JPH0226261B2 - - Google Patents
Info
- Publication number
- JPH0226261B2 JPH0226261B2 JP60194408A JP19440885A JPH0226261B2 JP H0226261 B2 JPH0226261 B2 JP H0226261B2 JP 60194408 A JP60194408 A JP 60194408A JP 19440885 A JP19440885 A JP 19440885A JP H0226261 B2 JPH0226261 B2 JP H0226261B2
- Authority
- JP
- Japan
- Prior art keywords
- degree
- matching
- pattern
- point
- partial
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000003384 imaging method Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 8
- 238000000605 extraction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 238000012567 pattern recognition method Methods 0.000 description 2
- 238000007781 pre-processing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000010411 cooking Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000003909 pattern recognition Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Analysis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60194408A JPS6194184A (ja) | 1985-09-03 | 1985-09-03 | 一致度極大点検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60194408A JPS6194184A (ja) | 1985-09-03 | 1985-09-03 | 一致度極大点検出装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57222381A Division JPS59111577A (ja) | 1982-12-17 | 1982-12-17 | パタ−ン認識方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6194184A JPS6194184A (ja) | 1986-05-13 |
| JPH0226261B2 true JPH0226261B2 (cs) | 1990-06-08 |
Family
ID=16324105
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60194408A Granted JPS6194184A (ja) | 1985-09-03 | 1985-09-03 | 一致度極大点検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6194184A (cs) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63282581A (ja) * | 1987-05-14 | 1988-11-18 | Nippon Micro Data Kk | 画像認識装置 |
| JPS6444584A (en) * | 1987-08-12 | 1989-02-16 | Hitachi Ltd | Composite template matching image processor |
-
1985
- 1985-09-03 JP JP60194408A patent/JPS6194184A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6194184A (ja) | 1986-05-13 |
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