JPH0241896B2 - - Google Patents
Info
- Publication number
- JPH0241896B2 JPH0241896B2 JP59269985A JP26998584A JPH0241896B2 JP H0241896 B2 JPH0241896 B2 JP H0241896B2 JP 59269985 A JP59269985 A JP 59269985A JP 26998584 A JP26998584 A JP 26998584A JP H0241896 B2 JPH0241896 B2 JP H0241896B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- cooling
- temperature control
- resist
- baking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/38—Treatment before imagewise removal, e.g. prebaking
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59269985A JPS61147527A (ja) | 1984-12-21 | 1984-12-21 | レジストパタ−ンの形成方法 |
| DE8585116113T DE3580978D1 (de) | 1984-12-21 | 1985-12-17 | Verfahren zur herstellung von resistmustern. |
| EP85116113A EP0185366B1 (en) | 1984-12-21 | 1985-12-17 | Method of forming resist pattern |
| KR1019850009520A KR900003362B1 (ko) | 1984-12-21 | 1985-12-18 | 레지스트 패턴의 형성방법과 그에 따른 레지스트막의 처리장치 |
| US07/129,907 US4946764A (en) | 1984-12-21 | 1987-12-07 | Method of forming resist pattern and resist processing apparatus used in this method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59269985A JPS61147527A (ja) | 1984-12-21 | 1984-12-21 | レジストパタ−ンの形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61147527A JPS61147527A (ja) | 1986-07-05 |
| JPH0241896B2 true JPH0241896B2 (cs) | 1990-09-19 |
Family
ID=17479961
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59269985A Granted JPS61147527A (ja) | 1984-12-21 | 1984-12-21 | レジストパタ−ンの形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61147527A (cs) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0341926U (cs) * | 1989-08-31 | 1991-04-22 | ||
| JP6447328B2 (ja) * | 2015-04-07 | 2019-01-09 | 東京エレクトロン株式会社 | 加熱装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58199349A (ja) * | 1982-05-17 | 1983-11-19 | Toshiba Corp | 写真蝕刻のインライン装置 |
| JPS59132618A (ja) * | 1983-01-19 | 1984-07-30 | Toshiba Corp | レジストパタ−ンの形成方法及びその装置 |
-
1984
- 1984-12-21 JP JP59269985A patent/JPS61147527A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61147527A (ja) | 1986-07-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |