JPH0230065B2 - - Google Patents
Info
- Publication number
- JPH0230065B2 JPH0230065B2 JP55121154A JP12115480A JPH0230065B2 JP H0230065 B2 JPH0230065 B2 JP H0230065B2 JP 55121154 A JP55121154 A JP 55121154A JP 12115480 A JP12115480 A JP 12115480A JP H0230065 B2 JPH0230065 B2 JP H0230065B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- data
- inspection
- character
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
Landscapes
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55121154A JPS5748163A (en) | 1980-09-03 | 1980-09-03 | Method and device for inspection of pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55121154A JPS5748163A (en) | 1980-09-03 | 1980-09-03 | Method and device for inspection of pattern |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1078233A Division JPH02138675A (ja) | 1989-03-31 | 1989-03-31 | パターンの良否検査装置における基準位置決め方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5748163A JPS5748163A (en) | 1982-03-19 |
| JPH0230065B2 true JPH0230065B2 (enrdf_load_stackoverflow) | 1990-07-04 |
Family
ID=14804180
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55121154A Granted JPS5748163A (en) | 1980-09-03 | 1980-09-03 | Method and device for inspection of pattern |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5748163A (enrdf_load_stackoverflow) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60130191A (ja) * | 1983-12-16 | 1985-07-11 | 松下電器産業株式会社 | 印刷配線基板検査装置の基準信号作成装置 |
| JPS6149281A (ja) * | 1984-08-17 | 1986-03-11 | Fuji Electric Co Ltd | パタ−ン検査装置 |
| JPS6261390A (ja) * | 1985-09-11 | 1987-03-18 | 興和株式会社 | プリント基板検査方法およびその装置 |
| JPH0782542B2 (ja) * | 1988-01-29 | 1995-09-06 | 株式会社スキャンテクノロジー | 印字検査方法、印字検査装置および印刷物自動振分けシステム |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49131543A (enrdf_load_stackoverflow) * | 1973-04-20 | 1974-12-17 | ||
| JPS594071B2 (ja) * | 1977-03-28 | 1984-01-27 | 株式会社日立製作所 | 文字認識装置 |
| JPS541413A (en) * | 1977-06-06 | 1979-01-08 | Nippon Steel Corp | Cylindrical vertical tank |
| JPS541413U (enrdf_load_stackoverflow) * | 1977-06-07 | 1979-01-08 | ||
| JPS5574667A (en) * | 1978-11-29 | 1980-06-05 | Nec Home Electronics Ltd | Pattern discrimination method |
-
1980
- 1980-09-03 JP JP55121154A patent/JPS5748163A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5748163A (en) | 1982-03-19 |
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