sets the discharge current I set in the discharge condition setting unit 11 by setting the discharge time T only for the wire 2.
The difference is that the discharge is terminated on the condition that the ball diameter determining section 17 determines that the ball diameter has reached a certain value. Therefore, as shown by the dotted line 25 in FIG.
2 is now entered. Regarding the timing to end the discharge on the condition that the ball diameter determination unit 17 determines that the ball diameter has reached a certain value,
First, as shown in FIG. 4A, the integrator 15
It is conceivable that the ball diameter determination section 17 determines that the ball diameter has reached a certain value, that is, immediately after the integral value of the ball diameter reaches the good level L. Second, as shown in FIG. 4B, it is also possible that a certain period of time (ΔT) has elapsed since the integrated value of the integrator 15 reached the good level L.
In any case, in the case of the previous embodiment, at least the discharge command time T set by the discharge condition setting section 11 was required to form the ball, whereas in the present embodiment, the ball diameter reached a certain value. Since the discharge is terminated on the condition that the discharge is completed, the bonding work can be carried out immediately thereafter, and the overall bonding speed can be greatly improved.

なお、上記した2つの実施例において放電発生
装置12はワイヤ21と電極22の間に定電圧を
印加する回路を内臓するものであつてもよい。こ
の時、放電状態がシヨートとなる場合には、以下
の方法によつてボール径の不良発生を判定する 定電圧制御状態下で、放電状態がシヨートにな
ると、第2図において放電電流i3はi3z、放
電電圧v3はv3zとなる。そこで、放電電流検出部
13が検出する電流i3が電流i3zとなる異常
上昇をとらえてシヨート発生を判定するシヨート
判定を設け、このシヨート判定部の判定結果によ
つて積分器15によるシヨート発生以後の積分を
中止させ、ボール径判定部16によつてボール径
の不良発生を判定可能とする。
Note that in the two embodiments described above, the discharge generating device 12 may have a built-in circuit for applying a constant voltage between the wire 21 and the electrode 22. At this time, if the discharge state becomes short, determine whether the ball diameter is defective using the following method.When the discharge state becomes short under constant voltage control, the discharge current i3 becomes i3z in Fig. 2. , the discharge voltage v3 becomes v3z. Therefore, a shoot judgment is provided to determine the occurrence of short by detecting an abnormal rise in which the current i3 detected by the discharge current detection section 13 becomes the current i3z, and based on the judgment result of this short judgment section, the integrator 15 determines the occurrence of short after the short occurs. The integration is stopped, and the ball diameter determining section 16 is able to determine whether a defective ball diameter has occurred.

また2つの実施例では、放電指令時間Tを必要
とするボール径にかかわらず一定T1とし、放電
電流を変化させた場合について説明したが、ワイ
ヤ21の径が大きく異なつたり、必要とするボー
ル径が極端に大きい場合、放電指令時間Tも長く
する必要性が生じてくる。これは、例えばワイヤ
21の直径がd1からd2(d1+△d1)程度の範囲の
グループでは同一放電指令時間内に必要とするボ
ールを得ることは可能であるが、ワイヤ21の直
径がd2からd3(d2+△d2)程度の範囲のグループ
では放電指令時間Tを前者のグループより長くし
なければならない。このため、ワイヤ21の直径
がd1からd2に対応するグツドレベルL1、d2から
d3に対応するグツドレベルL2という具合に別々
に設定することで、少なくともグループ内におけ
るグツドレベルLは一定にしてボール径の判定を
行なうことができる。
In addition, in the two embodiments, the discharge command time T is constant T1 regardless of the required ball diameter, and the discharge current is varied. If the diameter is extremely large, it becomes necessary to lengthen the discharge command time T as well. This means that, for example, in a group where the diameter of the wire 21 is in the range of d1 to d2 (d1 + △d1), it is possible to obtain the required balls within the same discharge command time, but if the diameter of the wire 21 is in the range of d2 to d3. In the group within the range of (d2+Δd2), the discharge command time T must be made longer than in the former group. For this reason, the diameter of the wire 21 is from the level L1, d2 corresponding to the diameter from d1 to d2.
By separately setting the good level L2 corresponding to d3, the ball diameter can be determined while keeping the good level L constant at least within the group.

