JPH0218592B2 - - Google Patents

Info

Publication number
JPH0218592B2
JPH0218592B2 JP57084002A JP8400282A JPH0218592B2 JP H0218592 B2 JPH0218592 B2 JP H0218592B2 JP 57084002 A JP57084002 A JP 57084002A JP 8400282 A JP8400282 A JP 8400282A JP H0218592 B2 JPH0218592 B2 JP H0218592B2
Authority
JP
Japan
Prior art keywords
range
time
characteristic
trimming
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57084002A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58201350A (ja
Inventor
Kazuyoshi Myashita
Osamu Masui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57084002A priority Critical patent/JPS58201350A/ja
Publication of JPS58201350A publication Critical patent/JPS58201350A/ja
Publication of JPH0218592B2 publication Critical patent/JPH0218592B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
JP57084002A 1982-05-20 1982-05-20 ファンクショントリミング方法 Granted JPS58201350A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57084002A JPS58201350A (ja) 1982-05-20 1982-05-20 ファンクショントリミング方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57084002A JPS58201350A (ja) 1982-05-20 1982-05-20 ファンクショントリミング方法

Publications (2)

Publication Number Publication Date
JPS58201350A JPS58201350A (ja) 1983-11-24
JPH0218592B2 true JPH0218592B2 (enExample) 1990-04-26

Family

ID=13818347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57084002A Granted JPS58201350A (ja) 1982-05-20 1982-05-20 ファンクショントリミング方法

Country Status (1)

Country Link
JP (1) JPS58201350A (enExample)

Also Published As

Publication number Publication date
JPS58201350A (ja) 1983-11-24

Similar Documents

Publication Publication Date Title
US4513622A (en) Method of forming random vibration spectrum and device therefor
EP0136204A2 (en) Control of signal timing apparatus in automatic test systems using minimal memory
US5993043A (en) Lithography processing apparatus for manufacturing semiconductor devices
EP0647017B1 (en) Synchronization circuit using a high speed digital slip counter
US20020105452A1 (en) Apparatus and method for precision trimming of a semiconductor device
US4910473A (en) Digitally temperature-compensated oscillator
US4789835A (en) Control of signal timing apparatus in automatic test systems using minimal memory
EP0878909A1 (en) Apparatus and method for adjusting temperature compensated quarz oscillator
US5504681A (en) Mass air flow sensor calibration
US4282595A (en) Method for digital frequency trimming an oscillator in an electronic timepiece
JPH0218592B2 (enExample)
JPH05133997A (ja) Ｉｃ試験装置の較正方法
EP0330501A2 (en) Measurement arrangement with automatic gain control circuit
JP3402035B2 (ja) チップ抵抗器の抵抗値修正方法
JPH0218593B2 (enExample)
JPH02198375A (ja) Ｉｃ試験装置
JPH0191529A (ja) デジタル制御温度補償発振器
JPS59127102A (ja) 論理機能トリミング方式
JP2672690B2 (ja) 半導体デバイスの試験方法
JPH0228913B2 (ja) Choseimokuhyodenatsusetsuteihoho
JPS59188158A (ja) 機能トリミング方式
JP2542126Y2 (ja) 回路基板組立装置
JPH04261058A (ja) 半導体素子のトリミング方法
JP3468197B2 (ja) 可変増幅装置の利得測定方法
JP2576281B2 (ja) レンジ切換方法