JPH0289291A - Static random access memory - Google Patents

Static random access memory

Info

Publication number
JPH0289291A
JPH0289291A JP63241911A JP24191188A JPH0289291A JP H0289291 A JPH0289291 A JP H0289291A JP 63241911 A JP63241911 A JP 63241911A JP 24191188 A JP24191188 A JP 24191188A JP H0289291 A JPH0289291 A JP H0289291A
Authority
JP
Japan
Prior art keywords
circuit
memory cells
clear
random access
static random
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63241911A
Other languages
Japanese (ja)
Inventor
Suketaka Yamada
山田 資隆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63241911A priority Critical patent/JPH0289291A/en
Publication of JPH0289291A publication Critical patent/JPH0289291A/en
Pending legal-status Critical Current

Links

Landscapes

  • Static Random-Access Memory (AREA)
  • Semiconductor Memories (AREA)

Abstract

PURPOSE:To write '0' or '1' into every memory cells at one cycle by making into a static random access memory (SRAM) to which a clear function circuit is added. CONSTITUTION:An address decoder is inhibited in response to a clear signal, every memory cells are activated, and a clear function circuit 9 to write same data into every memory cells is provided. When a clear signal CLR is made into '1', the OR circuit 21 of the clear function circuit 9 inhibits every signals of word lines from a row decoder 16 and a column coder 17, makes a word line 6 into '1', and every transfer gates of a memory cell 15 are turned on. On the other hand, in a circuit 7 consisting of an AND circuit 22, a NOT circuit 23 and an OR circuit 24 in the clear function circuit 9, D11 passing through a write circuit 18 is inhibited, a node 3 is made into '0' and a node 4 is made into '1'. Thus, every memory cell 15 can be written '0' or '1' in one cycle.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はスタティックランダムアクセスメモリ(以下、
SRAMと称す)に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to static random access memory (hereinafter referred to as
(referred to as SRAM).

[従来の技術] 従来のSRAMでは、ビット方向の書き込みデータがワ
ードによらず、すべて「0」あるいは「1」である場合
、各ワード毎にそのデータを書き込んでいた。
[Prior Art] In a conventional SRAM, when write data in the bit direction is all "0" or "1" regardless of the word, the data is written for each word.

[発明が解決しようとする問題点コ 従って、すべてのメモリセルを「0」クリアしたい場合
でも全ワードを順次デコードして書き込んでおり、 (
書き込みサイクル)×(ワード数)分の時間がかかると
いう欠点があった。
[Problems to be solved by the invention] Therefore, even if you want to clear all memory cells to "0", all words are sequentially decoded and written. (
The disadvantage is that it takes a time equal to (writing cycle) x (number of words).

[発明の従来技術に対する相違点] 上述した従来のSRAMに対し、本発明は1ワ一ド分の
ライトサイクルですべてのメモリセルを「0」または「
1」にクリアする。
[Differences between the invention and the prior art] In contrast to the above-mentioned conventional SRAM, the present invention sets all memory cells to "0" or "0" in a write cycle for one word.
Clear to 1.

[問題点を解決するための手段] 本発明のスタティックランダムアクセスメモリは複数の
メモリセルと、該メモリセルの内から任意のメモリセル
を選択するアドレスデコーダとを有したスタティックラ
ンダムアクセスメモリにおいて、クリア信号に応答して
前記アドレスデコーダをインヒビットして前記メモリセ
ルの全てを活性化ざせると共に該メモリセルの全てにつ
いて同一のデータを書き込むクリア機能回路を有するこ
とを特徴とする。
[Means for Solving the Problems] The static random access memory of the present invention has a plurality of memory cells and an address decoder that selects an arbitrary memory cell from among the memory cells. The present invention is characterized by having a clear function circuit that inhibits the address decoder in response to a signal to activate all of the memory cells and writes the same data to all of the memory cells.

[実施例コ 第1図に本発明のクリア機能付SRAM回路の一実施例
を示す。AO,AI、  ・・・Aiはアドレス信号、
\VENはライトイネーブル信号、D。
[Embodiment] FIG. 1 shows an embodiment of an SRAM circuit with a clear function according to the present invention. AO, AI, ...Ai is the address signal,
\VEN is the write enable signal, D.

1〜DOjは出力リードデータ信号、DIl〜DInは
入力ライドデータ信号である。CLRは本発明にて付加
したクリア信号である。本発明で付加したクリア機能回
路部分は図中に一点鎖線で囲んだ9の部分である。この
回路9は行列状に多数配設されているメモリセル15の
全てのメモリセル15に「0」を書き込む例である。
1 to DOj are output read data signals, and DIl to DIn are input ride data signals. CLR is a clear signal added in the present invention. The clear function circuit portion added in the present invention is a portion 9 surrounded by a chain line in the figure. This circuit 9 is an example in which "0" is written into all memory cells 15 of a large number of memory cells 15 arranged in a matrix.

本実施例の動作を述べる。クリア信号CLRが「1」に
なると、クリア機能回路9のOR回路21は、ロウデコ
ーダ16、カラムデコーダ17からのワード線の信号を
すべてインヒビットし、ワード線6を「1」として、全
てのメモリセル15のトランスファーゲート10をオン
にする。一方クリア機能回路9中のAND回路22、N
OT回路23、OR回路24からなる回路7において、
ライト回路18を通ったDllはインヒビットされ、ノ
ード3は「0」、ノード4は「1」となる。
The operation of this embodiment will be described. When the clear signal CLR becomes "1", the OR circuit 21 of the clear function circuit 9 inhibits all the word line signals from the row decoder 16 and column decoder 17, sets the word line 6 to "1", and clears all the memories. Transfer gate 10 of cell 15 is turned on. On the other hand, the AND circuit 22 and N in the clear function circuit 9
In the circuit 7 consisting of the OT circuit 23 and the OR circuit 24,
The Dll that has passed through the write circuit 18 is inhibited, and the node 3 becomes "0" and the node 4 becomes "1".

そして、カラムセレクタ20はカラムデコーダ17がイ
ンヒビットされていることによりすべて開いており、各
々デジット線di、d2は「0」、di、d2は「1」
となり、すべてのメモリセル15に「0」が書き込まれ
ることになる。つまり、ノード11が「0」、ノード1
2が「1」となり、各ワードに「0」 「0」 「0」
 ・・・が書き込まれる。尚、ライトイネーブル信号\
VENもCLRが「1」となればインヒビットされるこ
とになる。
The column selectors 20 are all open because the column decoder 17 is inhibited, and the digit lines di and d2 are "0" and the digit lines di and d2 are "1", respectively.
Therefore, “0” is written to all memory cells 15. In other words, node 11 is "0", node 1
2 becomes “1” and each word has “0” “0” “0”
... is written. In addition, the write enable signal\
VEN will also be inhibited if CLR becomes "1".

また、図中のカラムセレクタは4−1セレクタの構成と
なっている。また回路7と回路8は同じ回路を示す。
Further, the column selector in the figure has a 4-1 selector configuration. Further, circuit 7 and circuit 8 indicate the same circuit.

第2図は全てのメモリセル15に「1」を書き込む回路
であり、第1図の回路7にあたるものである。、へND
回路22、OR回路24の出力とデジット線di、d2
・・・2丁子、■・・・どの接続間係が第1図に示した
例と逆となる。この回路か各ビットにおかれれは、各ワ
ードに「1」「1」 「1」 ・・・と書き込まれるこ
とになる。
FIG. 2 shows a circuit for writing "1" into all memory cells 15, and corresponds to the circuit 7 in FIG. 1. , to ND
Outputs of circuit 22 and OR circuit 24 and digit lines di and d2
. . 2 cloves, ■ . . . Which connections are opposite to the example shown in FIG. If this circuit is placed in each bit, "1", "1", "1", etc. will be written in each word.

また、第1図の回路7と第2図の回路を交互にすれは各
ワードに「0」 「1」 「0」 「1」 「0」「1
」 ・・・を1サイクルで書き込むことができる。
In addition, if the circuit 7 in FIG. 1 and the circuit in FIG.
” can be written in one cycle.

第1図は本発明の一実施例に係るクリア機能付SRAM
の回路図、第2図は本発明の他の一実施例に係るSRA
Mの要部を示す回路図である。
FIG. 1 shows an SRAM with a clear function according to an embodiment of the present invention.
FIG. 2 is a circuit diagram of an SRA according to another embodiment of the present invention.
FIG. 2 is a circuit diagram showing the main parts of M.

AO,AI、  、。AO, AI, .

