JPH0259923B2 - - Google Patents

Info

Publication number
JPH0259923B2
JPH0259923B2 JP57234303A JP23430382A JPH0259923B2 JP H0259923 B2 JPH0259923 B2 JP H0259923B2 JP 57234303 A JP57234303 A JP 57234303A JP 23430382 A JP23430382 A JP 23430382A JP H0259923 B2 JPH0259923 B2 JP H0259923B2
Authority
JP
Japan
Prior art keywords
light
image
measured
light source
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57234303A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59120806A (ja
Inventor
Kosaku Togashi
Hideo Fuje
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Machine Co Ltd
Toppan Inc
Original Assignee
Toppan Printing Co Ltd
Toshiba Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd, Toshiba Machine Co Ltd filed Critical Toppan Printing Co Ltd
Priority to JP57234303A priority Critical patent/JPS59120806A/ja
Publication of JPS59120806A publication Critical patent/JPS59120806A/ja
Publication of JPH0259923B2 publication Critical patent/JPH0259923B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP57234303A 1982-12-27 1982-12-27 画像面積測定装置 Granted JPS59120806A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57234303A JPS59120806A (ja) 1982-12-27 1982-12-27 画像面積測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57234303A JPS59120806A (ja) 1982-12-27 1982-12-27 画像面積測定装置

Publications (2)

Publication Number Publication Date
JPS59120806A JPS59120806A (ja) 1984-07-12
JPH0259923B2 true JPH0259923B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-12-13

Family

ID=16968879

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57234303A Granted JPS59120806A (ja) 1982-12-27 1982-12-27 画像面積測定装置

Country Status (1)

Country Link
JP (1) JPS59120806A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103090791B (zh) * 2013-01-08 2015-06-10 中联重科股份有限公司 散堆物料的测量系统、方法、装置和堆取料控制系统
WO2015122513A1 (ja) * 2014-02-17 2015-08-20 富士フイルム株式会社 平版印刷版の基準マーク検出方法、平版印刷版の加工方法、及び、印刷方法
CN113295232B (zh) * 2020-08-05 2022-06-14 中冶长天国际工程有限责任公司 一种用于原料场的料堆盘库系统及方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6341487A (ja) * 1986-08-06 1988-02-22 Takasago Corp ルテニウム−ホスフイン錯体

Also Published As

Publication number Publication date
JPS59120806A (ja) 1984-07-12

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