JPH0230064B2 - - Google Patents

Info

Publication number
JPH0230064B2
JPH0230064B2 JP56167223A JP16722381A JPH0230064B2 JP H0230064 B2 JPH0230064 B2 JP H0230064B2 JP 56167223 A JP56167223 A JP 56167223A JP 16722381 A JP16722381 A JP 16722381A JP H0230064 B2 JPH0230064 B2 JP H0230064B2
Authority
JP
Japan
Prior art keywords
threshold
recognized
threshold value
recognition
thresholds
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56167223A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5870380A (ja
Inventor
Yoshikazu Suzumura
Nobuhiro Takasugi
Ryuichi Kyomasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56167223A priority Critical patent/JPS5870380A/ja
Publication of JPS5870380A publication Critical patent/JPS5870380A/ja
Publication of JPH0230064B2 publication Critical patent/JPH0230064B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/28—Quantising the image, e.g. histogram thresholding for discrimination between background and foreground patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Image Analysis (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
JP56167223A 1981-10-21 1981-10-21 物体の認識装置 Granted JPS5870380A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56167223A JPS5870380A (ja) 1981-10-21 1981-10-21 物体の認識装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56167223A JPS5870380A (ja) 1981-10-21 1981-10-21 物体の認識装置

Publications (2)

Publication Number Publication Date
JPS5870380A JPS5870380A (ja) 1983-04-26
JPH0230064B2 true JPH0230064B2 (Direct) 1990-07-04

Family

ID=15845720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56167223A Granted JPS5870380A (ja) 1981-10-21 1981-10-21 物体の認識装置

Country Status (1)

Country Link
JP (1) JPS5870380A (Direct)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6126188A (ja) * 1984-07-16 1986-02-05 Matsushita Electric Ind Co Ltd パタ−ン認識装置
JPS63165973A (ja) * 1986-12-27 1988-07-09 Osaki Electric Co Ltd 自動形状検定装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51102526A (en) * 1975-03-07 1976-09-10 Hitachi Ltd 2 chipataansaiseihoshiki
JPS5939791B2 (ja) * 1976-04-26 1984-09-26 株式会社日立製作所 光学文字読取装置

Also Published As

Publication number Publication date
JPS5870380A (ja) 1983-04-26

Similar Documents

Publication Publication Date Title
US5165520A (en) Device for controlling and regularizing the spacing objects such as parcels, packages
CN106248681A (zh) 基于机器视觉的立体对象多类缺陷检测装置及方法
KR20180103701A (ko) 다이 본딩 장치 및 반도체 장치의 제조 방법
JPH06134638A (ja) 工具の自動照合認識装置
CN108827597B (zh) 一种结构光投影器的光斑均匀度检测方法和检测系统
JP2000193601A (ja) 表面欠陥検査装置
JPH0230064B2 (Direct)
JP3667886B2 (ja) 視覚センサを用いた塗布状態検出装置
CN116087217B (zh) 基于机器视觉的工业流水线动态质量检测模块及方法
US6510240B1 (en) Automatic detection of die absence on the wire bonding machine
JP3093450B2 (ja) 半導体チップ認識装置
JPH05164703A (ja) ワーク表面検査方法
JP3278555B2 (ja) ボンディングワイヤの認識方法
JP2818347B2 (ja) 外観検査装置
Ko et al. Enhancement of placement accuracy for SMD via development of a new illumination system
JP3190173B2 (ja) 半導体装置の外観検査方法および外観検査装置
JP3414821B2 (ja) 半導体製品のボンディング検査方法およびその装置
KR100213346B1 (ko) 조정부품의 조정홈 검출장치 및 방법
JP3348938B2 (ja) 位置認識装置
JPH08320929A (ja) ワーク検出装置
JPH07103718A (ja) コイル状物体寸法検出装置
CN113903674A (zh) 一种检测方法、装置以及光学检测设备
JPH05180618A (ja) 対象物の位置認識方法
JP2002039948A (ja) 外観検査装置及び外観検査方法
JPS62233705A (ja) 位置検出方法