JPH0279044U - - Google Patents

Info

Publication number
JPH0279044U
JPH0279044U JP1988158032U JP15803288U JPH0279044U JP H0279044 U JPH0279044 U JP H0279044U JP 1988158032 U JP1988158032 U JP 1988158032U JP 15803288 U JP15803288 U JP 15803288U JP H0279044 U JPH0279044 U JP H0279044U
Authority
JP
Japan
Prior art keywords
opening
semiconductor package
ceramic substrate
substrate
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1988158032U
Other languages
English (en)
Other versions
JPH0719155Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988158032U priority Critical patent/JPH0719155Y2/ja
Publication of JPH0279044U publication Critical patent/JPH0279044U/ja
Application granted granted Critical
Publication of JPH0719155Y2 publication Critical patent/JPH0719155Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161—Cap
    • H01L2924/1615—Shape
    • H01L2924/16195—Flat cap [not enclosing an internal cavity]

Description

【図面の簡単な説明】
第１図：本考案の半導体パケージの一例を示す
断面図。第２図：第１図のＡ−Ａ断面図。第３図
：第１図の第２図とは別の例のＡ−Ａ断面図。 １……セラミツクス基体、２……基体、３……
半導体チツプ、５，６……接合層。

Claims (1)

    【実用新案登録請求の範囲】
  1. 導体パターンが形成された開口部を有するセラ
    ミツクス基体と半導体チツプが搭載された上記セ
    ラミツクス基体より熱放散性のよい基体とが該開
    口部の下に位置するように接合してなる半導体パ
    ツケージにおいて、該接合が少なくとも２重の環
    状の接合層を設けることにより行なわれているこ
    とを特徴とする半導体パツケージ。
JP1988158032U 1988-12-06 1988-12-06 半導体パツケージ Expired - Lifetime JPH0719155Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988158032U JPH0719155Y2 (ja) 1988-12-06 1988-12-06 半導体パツケージ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988158032U JPH0719155Y2 (ja) 1988-12-06 1988-12-06 半導体パツケージ

Publications (2)

Publication Number Publication Date
JPH0279044U true JPH0279044U (ja) 1990-06-18
JPH0719155Y2 JPH0719155Y2 (ja) 1995-05-01

Family

ID=31437997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988158032U Expired - Lifetime JPH0719155Y2 (ja) 1988-12-06 1988-12-06 半導体パツケージ

Country Status (1)

Country Link
JP (1) JPH0719155Y2 (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08250617A (ja) * 1995-03-10 1996-09-27 Nec Corp 半導体装置の製造方法
JP2006247833A (ja) * 2005-03-07 2006-09-21 Samsung Electronics Co Ltd Ｍｅｍｓ素子パッケージ及びその製造方法
WO2007061059A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. センサ装置およびその製造方法
WO2007061054A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. ウェハレベルパッケージ構造体、および同パッケージ構造体から得られるセンサ装置
WO2007061047A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. ウェハレベルパッケージ構造体およびその製造方法
WO2007061056A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. センサ装置及びその製造方法
JP2013105967A (ja) * 2011-11-16 2013-05-30 Nikkiso Co Ltd 半導体パッケージ用基板及びその製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6053054A (ja) * 1983-09-02 1985-03-26 Hitachi Ltd 半導体装置
JPS6298648A (ja) * 1985-10-25 1987-05-08 Hitachi Ltd 半導体基体搭載用セラミックパッケージ

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6053054A (ja) * 1983-09-02 1985-03-26 Hitachi Ltd 半導体装置
JPS6298648A (ja) * 1985-10-25 1987-05-08 Hitachi Ltd 半導体基体搭載用セラミックパッケージ

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08250617A (ja) * 1995-03-10 1996-09-27 Nec Corp 半導体装置の製造方法
JP2006247833A (ja) * 2005-03-07 2006-09-21 Samsung Electronics Co Ltd Ｍｅｍｓ素子パッケージ及びその製造方法
WO2007061059A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. センサ装置およびその製造方法
WO2007061054A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. ウェハレベルパッケージ構造体、および同パッケージ構造体から得られるセンサ装置
WO2007061047A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. ウェハレベルパッケージ構造体およびその製造方法
WO2007061062A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. ウェハレベルパッケージ構造体の製造方法
WO2007061056A1 (ja) * 2005-11-25 2007-05-31 Matsushita Electric Works, Ltd. センサ装置及びその製造方法
US7674638B2 (en) 2005-11-25 2010-03-09 Panasonic Electric Works Co., Ltd. Sensor device and production method therefor
US8026594B2 (en) 2005-11-25 2011-09-27 Panasonic Electric Works Co., Ltd. Sensor device and production method therefor
US8067769B2 (en) 2005-11-25 2011-11-29 Panasonic Electric Works Co., Ltd. Wafer level package structure, and sensor device obtained from the same package structure
US8080869B2 (en) 2005-11-25 2011-12-20 Panasonic Electric Works Co., Ltd. Wafer level package structure and production method therefor
JP2013105967A (ja) * 2011-11-16 2013-05-30 Nikkiso Co Ltd 半導体パッケージ用基板及びその製造方法

Also Published As

Publication number Publication date
JPH0719155Y2 (ja) 1995-05-01

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