JPH0210251A - Board checking apparatus - Google Patents

Board checking apparatus

Info

Publication number
JPH0210251A
JPH0210251A JP63161670A JP16167088A JPH0210251A JP H0210251 A JPH0210251 A JP H0210251A JP 63161670 A JP63161670 A JP 63161670A JP 16167088 A JP16167088 A JP 16167088A JP H0210251 A JPH0210251 A JP H0210251A
Authority
JP
Japan
Prior art keywords
image
circuit
regions
bright
soldered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63161670A
Other languages
Japanese (ja)
Inventor
Takehisa Tanaka
田中 武久
Kunio Yoshida
邦夫 吉田
Kazutoshi Iketani
池谷 和俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63161670A priority Critical patent/JPH0210251A/en
Publication of JPH0210251A publication Critical patent/JPH0210251A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method

Abstract

PURPOSE:To detect poor soldered parts positively at a high speed with a simple apparatus by illuminating the soldered part, photographing the image of said part, counting the number of bright regions, and judging the quality thereof. CONSTITUTION:A ring shaped lighting device 3 is provided so that an electronic part 2 is uniformly illuminated. The image of a printed board 1 on which the electronic part 2 is mounted is picked up with a video camera 4. The obtained image signal undergoes A/D conversion in an image binary coding circuit 5. The signal is further binary-coded with a luminance value. The binary coded image signals are processed as follows: the picture elements in the bright area are collected so that the picture elements at the upper and lower parts and right and left parts are gathered together with an area extracting circuit 6; and the number of bright regions 9 which cannot be collected in the same area at the final stage is counted. Thus the number of the regions 9 is inputted into a judging circuit 7. The number is compared with the number of the regions 9 in a good soldered part 8 which is picked up beforehand and used as a stored reference. When the number of the regions 9 obtained in the circuit 6 is larger than the reference number of the regions 9, the product is judged as a defective product. When the number is small, the product is judged as a good product.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はプリント基板上の半田付は部の状態を検査する
基板検査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a board inspection device for inspecting the condition of soldered parts on a printed circuit board.

従来の技術 従来の基板検査装置には、対象物を照明して位置ずれ欠
品等を検査するものはあったが、半田付は部の状態の検
査ができるものはなかった。したがって、基板上の電子
部品等の半田付は部の検査は、作業者による目視検査で
おこなわれでいた。
BACKGROUND OF THE INVENTION Conventional board inspection apparatuses have been used to inspect objects for misalignment, missing parts, etc. by illuminating the object, but none have been able to inspect the condition of soldering parts. Therefore, inspection of the soldered portions of electronic components and the like on the board has been performed by visual inspection by an operator.

発明が解決しようとする課題 しかし、プリント基板上の部品の小型化や高密度実装化
がいっそう進んできている現在では、作業者が非常に細
かな半田付は部を長時間検査しつづけることは非常に困
難である上に、作業者の熟練度、疲労度により検査結果
に大きなばらつきが生ずるという課題があった。
Problems to be Solved by the Invention However, in today's world, where components on printed circuit boards are becoming smaller and more densely packaged, it is difficult for workers to continue inspecting very fine soldered parts for long periods of time. In addition to being extremely difficult, there was a problem in that the test results varied greatly depending on the skill level and fatigue level of the operator.

本発明は、以上のような従来の課題を解決するためにな
されたもので、半田付は部を作業者によらずに検査でき
る基板検査装置を提供することを目的とするものである
The present invention has been made to solve the above-mentioned conventional problems, and an object of the present invention is to provide a board inspection device that can inspect soldering parts without relying on an operator.

課題を解決するための手段 本発明は上記課題を解決するため、プリント基板を照明
する照明手段と、前記プリント基板を撮像するビデオカ
メラと、前記ビデオカメラにより撮像された画像信号を
二値画像信号に変換する画保工値化回路と、前記画像二
値化回路によシニ値化された画像信号を用いて、半田付
は部に対応する部分の領域の数を数える領域抽出回路と
、前記領域抽出回路より得られる領域数を基準領域数と
比較して半田付は部の良不良を判定する判定回路とから
構成されているものである。
Means for Solving the Problems In order to solve the above problems, the present invention provides an illumination means for illuminating a printed circuit board, a video camera for capturing an image of the printed circuit board, and converting an image signal imaged by the video camera into a binary image signal. an area extraction circuit that counts the number of areas in the part corresponding to the soldering area using the image signal converted into a digital image signal by the image binarization circuit; The apparatus includes a determination circuit that compares the number of areas obtained by the area extraction circuit with a reference number of areas to determine whether the soldering part is good or bad.

