JPH0235242B2 - - Google Patents

Info

Publication number
JPH0235242B2
JPH0235242B2 JP58118622A JP11862283A JPH0235242B2 JP H0235242 B2 JPH0235242 B2 JP H0235242B2 JP 58118622 A JP58118622 A JP 58118622A JP 11862283 A JP11862283 A JP 11862283A JP H0235242 B2 JPH0235242 B2 JP H0235242B2
Authority
JP
Japan
Prior art keywords
moving object
end position
roller
moving
position information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58118622A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6010107A (ja
Inventor
Toshihiko Oomichi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koyo Seiko Co Ltd
Original Assignee
Koyo Seiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koyo Seiko Co Ltd filed Critical Koyo Seiko Co Ltd
Priority to JP11862283A priority Critical patent/JPS6010107A/ja
Publication of JPS6010107A publication Critical patent/JPS6010107A/ja
Publication of JPH0235242B2 publication Critical patent/JPH0235242B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP11862283A 1983-06-29 1983-06-29 物体選別装置 Granted JPS6010107A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11862283A JPS6010107A (ja) 1983-06-29 1983-06-29 物体選別装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11862283A JPS6010107A (ja) 1983-06-29 1983-06-29 物体選別装置

Publications (2)

Publication Number Publication Date
JPS6010107A JPS6010107A (ja) 1985-01-19
JPH0235242B2 true JPH0235242B2 (zh) 1990-08-09

Family

ID=14741085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11862283A Granted JPS6010107A (ja) 1983-06-29 1983-06-29 物体選別装置

Country Status (1)

Country Link
JP (1) JPS6010107A (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN86104429A (zh) * 1985-07-05 1987-01-07 西屋电气公司 溅射镀膜设备的靶中阴极和接地屏蔽极的配置
JPS63467A (ja) * 1986-06-18 1988-01-05 Fujitsu Ltd スパツタタ−ゲツト
JPH034111A (ja) * 1989-05-31 1991-01-10 Toshiba Chem Corp 長さ測定装置および長さ測定選別装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5583803A (en) * 1978-12-20 1980-06-24 Toshiba Corp Dimension measuring unit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5583803A (en) * 1978-12-20 1980-06-24 Toshiba Corp Dimension measuring unit

Also Published As

Publication number Publication date
JPS6010107A (ja) 1985-01-19

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