JPH0250411B2 - - Google Patents

Info

Publication number
JPH0250411B2
JPH0250411B2 JP59164661A JP16466184A JPH0250411B2 JP H0250411 B2 JPH0250411 B2 JP H0250411B2 JP 59164661 A JP59164661 A JP 59164661A JP 16466184 A JP16466184 A JP 16466184A JP H0250411 B2 JPH0250411 B2 JP H0250411B2
Authority
JP
Japan
Prior art keywords
light
hologram
optical system
mirror surface
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59164661A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6141941A (ja
Inventor
Koji Tenjinbayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP16466184A priority Critical patent/JPS6141941A/ja
Priority to US06/762,944 priority patent/US4693604A/en
Publication of JPS6141941A publication Critical patent/JPS6141941A/ja
Publication of JPH0250411B2 publication Critical patent/JPH0250411B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP16466184A 1984-08-06 1984-08-06 軸外し放物面鏡の表面形状測定用ホログラム干渉計 Granted JPS6141941A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP16466184A JPS6141941A (ja) 1984-08-06 1984-08-06 軸外し放物面鏡の表面形状測定用ホログラム干渉計
US06/762,944 US4693604A (en) 1984-08-06 1985-08-06 Interference method and interferometer for testing the surface precision of a parabolic mirror

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16466184A JPS6141941A (ja) 1984-08-06 1984-08-06 軸外し放物面鏡の表面形状測定用ホログラム干渉計

Publications (2)

Publication Number Publication Date
JPS6141941A JPS6141941A (ja) 1986-02-28
JPH0250411B2 true JPH0250411B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-11-02

Family

ID=15797406

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16466184A Granted JPS6141941A (ja) 1984-08-06 1984-08-06 軸外し放物面鏡の表面形状測定用ホログラム干渉計

Country Status (2)

Country Link
US (1) US4693604A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS6141941A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4904084A (en) * 1988-12-27 1990-02-27 United Technologies Corporation Arrangement for testing complex concave reflecting surfaces for shape deviations
JP2679221B2 (ja) * 1989-03-02 1997-11-19 株式会社ニコン 干渉計
DE69115914T2 (de) * 1990-08-31 1996-05-30 Commw Scient Ind Res Org Interferenzmikroskop
EE05614B1 (et) * 2008-12-16 2012-12-17 Nikolay Voznesenskiy Interferomeeter optiliste süsteemide ja näidiste testimiseks
FR3017218B1 (fr) * 2014-01-31 2023-04-07 Imagine Optic Procedes et dispositifs de controle de la taille de faisceaux lumineux de grandes dimensions
CN107121092A (zh) * 2017-05-24 2017-09-01 西安交通大学 一种激光干涉检测轴承滚珠面型误差的系统及方法
CN107817088B (zh) * 2017-09-26 2020-04-10 中国科学院长春光学精密机械与物理研究所 离轴抛物镜光轴方向的标定方法及系统
CN110737103B (zh) * 2019-10-31 2022-03-08 中国科学院长春光学精密机械与物理研究所 一种大口径离轴折反式多通道光学系统装调方法

Also Published As

Publication number Publication date
JPS6141941A (ja) 1986-02-28
US4693604A (en) 1987-09-15

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term