JPS5748163A - Method and device for inspection of pattern - Google Patents

Method and device for inspection of pattern

Info

Publication number
JPS5748163A
JPS5748163A JP55121154A JP12115480A JPS5748163A JP S5748163 A JPS5748163 A JP S5748163A JP 55121154 A JP55121154 A JP 55121154A JP 12115480 A JP12115480 A JP 12115480A JP S5748163 A JPS5748163 A JP S5748163A
Authority
JP
Japan
Prior art keywords
character
inspected
pattern
data
symbol
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55121154A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0230065B2 (enrdf_load_stackoverflow
Inventor
Seiji Kashioka
Yoshihiro Shima
Riichi Yasue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55121154A priority Critical patent/JPS5748163A/ja
Publication of JPS5748163A publication Critical patent/JPS5748163A/ja
Publication of JPH0230065B2 publication Critical patent/JPH0230065B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP55121154A 1980-09-03 1980-09-03 Method and device for inspection of pattern Granted JPS5748163A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121154A JPS5748163A (en) 1980-09-03 1980-09-03 Method and device for inspection of pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121154A JPS5748163A (en) 1980-09-03 1980-09-03 Method and device for inspection of pattern

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP1078233A Division JPH02138675A (ja) 1989-03-31 1989-03-31 パターンの良否検査装置における基準位置決め方法

Publications (2)

Publication Number Publication Date
JPS5748163A true JPS5748163A (en) 1982-03-19
JPH0230065B2 JPH0230065B2 (enrdf_load_stackoverflow) 1990-07-04

Family

ID=14804180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121154A Granted JPS5748163A (en) 1980-09-03 1980-09-03 Method and device for inspection of pattern

Country Status (1)

Country Link
JP (1) JPS5748163A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60130191A (ja) * 1983-12-16 1985-07-11 松下電器産業株式会社 印刷配線基板検査装置の基準信号作成装置
JPS6149281A (ja) * 1984-08-17 1986-03-11 Fuji Electric Co Ltd パタ−ン検査装置
JPS6261390A (ja) * 1985-09-11 1987-03-18 興和株式会社 プリント基板検査方法およびその装置
JPH01194079A (ja) * 1988-01-29 1989-08-04 Sapporo Breweries Ltd 印字検査方法、印字検査装置および印刷物自動振分けシステム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49131543A (enrdf_load_stackoverflow) * 1973-04-20 1974-12-17
JPS53118942A (en) * 1977-03-28 1978-10-17 Hitachi Ltd Character recognizing unit
JPS541413U (enrdf_load_stackoverflow) * 1977-06-07 1979-01-08
JPS541413A (en) * 1977-06-06 1979-01-08 Nippon Steel Corp Cylindrical vertical tank
JPS5574667A (en) * 1978-11-29 1980-06-05 Nec Home Electronics Ltd Pattern discrimination method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49131543A (enrdf_load_stackoverflow) * 1973-04-20 1974-12-17
JPS53118942A (en) * 1977-03-28 1978-10-17 Hitachi Ltd Character recognizing unit
JPS541413A (en) * 1977-06-06 1979-01-08 Nippon Steel Corp Cylindrical vertical tank
JPS541413U (enrdf_load_stackoverflow) * 1977-06-07 1979-01-08
JPS5574667A (en) * 1978-11-29 1980-06-05 Nec Home Electronics Ltd Pattern discrimination method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60130191A (ja) * 1983-12-16 1985-07-11 松下電器産業株式会社 印刷配線基板検査装置の基準信号作成装置
JPS6149281A (ja) * 1984-08-17 1986-03-11 Fuji Electric Co Ltd パタ−ン検査装置
JPS6261390A (ja) * 1985-09-11 1987-03-18 興和株式会社 プリント基板検査方法およびその装置
JPH01194079A (ja) * 1988-01-29 1989-08-04 Sapporo Breweries Ltd 印字検査方法、印字検査装置および印刷物自動振分けシステム

Also Published As

Publication number Publication date
JPH0230065B2 (enrdf_load_stackoverflow) 1990-07-04

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