JPH0258594B2 - - Google Patents

Info

Publication number
JPH0258594B2
JPH0258594B2 JP56082131A JP8213181A JPH0258594B2 JP H0258594 B2 JPH0258594 B2 JP H0258594B2 JP 56082131 A JP56082131 A JP 56082131A JP 8213181 A JP8213181 A JP 8213181A JP H0258594 B2 JPH0258594 B2 JP H0258594B2
Authority
JP
Japan
Prior art keywords
input
circuit
test
signal
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56082131A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57197480A (en
Inventor
Kenichi Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP56082131A priority Critical patent/JPS57197480A/ja
Publication of JPS57197480A publication Critical patent/JPS57197480A/ja
Publication of JPH0258594B2 publication Critical patent/JPH0258594B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56082131A 1981-05-29 1981-05-29 Test circuit for integrated circuit Granted JPS57197480A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56082131A JPS57197480A (en) 1981-05-29 1981-05-29 Test circuit for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56082131A JPS57197480A (en) 1981-05-29 1981-05-29 Test circuit for integrated circuit

Publications (2)

Publication Number Publication Date
JPS57197480A JPS57197480A (en) 1982-12-03
JPH0258594B2 true JPH0258594B2 (enEXAMPLES) 1990-12-10

Family

ID=13765852

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56082131A Granted JPS57197480A (en) 1981-05-29 1981-05-29 Test circuit for integrated circuit

Country Status (1)

Country Link
JP (1) JPS57197480A (enEXAMPLES)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59188572A (ja) * 1983-04-11 1984-10-25 Seiko Epson Corp 半導体試験回路
JPH0733179Y2 (ja) * 1985-01-18 1995-07-31 日本電気株式会社 デイジタル回路の試験用リセツト回路
KR910006241B1 (ko) * 1988-12-14 1991-08-17 삼성전자 주식회사 복수 테스트모드 선택회로

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59971B2 (ja) * 1975-12-05 1984-01-10 日本電気株式会社 シユウセキカイロソウチ

Also Published As

Publication number Publication date
JPS57197480A (en) 1982-12-03

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