[発明の効果] 本発明によれば、簡素な装置構成により、ボー
ル径の判定精度を向上することができる。
[Effects of the Invention] According to the present invention, ball diameter determination accuracy can be improved with a simple device configuration.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例に係るボール形
成装置を示すブロツク図、第2図はボール形成装
置に用いられる制御波形を示す波形図、第3図
A,Bは電荷量相当値の積分状態を説明する模式
図、第4図A,Bは本発明の第2の実施例に係る
電荷量相当値の積分状態を説明する模式図、第5
図はワイヤボンデイング装置を示す模式図であ
る。 10……ボール形成装置、11……放電条件設
定部(放電条件設定手段)、12……放電発生装
置(放電発生手段)、13……放電電流検出部、
14……電流有無検出部(電流有無検出手段)、
15……積分器、16……正常放電状態設定部、
17……ボール径判定部(ボール径判定手段)、
21……ワイヤ、22……電極。
Fig. 1 is a block diagram showing a ball forming device according to the first embodiment of the present invention, Fig. 2 is a waveform diagram showing control waveforms used in the ball forming device, and Fig. 3 A and B are electric charge equivalent values. FIGS. 4A and 4B are schematic diagrams illustrating the integral state of the charge amount equivalent value according to the second embodiment of the present invention.
The figure is a schematic diagram showing a wire bonding device. 10...Ball forming device, 11...Discharge condition setting section (discharge condition setting means), 12...Discharge generating device (discharge generating means), 13...Discharge current detection section,
14... Current presence/absence detection section (current presence/absence detection means),
15... Integrator, 16... Normal discharge state setting section,
17...Ball diameter determination section (ball diameter determination means),
21...wire, 22...electrode.

Claims (1)

