JPH0238453Y2 - - Google Patents

Info

Publication number
JPH0238453Y2
JPH0238453Y2 JP1983160501U JP16050183U JPH0238453Y2 JP H0238453 Y2 JPH0238453 Y2 JP H0238453Y2 JP 1983160501 U JP1983160501 U JP 1983160501U JP 16050183 U JP16050183 U JP 16050183U JP H0238453 Y2 JPH0238453 Y2 JP H0238453Y2
Authority
JP
Japan
Prior art keywords
magazine
attitude
detection means
automatic
empty
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983160501U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6068645U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16050183U priority Critical patent/JPS6068645U/ja
Publication of JPS6068645U publication Critical patent/JPS6068645U/ja
Application granted granted Critical
Publication of JPH0238453Y2 publication Critical patent/JPH0238453Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP16050183U 1983-10-17 1983-10-17 Ｉｃ試験装置 Granted JPS6068645U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16050183U JPS6068645U (ja) 1983-10-17 1983-10-17 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16050183U JPS6068645U (ja) 1983-10-17 1983-10-17 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPS6068645U JPS6068645U (ja) 1985-05-15
JPH0238453Y2 true JPH0238453Y2 (enrdf_load_stackoverflow) 1990-10-17

Family

ID=30353002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16050183U Granted JPS6068645U (ja) 1983-10-17 1983-10-17 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPS6068645U (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4776747A (en) * 1986-01-03 1988-10-11 Motorola Inc. High speed integrated circuit handler

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934300U (enrdf_load_stackoverflow) * 1972-06-29 1974-03-26
JPS5328760Y2 (enrdf_load_stackoverflow) * 1974-06-24 1978-07-19
JPS56116644A (en) * 1980-02-20 1981-09-12 Hitachi Ltd Manufacture device

Also Published As

Publication number Publication date
JPS6068645U (ja) 1985-05-15

Similar Documents

Publication Publication Date Title
US5150797A (en) IC sorting and receiving apparatus and method
US4478352A (en) Integrated circuit component handler singulation apparatus
KR100632259B1 (ko) 반도체 패키지용 기판의 자동 검사장치
KR101859092B1 (ko) 부품 검사장치
CN111707900A (zh) 一种数据线摇摆电测及视觉检测机
US4733360A (en) Device and method for inspecting card-like articles
JPH07105421B2 (ja) 高速集積回路ハンドラ
CN114684581A (zh) 一种塑封芯片检测用上料装置
US6027301A (en) Semiconductor wafer testing apparatus with a combined wafer alignment/wafer recognition station
CN116577342B (zh) 一种工件视觉全检机系统
JPH0238453Y2 (enrdf_load_stackoverflow)
CN217277778U (zh) 适用于多侧面同时检查的外观检查机
CN207066306U (zh) 涡轮自动检测机
US5207350A (en) System for loading semiconductor package tester
CN114624954B (zh) 一种点胶状态自动区分方法
JP2003167020A (ja) 浮き検出方法、浮き検出装置、ｉｃハンドラ及びｉｃ検査装置
CN212703075U (zh) 一种用于印刷电路板的视觉检测设备
CA2344307C (en) Method and apparatus for sorting fluorescent lamps
JPH02141606A (ja) 半導体装置の外観検査装置
CN221149942U (zh) 一种带有监控组件的晶圆划片装置
JPS6230694B2 (enrdf_load_stackoverflow)
JPH04145699A (ja) Ｉｃデバイス収納用マガジンの回収機構
CN210876350U (zh) 一种继电器外壳检测装置
JPS5923423Y2 (ja) リ−ドの曲がつたｉｃの検出排除装置
JPS58168248A (ja) 分配シュ−ト装置