JPH0285374U - - Google Patents

Info

Publication number
JPH0285374U
JPH0285374U JP16482888U JP16482888U JPH0285374U JP H0285374 U JPH0285374 U JP H0285374U JP 16482888 U JP16482888 U JP 16482888U JP 16482888 U JP16482888 U JP 16482888U JP H0285374 U JPH0285374 U JP H0285374U
Authority
JP
Japan
Prior art keywords
contact
average value
failure rate
occurrences
failure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16482888U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16482888U priority Critical patent/JPH0285374U/ja
Publication of JPH0285374U publication Critical patent/JPH0285374U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP16482888U 1988-12-20 1988-12-20 Pending JPH0285374U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16482888U JPH0285374U (enExample) 1988-12-20 1988-12-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16482888U JPH0285374U (enExample) 1988-12-20 1988-12-20

Publications (1)

Publication Number Publication Date
JPH0285374U true JPH0285374U (enExample) 1990-07-04

Family

ID=31450769

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16482888U Pending JPH0285374U (enExample) 1988-12-20 1988-12-20

Country Status (1)

Country Link
JP (1) JPH0285374U (enExample)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55124077A (en) * 1979-03-16 1980-09-24 Nec Corp Semiconductor wafer electric characteristic testing apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55124077A (en) * 1979-03-16 1980-09-24 Nec Corp Semiconductor wafer electric characteristic testing apparatus

Similar Documents

Publication Publication Date Title
JPH0368385B2 (enExample)
JPS5829096A (ja) プロセス変数伝送器
JPH0285374U (enExample)
JPH0314033A (ja) マイクロプロセッサ比較チェック機能の検査方式
JPS604133Y2 (ja) 電源断報知装置を備えたガスもれ警報器
JP2606089Y2 (ja) Ｉｃ測定用ソケット寿命検出装置
JP2742169B2 (ja) 半導体製造装置の性能管理方法
JP3017843B2 (ja) エレベータの伝送制御装置
JPS63154733U (enExample)
JPH0168501U (enExample)
JPS6156804B2 (enExample)
JPH0755602Y2 (ja) 制御ユニツトの検査装置
JPH0799347B2 (ja) 制動力自動測定装置
JP3064687B2 (ja) データメモリ制御装置
JPS62112748U (enExample)
EP0114896A4 (en) FUNCTION DIAGNOSTIC SYSTEM.
CN120877831A (zh) 测试装置和颗粒测试方法
JPH02143118A (ja) センサコントローラシステム
JPH0265048U (enExample)
JPS5833990B2 (ja) デ−タ回収装置
JPS6455567A (en) Sensor diagnosing device for photosensitive planographic printing plate developing device
JPH0360083U (enExample)
JPS63135237U (enExample)
JPS6095342U (ja) 車輌用故障表示装置
SE8306270D0 (sv) Forfarande for att astadkomma en forutbestemd orientering av pinnskruvar eller dylikt samt anordning for genomforande av forfarandet