CLR・ ・ ・ ・ ’vVEN  ・ ・ ・ ・ DOI、  DOj DTl、DI、i 7、8 ・ ・ ・ ・ 9 ・ ・ ・ ψ ・ ・ ・・・・アドレス信号、 ・・クリア信号、 ライトイネーブル信号、 リードデータ、 ライトデータ、 「0」書き込み回路、 クリア機能回路。CLR・・・・・ 'vVEN ・ ・・・・ DOI, DOj DTl,DI,i 7, 8 ・ ・ ・ ・ 9 ・ ・ ・ ψ ・・ ...address signal, ・・Clear signal, write enable signal, lead data, light data, "0" writing circuit, Clear function circuit.

[発明の効果コ 以上説明したように、本発明はクリア機能回路を付加し
たSRAMとすることにより、全てのメモリセルに1サ
イクルで「0」あるいは「1」を書き込むことが可能と
なる。
[Effects of the Invention] As explained above, the present invention makes it possible to write "0" or "1" to all memory cells in one cycle by providing an SRAM with a clear function circuit added.

Claims (1)

【特許請求の範囲】[Claims] 複数のメモリセルと、該メモリセルの内から任意のメモ
リセルを選択するアドレスデコーダとを有したスタティ
ックランダムアクセスメモリにおいて、クリア信号に応
答して前記アドレスデコーダをインヒビットして前記メ
モリセルの全てを活性化ざせると共に該メモリセルの全
てについて同一のデータを書き込むクリア機能回路を有
することを特徴とするスタティックランダムアクセスメ
モリ。
In a static random access memory having a plurality of memory cells and an address decoder that selects an arbitrary memory cell from among the memory cells, the address decoder is inhibited in response to a clear signal so that all of the memory cells are disabled. A static random access memory characterized by having a clear function circuit that activates and writes the same data to all of the memory cells.
JP63241911A 1988-09-27 1988-09-27 Static random access memory Pending JPH0289291A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63241911A JPH0289291A (en) 1988-09-27 1988-09-27 Static random access memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63241911A JPH0289291A (en) 1988-09-27 1988-09-27 Static random access memory

Publications (1)

Publication Number Publication Date
JPH0289291A true JPH0289291A (en) 1990-03-29

Family

ID=17081379

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63241911A Pending JPH0289291A (en) 1988-09-27 1988-09-27 Static random access memory

Country Status (1)

Country Link
JP (1) JPH0289291A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60133587A (en) * 1983-12-21 1985-07-16 Toshiba Corp Semiconductor storage device
JPS6140628A (en) * 1984-08-02 1986-02-26 Nec Corp Memory circuit
JPS6379299A (en) * 1986-09-22 1988-04-09 Nec Corp Semiconductor memory

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60133587A (en) * 1983-12-21 1985-07-16 Toshiba Corp Semiconductor storage device
JPS6140628A (en) * 1984-08-02 1986-02-26 Nec Corp Memory circuit
JPS6379299A (en) * 1986-09-22 1988-04-09 Nec Corp Semiconductor memory

Similar Documents

Publication Publication Date Title
JPS6238590A (en) Semiconductor memory device
JPH03263687A (en) Multi-port memory
US5901111A (en) Enhanced multiple block writes to adjacent block of memory using a sequential counter
JPS63106998A (en) Semiconductor memory with test circuit
JPH0255878B2 (en)
JPH0757469A (en) Memory circuit
US6223264B1 (en) Synchronous dynamic random access memory and data processing system using an address select signal
KR930017025A (en) Multiserial Access Memory
JP4402439B2 (en) 4-bit prefetch FCRAM having improved data write control circuit and data masking method therefor
US9576630B2 (en) Memory devices and methods having multiple address accesses in same cycle
KR950014901B1 (en) Address decoder which variably selects multiple rows and/or columns and semiconductor memory device using same
JP2845187B2 (en) Semiconductor storage device
JPH0289291A (en) Static random access memory
US6219296B1 (en) Multiport memory cell having a reduced number of write wordlines
JPS61243545A (en) Memory cell of multidirectional read and unidirectional write
US5270970A (en) Memory device having a buffer for gating data transmissions
JPH0329187A (en) Multiport sram
JPS623504B2 (en)
JPH03173995A (en) Multiport random access memory
JPS6356897A (en) Memory-mounted gate array
JPH10326491A (en) Memory unit, sram cell, and data transfer method
JPS6386191A (en) Dynamic memory
JPS62175993A (en) Multi-port memory
JPH023164A (en) Dual port memory
JPS59113600A (en) Highly reliable storage circuit device