JPH027181B2 - - Google Patents
Info
- Publication number
- JPH027181B2 JPH027181B2 JP60015648A JP1564885A JPH027181B2 JP H027181 B2 JPH027181 B2 JP H027181B2 JP 60015648 A JP60015648 A JP 60015648A JP 1564885 A JP1564885 A JP 1564885A JP H027181 B2 JPH027181 B2 JP H027181B2
- Authority
- JP
- Japan
- Prior art keywords
- solder
- substrate
- chip
- semiconductor device
- thermal expansion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910000679 solder Inorganic materials 0.000 claims abstract description 42
- 239000000758 substrate Substances 0.000 claims abstract description 35
- 239000004065 semiconductor Substances 0.000 claims abstract description 25
- 238000002844 melting Methods 0.000 claims abstract description 4
- 230000008018 melting Effects 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 16
- 238000000137 annealing Methods 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 5
- 230000008023 solidification Effects 0.000 claims 1
- 238000007711 solidification Methods 0.000 claims 1
- 238000003491 array Methods 0.000 abstract description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000011982 device technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000005382 thermal cycling Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/818—Bonding techniques
- H01L2224/81801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15787—Ceramics, e.g. crystalline carbides, nitrides or oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3511—Warping
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU60125/86A AU581392B2 (en) | 1985-01-31 | 1986-07-14 | Phase-locked loop frequency synthesizer having reduced power consumption |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US625386 | 1984-06-28 | ||
US06/625,386 US4611746A (en) | 1984-06-28 | 1984-06-28 | Process for forming improved solder connections for semiconductor devices with enhanced fatigue life |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6114798A JPS6114798A (ja) | 1986-01-22 |
JPH027181B2 true JPH027181B2 (en, 2012) | 1990-02-15 |
Family
ID=24505839
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60015648A Granted JPS6114798A (ja) | 1984-06-28 | 1985-01-31 | はんだ相互接続を形成する方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4611746A (en, 2012) |
EP (1) | EP0167030B1 (en, 2012) |
JP (1) | JPS6114798A (en, 2012) |
DE (1) | DE3570154D1 (en, 2012) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0789945B2 (ja) * | 1990-02-22 | 1995-10-04 | 株式会社ジャパンエナジー | 3,3,3―トリフルオロプロペンオキシドの製造方法 |
US5102029A (en) * | 1990-06-22 | 1992-04-07 | Watkins-Johnson Company | Microwave integrated circuit package to eliminate alumina substrate cracking and method |
US5438749A (en) * | 1993-09-02 | 1995-08-08 | Delco Electronics Corp. | Method of making a flex circuit interconnect for a microprocessor emulator and a method of testing |
GB2308560B (en) * | 1995-12-23 | 1999-06-23 | Ibm | Improvements in solder joint strength |
US6320139B1 (en) | 1998-11-12 | 2001-11-20 | Rockwell Automation Technologies, Inc. | Reflow selective shorting |
WO2001086714A1 (de) * | 2000-05-05 | 2001-11-15 | Infineon Technologies Ag | Verfahren zum verlöten eines ersten metallelements und eines zweiten metallelements durch ein lotmaterial und halbleiterchip-montagevorrichtung |
CN101910643B (zh) | 2007-10-29 | 2013-08-28 | 山洋电气株式会社 | 二重反转式轴流鼓风机的控制方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1022165A (en) * | 1962-08-22 | 1966-03-09 | English Electric Co Ltd | Improvements in or relating to methods of bonding metallic bodies to non-metallic bodies and articles produced thereby |
US3273979A (en) * | 1964-07-06 | 1966-09-20 | Rca Corp | Semiconductive devices |
US3429040A (en) * | 1965-06-18 | 1969-02-25 | Ibm | Method of joining a component to a substrate |
US3486223A (en) * | 1967-04-27 | 1969-12-30 | Philco Ford Corp | Solder bonding |
US3811186A (en) * | 1972-12-11 | 1974-05-21 | Ibm | Method of aligning and attaching circuit devices on a substrate |
US3921285A (en) * | 1974-07-15 | 1975-11-25 | Ibm | Method for joining microminiature components to a carrying structure |
US4017889A (en) * | 1974-12-23 | 1977-04-12 | International Business Machines Corporation | Ternary barrier structure for conductive electrodes |
JPS58191441A (ja) * | 1982-04-19 | 1983-11-08 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | ハンダ付けされた部品の応力軽減方法 |
-
1984
- 1984-06-28 US US06/625,386 patent/US4611746A/en not_active Expired - Fee Related
-
1985
- 1985-01-31 JP JP60015648A patent/JPS6114798A/ja active Granted
- 1985-06-13 DE DE8585107229T patent/DE3570154D1/de not_active Expired
- 1985-06-13 EP EP85107229A patent/EP0167030B1/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6114798A (ja) | 1986-01-22 |
EP0167030B1 (en) | 1989-05-10 |
US4611746A (en) | 1986-09-16 |
EP0167030A1 (en) | 1986-01-08 |
DE3570154D1 (en) | 1989-06-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7594644B2 (en) | Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus | |
US4494688A (en) | Method of connecting metal leads with electrodes of semiconductor device and metal lead therefore | |
EP0147576B1 (en) | Process for forming elongated solder connections between a semiconductor device and a supporting substrate | |
US3392442A (en) | Solder method for providing standoff of device from substrate | |
JPH0222541B2 (en, 2012) | ||
US4942140A (en) | Method of packaging semiconductor device | |
US5633535A (en) | Spacing control in electronic device assemblies | |
US5553769A (en) | Interconnection of a carrier substrate and a semiconductor device | |
EP0473929B1 (en) | Method of forming a thin film electronic device | |
US20020105073A1 (en) | Low cost and compliant microelectronic packages for high i/o and fine pitch | |
JPH08330460A (ja) | 電子デバイス用気密封止方法及びその構造 | |
JPS62254439A (ja) | 大面積の電力用電子デバイスを基板上に固定する方法 | |
US5951893A (en) | Integrated circuit pad structure with high temperature heating element and method therefor | |
JP3081559B2 (ja) | ボールグリッドアレイ型半導体装置およびその製造方法ならびに電子装置 | |
JPH027181B2 (en, 2012) | ||
JPS6351538B2 (en, 2012) | ||
JPH06291165A (ja) | フリップチップ接続構造 | |
JP3688801B2 (ja) | 半導体装置及びその製造方法並びにその実装方法 | |
JPS5850021B2 (ja) | 半導体装置の製法 | |
JPH0241906B2 (en, 2012) | ||
JP2841822B2 (ja) | 混成集積回路の製造方法 | |
JPH0158866B2 (en, 2012) | ||
JPH0691128B2 (ja) | 電子機器装置 | |
JP3380058B2 (ja) | バンプ転写用フレーム | |
JP2770040B2 (ja) | バンプ形成方法および半導体素子接続方法 |