作用 本発明は上記構成によって、簡単な装置で半田付は部の
不良を高速かつ確実に検出することができるようにした
ものである。そして、従来多大な労力を必要としていた
半田付は部の目視検査を自動化し、検査の効率を大幅に
向上することができる。
Effect of the Invention With the above configuration, the present invention enables defective soldering parts to be detected quickly and reliably using a simple device. Furthermore, the visual inspection of soldering parts, which conventionally required a great deal of labor, can be automated, and inspection efficiency can be greatly improved.

また、本発明を実現する撮像系は一系統で良く、装置を
コンパクトにすることができる。
Furthermore, only one imaging system is required to realize the present invention, and the apparatus can be made compact.

実施例 以下に本発明の一実施例について図面を参照しながら説
明する。
EXAMPLE An example of the present invention will be described below with reference to the drawings.

第1図は本発明による一実施例における基板検査装置の
ブロック結線図である。電子部品2が実装されたプリン
ト基板1の真上K、リング状照明装置3とビデオカメラ
4を、軸が同一になるように配置している。そして、ビ
デオカメラ4の出力を画像二値化回路5に接続し、画像
二値化回路5の出力を領域抽出回路6に接続し、さらに
領域抽出回路6の出力を判定回路7に接続している。
FIG. 1 is a block diagram of a board inspection apparatus according to an embodiment of the present invention. A ring-shaped illumination device 3 and a video camera 4 are arranged directly above a printed circuit board 1 on which an electronic component 2 is mounted so that their axes are the same. Then, the output of the video camera 4 is connected to an image binarization circuit 5, the output of the image binarization circuit 5 is connected to a region extraction circuit 6, and the output of the region extraction circuit 6 is further connected to a determination circuit 7. There is.

ここで以上の構成の動作を説明する前に、本発明で用い
る原理を説明する。
Before explaining the operation of the above configuration, the principle used in the present invention will be explained.

良い半田付は部と不良の半田付は部を照明して、真上よ
りビデオカメラ4で撮像したときの様子を示したものが
第2図である。ここで第2図(a)は良い半田付は部の
場合、(b)は不良の半田付は部の場合である。また、
良い半田付は部と不良の半田付は部の断面を示したもの
が第3図である。
FIG. 2 shows the situation when the parts with good soldering and the parts with bad soldering are illuminated and imaged with the video camera 4 from directly above. Here, FIG. 2(a) shows the case of good soldering, and FIG. 2(b) shows the case of bad soldering. Also,
FIG. 3 shows a cross-section of a section with good soldering and a section with poor soldering.

ここで第3図(a)は良い半田付は部の場合、(b)は
不良の半田付は部の場合である。
Here, FIG. 3(a) shows the case of good soldering in parts, and FIG. 3(b) shows the case of bad soldering in parts.

良い半田付は部の表面は、第3図(a)のように滑らか
で光沢がある。したがって、ビデオカメラで撮像すると
、半田付は部8には第2図(a)のように少数の大きく
て明るい領域9が撮像される。しかし不良の半田付は部
の場合は、第3図(b)のように、表面に凹凸が多数で
き鏡面にもならない。したがって、ビデオカメラ4で撮
像すると、半田付は部8には第2図(b)のように複雑
に入シ組んだ小さい多数の領域9が撮像される。
The surface of a good soldered part is smooth and shiny, as shown in Figure 3(a). Therefore, when an image is captured by a video camera, a small number of large and bright areas 9 are captured in the soldering area 8 as shown in FIG. 2(a). However, in the case of defective soldering, the surface has many irregularities and does not have a mirror surface, as shown in FIG. 3(b). Therefore, when the video camera 4 captures an image, a large number of small and complicated areas 9 are captured in the soldering area 8 as shown in FIG. 2(b).

以上の事実から、明部領域の数を基準の明部領域の数と
比較することによシ、半田付は部の良不良を判定するこ
とができる。
From the above facts, it is possible to determine whether a soldering part is good or bad by comparing the number of bright areas with the number of standard bright areas.

本発明は以上の原理に着目し、光学的に半田の良不良の
状態を検査するものである。以下その動作を説明する。
The present invention focuses on the above principle and optically inspects the quality of solder. The operation will be explained below.

第1図において、電子部品2を均一に照明するようにリ
ング状照明装置3を置く。そして、リング状照明装置3
で照明しながら、電子部品2の実装されたプリント基板
1を、ビデオカメラ4で撮像する。
In FIG. 1, a ring-shaped illumination device 3 is placed so as to illuminate the electronic component 2 uniformly. And a ring-shaped lighting device 3
The printed circuit board 1 on which the electronic component 2 is mounted is imaged by the video camera 4 while being illuminated by the video camera 4.

そして、得られた撮像画像信号を画像二値化回路5に入
力する。この画像二値化回路5で、画像信号を領域に分
割しやすくするため、画像信号をアナログ/ディジタル
変換し、さらに輝度値により二値化する。
Then, the obtained captured image signal is input to the image binarization circuit 5. This image binarization circuit 5 performs analog/digital conversion on the image signal in order to easily divide the image signal into regions, and further binarizes the image signal using luminance values.

