JPH02150583U - - Google Patents
Info
- Publication number
- JPH02150583U JPH02150583U JP6074589U JP6074589U JPH02150583U JP H02150583 U JPH02150583 U JP H02150583U JP 6074589 U JP6074589 U JP 6074589U JP 6074589 U JP6074589 U JP 6074589U JP H02150583 U JPH02150583 U JP H02150583U
- Authority
- JP
- Japan
- Prior art keywords
- under test
- signal
- terminal
- response
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989060745U JP2548477Y2 (ja) | 1989-05-24 | 1989-05-24 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989060745U JP2548477Y2 (ja) | 1989-05-24 | 1989-05-24 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02150583U true JPH02150583U (OSRAM) | 1990-12-26 |
| JP2548477Y2 JP2548477Y2 (ja) | 1997-09-24 |
Family
ID=31588375
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989060745U Expired - Lifetime JP2548477Y2 (ja) | 1989-05-24 | 1989-05-24 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2548477Y2 (OSRAM) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5853776A (ja) * | 1981-09-25 | 1983-03-30 | Nec Corp | 集積回路測定機 |
| JPS6217668A (ja) * | 1985-07-17 | 1987-01-26 | Yokogawa Electric Corp | 半導体集積回路検査装置 |
-
1989
- 1989-05-24 JP JP1989060745U patent/JP2548477Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5853776A (ja) * | 1981-09-25 | 1983-03-30 | Nec Corp | 集積回路測定機 |
| JPS6217668A (ja) * | 1985-07-17 | 1987-01-26 | Yokogawa Electric Corp | 半導体集積回路検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2548477Y2 (ja) | 1997-09-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |