JPH023447B2 - - Google Patents

Info

Publication number
JPH023447B2
JPH023447B2 JP58022285A JP2228583A JPH023447B2 JP H023447 B2 JPH023447 B2 JP H023447B2 JP 58022285 A JP58022285 A JP 58022285A JP 2228583 A JP2228583 A JP 2228583A JP H023447 B2 JPH023447 B2 JP H023447B2
Authority
JP
Japan
Prior art keywords
light beam
shape
imaging device
wire loop
light spot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58022285A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59147206A (ja
Inventor
Masahito Nakajima
Hiroyuki Tsukahara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58022285A priority Critical patent/JPS59147206A/ja
Publication of JPS59147206A publication Critical patent/JPS59147206A/ja
Publication of JPH023447B2 publication Critical patent/JPH023447B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
    • H01L2224/48472Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/859Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015Shape
    • H01L2924/1016Shape being a cuboid
    • H01L2924/10161Shape being a cuboid with a rectangular active surface

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP58022285A 1983-02-14 1983-02-14 物体形状検査装置 Granted JPS59147206A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58022285A JPS59147206A (ja) 1983-02-14 1983-02-14 物体形状検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58022285A JPS59147206A (ja) 1983-02-14 1983-02-14 物体形状検査装置

Publications (2)

Publication Number Publication Date
JPS59147206A JPS59147206A (ja) 1984-08-23
JPH023447B2 true JPH023447B2 (zh) 1990-01-23

Family

ID=12078472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58022285A Granted JPS59147206A (ja) 1983-02-14 1983-02-14 物体形状検査装置

Country Status (1)

Country Link
JP (1) JPS59147206A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6093424A (ja) * 1983-10-28 1985-05-25 Kawasaki Heavy Ind Ltd 対象物体からこれと同形の物体を形成する方法及び装置
JPS60118399A (ja) * 1983-12-01 1985-06-25 Kawasaki Heavy Ind Ltd 対象物体からこれと同形の物体を形成する方法及び装置
JPH0239449A (ja) * 1988-07-28 1990-02-08 Matsushita Electric Ind Co Ltd ワイヤボンディングの検査方法
KR100424699B1 (ko) * 2002-05-01 2004-03-27 삼성테크윈 주식회사 라인 스캔 카메라의 자동 캘리브레이션 시스템

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51139355A (en) * 1975-04-05 1976-12-01 Opto Produkte Ag Method of and apparatus for optically exploring object and comparing shape with position thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51139355A (en) * 1975-04-05 1976-12-01 Opto Produkte Ag Method of and apparatus for optically exploring object and comparing shape with position thereof

Also Published As

Publication number Publication date
JPS59147206A (ja) 1984-08-23

Similar Documents

Publication Publication Date Title
US4240750A (en) Automatic circuit board tester
KR100334862B1 (ko) 3각측량법에기초한3차원화상화를위한방법및시스템
JP4207302B2 (ja) バンプ検査方法およびその検査装置
JP2594685B2 (ja) ウェーハスリップラインの検査方法
JPS63265442A (ja) 半導体デバイス用外観検査装置
JPH09329422A (ja) 高さ測定方法及び装置
JPH023447B2 (zh)
JP2996263B2 (ja) 異物検出用の最適閾値決定方法
JPH0269606A (ja) 線状物体の高さ位置検査装置
JPH03108735A (ja) 比較検査方法および装置
JPH04221705A (ja) 外観検査装置
JPH02253110A (ja) 線状物体の形状検査装置
JP4411373B2 (ja) 表面検査装置及び方法
JP2003232624A (ja) 欠陥検査装置
JP2674526B2 (ja) ボンディングワイヤ検査装置およびその検査方法
JP2000121333A (ja) 外観検査装置及び外観検査方法
JPH0666401B2 (ja) リ−ドフレ−ムの検査方法
JPH02150705A (ja) 線状物体検査装置
JP2001280926A (ja) 3次元測定装置、3次元測定方法、並びに当該3次元測定装置又は3次元測定方法を使用する部品検査方法
JPH08304040A (ja) 3次元形状測定装置
JPH02140606A (ja) 物体形状検査装置
JPH0536794A (ja) ワイヤ形状物の測定方法およびその装置
JP3232811B2 (ja) 実装済みプリント基板の検査方法
JPH0672775B2 (ja) 実装済みプリント基板の検査装置
JPH02187619A (ja) 実装済プリント基板の検査装置