【特許請求の範囲】 1 ワイヤの先端部と電極との間に放電を発生さ
せて、ワイヤの先端部にボールを形成するワイヤ
ボンデイング用のボール形成装置において、ワイ
ヤに与えるべき放電電流と放電指令時間を設定す
る放電条件設定手段と、放電条件設定手段が設定
した上記設定放電電流を上記設定放電指令時間だ
けワイヤに流す放電発生手段と、放電時にワイヤ
を含む放電回路中に流れる放電電流の有無を検出
し、その検出結果を2値化信号として出力する電
流有無検出手段と、電流有無検出手段の出力値を
積分する積分器と、一定のボール径が形成される
べき状態下における上記積分器の積分値をグツド
レベルとして予め定める正常放電状態設定手段
と、放電条件設定手段の設定放電指令時間を経過
した時点で積分器の積分値を該グツドレベルと比
較し、ボール径が一定値に達したか否かを判定す
るボール径判定手段とを有してなることを特徴と
するワイヤボンデイング用のボール形成装置。 2 ワイヤの先端部と電極との間に放電を発生さ
せて、ワイヤの先端部にボールを形成するワイヤ
ボンデイング用のボール形成装置において、ワイ
ヤに与えるべき放電電流と放電指令時間を設定す
る放電条件設定手段と、放電条件設定手段が設定
した上記設定放電電流を上記設定放電指令時間だ
けはワイヤに流し得る放電発生手段と、放電時に
ワイヤを含む放電回路中に流れる放電電流の有無
を検出し、その検出結果を2値化信号として出力
する電流有無検出手段と、電流有無検出手段の出
力値を積分する積分器と、一定のボール径が形成
されるべき状態下における上記積分器の積分値の
グツドレベルとして予め定める正常放電状態設定
手段と、積分器の積分値をグツドレベルと比較
し、ボール径が一定値に達したか否かを判定する
ボール径判定手段とを有し、ボール径が一定値に
達したことをボール径判定手段が判定したことを
条件に、放電発生手段による放電を終了すること
を特徴とするワイヤボンデイング用のボール形成
装置。 3 特許請求の範囲第2項において、放電発生手
段は、ボール径が一定値に達したことをボール径
判定手段が判定した時点で直ちに放電を終了する
ワイヤボンデイング用のボール形成装置。 4 特許請求の範囲第2項において、放電発生手
段は、ボール径が一定値に達したことをボール径
判定手段が判定してから一定時間後に放電を終了
するワイヤボンデイング用のボール形成装置。
[Claims] 1. Discharge current and discharge command to be given to the wire in a ball forming device for wire bonding that generates a discharge between the tip of the wire and the electrode to form a ball at the tip of the wire. discharge condition setting means for setting a time; discharge generation means for causing the set discharge current set by the discharge condition setting means to flow through the wire for the set discharge command time; and presence or absence of discharge current flowing in a discharge circuit including the wire during discharge. and an integrator that integrates the output value of the current presence/absence detection means, and the integrator under a condition where a constant ball diameter is to be formed. The normal discharge state setting means predetermines the integral value of as a good level, and when the set discharge command time of the discharge condition setting means has elapsed, the integral value of the integrator is compared with the good level, and the ball diameter is determined to have reached a certain value. 1. A ball forming device for wire bonding, comprising: ball diameter determining means for determining whether or not the ball diameter is determined. 2 Discharge conditions for setting the discharge current and discharge command time to be given to the wire in a ball forming device for wire bonding that generates a discharge between the tip of the wire and the electrode to form a ball at the tip of the wire a setting means; a discharge generating means capable of causing the set discharge current set by the discharge condition setting means to flow through the wire for the set discharge command time; detecting the presence or absence of a discharge current flowing in a discharge circuit including the wire during discharge; A current detection means outputs the detection result as a binary signal, an integrator integrates the output value of the current presence detection means, and an integral value of the integrator under a condition where a constant ball diameter is to be formed. It has a normal discharge state setting means that is predetermined as a good level, and a ball diameter determining means that compares the integral value of an integrator with the good level and determines whether the ball diameter has reached a certain value. A ball forming device for wire bonding, characterized in that the discharge by the discharge generating means is terminated on condition that the ball diameter determining means determines that the ball diameter has reached the ball diameter. 3. A ball forming device for wire bonding according to claim 2, wherein the discharge generating means terminates the discharge immediately when the ball diameter determining means determines that the ball diameter has reached a certain value. 4. The ball forming device for wire bonding according to claim 2, wherein the discharge generating means terminates the discharge a certain period of time after the ball diameter determining means determines that the ball diameter has reached a certain value.
JP61281897A 1986-11-28 1986-11-28 Ball formation device for wire bonding Granted JPS63136640A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61281897A JPS63136640A (en) 1986-11-28 1986-11-28 Ball formation device for wire bonding

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61281897A JPS63136640A (en) 1986-11-28 1986-11-28 Ball formation device for wire bonding

Publications (2)

Publication Number Publication Date
JPS63136640A JPS63136640A (en) 1988-06-08
JPH0317377B2 true JPH0317377B2 (en) 1991-03-07

Family

ID=17645480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61281897A Granted JPS63136640A (en) 1986-11-28 1986-11-28 Ball formation device for wire bonding

Country Status (1)

Country Link
JP (1) JPS63136640A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015122411A1 (en) * 2014-02-17 2015-08-20 株式会社新川 Electrical discharge inspection device, wire bonding device, and electrical discharge inspection method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0383355A (en) * 1989-08-28 1991-04-09 Marine Instr Co Ltd Wire disconnection detector for semiconductor wire bonder

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015122411A1 (en) * 2014-02-17 2015-08-20 株式会社新川 Electrical discharge inspection device, wire bonding device, and electrical discharge inspection method
JPWO2015122411A1 (en) * 2014-02-17 2017-03-30 株式会社新川 Discharge inspection apparatus, wire bonding apparatus, and discharge inspection method
US10607959B2 (en) 2014-02-17 2020-03-31 Shinkawa Ltd. Discharge examination device, wire-bonding apparatus, and discharge examination method

Also Published As

Publication number Publication date
JPS63136640A (en) 1988-06-08

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