次に、二値化された画像信号を領域抽出回路6に入力す
る。この領域抽出回路6で、二値化された画像信号の明
部に対応する画素を、上下左右にとりあった画素どうし
で同じ領域としてまとめる。
Next, the binarized image signal is input to the area extraction circuit 6. This region extracting circuit 6 collects pixels corresponding to the bright portions of the binarized image signal into the same region, including pixels located vertically and horizontally.

そして、最終的に同じ領域としてまとめられない明部領
域の数を数える。第4図は二値化画像信号を模式的に示
したものである。例えば、第4図において、10.11
.12は各々独立した領域であシ、この中の領域の数は
3になる。
Then, the number of bright areas that cannot be grouped together as the same area is counted. FIG. 4 schematically shows a binary image signal. For example, in Figure 4, 10.11
.. Each of the 12 areas is an independent area, and the number of areas among these is 3.

そして、最終的に同じ領域としてまとめられない明部領
域の数を判定回路7に入力する。この判定回路7で、領
域抽出回路6より得られた明部領域の数と、あらかじめ
採取して記憶しておいた基準となる良い半田付は部の明
部領域の数とを比較する。そして、基準の明部領域の数
より領域抽出回路6で得られた明部領域の数のほうが大
きいときは不良と判定し、小さいときは良と判定する。
Then, the number of bright areas that cannot be grouped together as the same area is input to the determination circuit 7. This determination circuit 7 compares the number of bright areas obtained from the area extracting circuit 6 with the number of bright areas with good soldering, which serves as a reference sampled and stored in advance. When the number of bright areas obtained by the area extraction circuit 6 is larger than the number of reference bright areas, it is determined to be defective, and when it is smaller, it is determined to be good.

以上により簡単な装置と簡単な演算で、今まで目視に頼
っていた半田付は部の検査を、自動で高速に行うことが
できる。
As described above, with a simple device and simple calculations, inspection of soldering parts, which until now had to be done visually, can be performed automatically and at high speed.

なお、以上の実施例では、照明手段をリング状照明装置
3としているが、ビデオカメラ4で撮像するのに十分な
光量を持つものならば、他の照明装置でも良い。
In the above embodiment, the ring-shaped illumination device 3 is used as the illumination means, but any other illumination device may be used as long as it has a sufficient amount of light for the video camera 4 to capture an image.

また、画像二値化回路5を、アナログ/ディジタル変換
してから二値化するものとしているが、アナログ量のま
まで、あるレベルをきめて二値化しても良い。
Further, although the image binarization circuit 5 performs analog/digital conversion and then binarizes the image, it is also possible to binarize the image by determining a certain level while keeping the analog quantity.

また、領域抽出回路6で領域として明部画素をまとめる
ときに、上下左右4近傍の画素を同じ領域としてまとめ
たが、左上、右上、左下、右下も加えた8近傍の画素を
同じ領域としてまとめても良い。この場合、たとえば第
4図では、10.11は同じ領域となり、領域の数は2
となる。
In addition, when the bright area pixels are grouped together as a region in the region extraction circuit 6, the four neighboring pixels on the top, bottom, left and right sides are grouped together as the same region, but the eight neighboring pixels including the top left, top right, bottom left, and bottom right are also considered as the same region. You can also put them together. In this case, for example in Figure 4, 10.11 are the same area, and the number of areas is 2.
becomes.

発明の詳細 な説明したように本発明は、半田付は部を照明して撮像
し、半田付は部にできる明部領域の数を数えて良不良の
判定をおこなうものであり、半田付は部の良不良の検査
を容易におこなうことができる。また、装置の構成が簡
単である上に良不良の判定も簡単な演算ですむため、容
易に導入することができる。そして本発明により、今ま
で作業者による目視検査に頼っていた半田付は部の検査
を、自動化して高速かつ確実に行うことができる。
Detailed Description of the Invention As described in the present invention, the soldering part is illuminated and imaged, and the number of bright areas formed in the soldering part is counted to judge whether it is good or bad. It is possible to easily inspect whether parts are good or bad. Furthermore, since the configuration of the device is simple and determination of pass/fail requires simple calculations, it can be easily introduced. According to the present invention, the inspection of soldering parts, which has hitherto relied on visual inspection by an operator, can be automated at high speed and reliably.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例における基板検査装置のブロ
ック結線図、第2図は良い半田付は部と不良の半田付は
部を真上より撮像したときの模式図、第3図は良い半田
付は部と不良の半田付は部の断面の模式図、第4図は二
値化画像データの模式図である。 1・・・プリント基板、2・・・電子部品、3・・・リ
ング状照明装置、4・・・ビデオカメラ、5・・・画像
二値化回路、6・・・領域抽出回路、7・・・判定回路
、8・・・半田付は部、9・・・明部領域、10.11
.12・・・領域。 代理人の氏名 弁理士 中 尾 敏 男ほか1名図 第3図 (b) 第2図 (o) 7アタ〕F慕版 \ 第 4 図 ノl
Fig. 1 is a block wiring diagram of a board inspection device according to an embodiment of the present invention, Fig. 2 is a schematic diagram of a part with good soldering and a part with bad soldering, taken from directly above. FIG. 4 is a schematic diagram of a cross-section of a section showing good soldering and a section showing poor soldering, and FIG. 4 is a schematic diagram of binary image data. DESCRIPTION OF SYMBOLS 1... Printed circuit board, 2... Electronic component, 3... Ring-shaped lighting device, 4... Video camera, 5... Image binarization circuit, 6... Area extraction circuit, 7... ... Judgment circuit, 8... Soldering part, 9... Bright area, 10.11
.. 12... area. Name of agent: Patent attorney Satoshi Nakao and one other person Figure 3 (b) Figure 2 (o)

Claims (1)

【特許請求の範囲】[Claims] 電子部品等の半田付けされたプリント基板を照明する照
明手段と、前記プリント基板を撮像するビデオカメラと
、前記ビデオカメラにより撮像された画像信号を二値画
像信号に変換する画像二値化回路と、前記画像二値化回
路により二値化された画像信号を用いて、半田付け部に
対応する部分にある明部領域の数を数える領域抽出回路
と、前記領域抽出回路より得られる領域数を基準領域数
と比較して半田付け部の良不良を判定する判定回路とを
具備する基板検査装置。
An illumination means for illuminating a printed circuit board to which electronic components or the like are soldered; a video camera for capturing an image of the printed circuit board; and an image binarization circuit for converting an image signal captured by the video camera into a binary image signal. , an area extraction circuit that counts the number of bright areas in a portion corresponding to the soldering part using the image signal binarized by the image binarization circuit; and an area extraction circuit that counts the number of areas obtained by the area extraction circuit. A board inspection device comprising a determination circuit that determines whether a soldered part is good or bad by comparing it with a reference number of areas.
JP63161670A 1988-06-29 1988-06-29 Board checking apparatus Pending JPH0210251A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63161670A JPH0210251A (en) 1988-06-29 1988-06-29 Board checking apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63161670A JPH0210251A (en) 1988-06-29 1988-06-29 Board checking apparatus

Publications (1)

Publication Number Publication Date
JPH0210251A true JPH0210251A (en) 1990-01-16

Family

ID=15739609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63161670A Pending JPH0210251A (en) 1988-06-29 1988-06-29 Board checking apparatus

Country Status (1)

Country Link
JP (1) JPH0210251A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743124A (en) * 1993-08-03 1995-02-10 Nec Corp Inspection device for packaged substrate
JP2011153928A (en) * 2010-01-27 2011-08-11 Dowa Metaltech Kk Method for visual examination of insulating circuit board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743124A (en) * 1993-08-03 1995-02-10 Nec Corp Inspection device for packaged substrate
JP2011153928A (en) * 2010-01-27 2011-08-11 Dowa Metaltech Kk Method for visual examination of insulating circuit board

Similar Documents

Publication Publication Date Title
US8358829B2 (en) System and a method for inspecting an object
JPH055281B2 (en)
EP0871027A2 (en) Inspection of print circuit board assembly
JPH0210251A (en) Board checking apparatus
JPH036447A (en) Inspecting apparatus of packaged board
JPH1086322A (en) Method and apparatus for inspecting cream solder print
JPH0560537A (en) Through-hole inspection device
JPH05288527A (en) Appearance inspecting method for mounted board and its device
JPH08152412A (en) Appearance inspection device
JP2005223006A (en) Inspection method of cream solder print
JPH0735699A (en) Method and apparatus for detecting surface defect
JPH0682390A (en) Method and apparatus for inspecting surface defect
JPH01219547A (en) Substrate inspecting device
KR0152885B1 (en) Classifying method of soldering for pcb
JPH0399251A (en) Mounted state recognizing apparatus
JP2765338B2 (en) Chip component mounting inspection equipment
JPH06174444A (en) Soldered state inspection method for discrete type electronic component
JPH07209205A (en) Method and apparatus for inspecting soldered state
JPH0399250A (en) Mounting state recognizing apparatus
JPH01219548A (en) Substrate inspecting device
JPH0221209A (en) Apparatus and method for inspecting soldering of printed wiring board
JPH06117828A (en) Method of detecting soldering defect of discrete part
KR0147272B1 (en) Mounting method for qfp component
JPH06243235A (en) Checking device for mounted board
JP2677052B2 (en) Through hole inspection device