JPH0481080U - - Google Patents
Info
- Publication number
- JPH0481080U JPH0481080U JP12563690U JP12563690U JPH0481080U JP H0481080 U JPH0481080 U JP H0481080U JP 12563690 U JP12563690 U JP 12563690U JP 12563690 U JP12563690 U JP 12563690U JP H0481080 U JPH0481080 U JP H0481080U
- Authority
- JP
- Japan
- Prior art keywords
- printed circuit
- circuit board
- signal terminal
- testing
- testing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12563690U JPH0481080U (OSRAM) | 1990-11-27 | 1990-11-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12563690U JPH0481080U (OSRAM) | 1990-11-27 | 1990-11-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0481080U true JPH0481080U (OSRAM) | 1992-07-15 |
Family
ID=31873227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12563690U Pending JPH0481080U (OSRAM) | 1990-11-27 | 1990-11-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0481080U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007024884A (ja) * | 2005-07-11 | 2007-02-01 | Samsung Electronics Co Ltd | 半導体装置、テスト基板、半導体装置のテストシステム及び半導体装置のテスト方法 |
-
1990
- 1990-11-27 JP JP12563690U patent/JPH0481080U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007024884A (ja) * | 2005-07-11 | 2007-02-01 | Samsung Electronics Co Ltd | 半導体装置、テスト基板、半導体装置のテストシステム及び半導体装置のテスト方法 |
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