JPH05288527A - Appearance inspecting method for mounted board and its device - Google Patents

Appearance inspecting method for mounted board and its device

Info

Publication number
JPH05288527A
JPH05288527A JP9051292A JP9051292A JPH05288527A JP H05288527 A JPH05288527 A JP H05288527A JP 9051292 A JP9051292 A JP 9051292A JP 9051292 A JP9051292 A JP 9051292A JP H05288527 A JPH05288527 A JP H05288527A
Authority
JP
Japan
Prior art keywords
fillet
section
image
shape
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9051292A
Other languages
Japanese (ja)
Inventor
Yukio Okada
幸雄 岡田
Keiji Shintani
啓司 新谷
Hiroo Uchiyama
博夫 内山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP9051292A priority Critical patent/JPH05288527A/en
Publication of JPH05288527A publication Critical patent/JPH05288527A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide the appearance inspecting method of a mounted board and its device inspecting the shape of an inspection' section such as a soldered section and having improved detection precision. CONSTITUTION:A lighting means 4 having LEDs 6a-6d is formed into a dome shape so that the radiated light can be condensed at the solder fillet 3 section of an electronic component 2 on a printed board 1. The LEDs 6a-6d are arranged at every 90 deg. and individually lighted. Reflected light images of the fillet 3 section having multiple different radiation directions are photographed by a television camera 7. The reflected light images are changed in response to the radiation directions and the stereoscopic shape of the fillet 3, these images are individually image-processed to detect the orientation of the curved element of the fillet 3 section, and the processed information is integrated to judge the quality of the fillet 3 section.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プリント基板に実装さ
れた電子部品の位置ずれ、リード浮き、はんだ不良等の
検査を行う実装基板外観検査方法およびその装置に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mounting board appearance inspection method and apparatus for inspecting electronic components mounted on a printed circuit board for displacement, lead floating, solder defects and the like.

【0002】[0002]

【従来の技術】図6は3次元の形状情報を検出すること
ができる従来の実装基板外観検査方法の一例を示す説明
図である。
2. Description of the Related Art FIG. 6 is an explanatory diagram showing an example of a conventional mounting board appearance inspection method capable of detecting three-dimensional shape information.

【0003】図6において、1はプリント基板、2は電
子部品、3は電子部品2をプリント基板1にはんだ付け
により実装した際のはんだフィレットである。101は
撮像装置である。
In FIG. 6, 1 is a printed circuit board, 2 is an electronic component, and 3 is a solder fillet when the electronic component 2 is mounted on the printed circuit board 1 by soldering. Reference numeral 101 is an imaging device.

【0004】そして、レーザ光源(図示省略)からスリ
ット光102を照射して、はんだフィレット3部を含む
電子部品2およびプリント基板1の表面に表面形状に沿
って歪を受けた光切断線103を生成する。この光切断
線103の反射光像を撮像装置101で撮像し、その撮
像パターンの歪状態をチェックすることにより、はんだ
フィレット3部の立体形状を検出する。
Then, a slit light 102 is emitted from a laser light source (not shown), and a light cutting line 103 is distorted along the surface shape on the surfaces of the electronic component 2 including the solder fillet 3 and the printed circuit board 1. To generate. The reflected light image of the light cutting line 103 is picked up by the image pickup device 101, and the three-dimensional shape of the solder fillet 3 is detected by checking the distortion state of the picked-up pattern.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記従
来の実装基板外観検査方法では、スリット光102が照
射された部位の形状情報が得られるのみで、それ以外の
部位の立体形状を把握するのは困難であり、検出精度に
劣るという問題がある。
However, in the above-mentioned conventional mounting board appearance inspection method, only the shape information of the portion irradiated with the slit light 102 can be obtained, and the three-dimensional shape of other portions can be grasped. It is difficult and the detection accuracy is poor.

【0006】本発明は、このような従来の問題を解決す
るものであり、はんだ付け部位等の被検査部位の形状を
検出することができるようにして検出精度を向上させる
ことができるようにした実装基板外観検査方法およびそ
の装置を提供することを目的とするものである。
The present invention solves such a conventional problem, and enables the shape of a portion to be inspected such as a soldering portion to be detected to improve the detection accuracy. It is an object of the present invention to provide a mounting board appearance inspection method and apparatus.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
の本発明の実装基板外観検査方法は、被検査物を異なっ
た複数の方向から順次照明し、その都度得られる画像の
特徴から総合して良、不良を判定するようにしたもので
ある。
A mounting board appearance inspection method of the present invention for achieving the above object illuminates an object to be inspected sequentially from a plurality of different directions, and combines the characteristics of an image obtained each time. The quality is judged to be good or bad.

【0008】上記目的を達成するための本発明の実装基
板外観検査装置は、ドーム状に配置され、複数方向に分
割された照明手段と、この照明手段を複数方向に分割し
て順次点灯し、照明方向を切り換える制御手段と、上記
ドーム状の照明手段のドーム頂部から被検査物を撮像す
る撮像手段と、この撮像手段で撮像された画像を処理し
て良、不良を判定する手段とを備えたものである。
A mounting board appearance inspection apparatus of the present invention for achieving the above object is a dome-shaped illuminating means divided into a plurality of directions, and the illuminating means is divided into a plurality of directions and sequentially turned on. Control means for switching the illumination direction, image pickup means for picking up an object to be inspected from the dome top of the dome-shaped lighting means, and means for processing the image picked up by this image pickup means to judge good or bad It is a thing.

【0009】[0009]

【作用】したがって、本発明によれば、はんだ付け部位
等の被検査部位の表面へ方向の異なる光を順次照射し、
被検査部位の各反射光像のパターンを撮像し、被検査部
位が有する局面要素の配向性、すなわち、被検査部位の
立体的形状に応じた変化を検出することにより、被検査
部位の形状を検出することができる。
Therefore, according to the present invention, the surface of the inspected portion such as the soldering portion is sequentially irradiated with light of different directions,
By capturing the pattern of each reflected light image of the inspected part and detecting the orientation of the aspect elements of the inspected part, that is, the change according to the three-dimensional shape of the inspected part, the shape of the inspected part can be determined. Can be detected.

【0010】[0010]

【実施例】以下、本発明の一実施例について図面を参照
しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0011】図1は本発明の一実施例における実装基板
外観検査装置を示す斜視図、図2(a)は同検査装置を
示す断面図、図2(b)は同検査装置に用いる光源の配
置説明図、図3は同検査装置に用いる画像処理回路の説
明図、図4は電子部品の実装状態を示す側面図、図5
(a)〜(d)は本発明の一実施例における実装基板外
観検査方法を示し、各照射条件における検出画像の平面
図である。
FIG. 1 is a perspective view showing a mounting board appearance inspection apparatus according to an embodiment of the present invention, FIG. 2 (a) is a sectional view showing the same inspection apparatus, and FIG. 2 (b) is a light source used in the same inspection apparatus. 5 is an explanatory view of the arrangement, FIG. 3 is an explanatory view of an image processing circuit used in the inspection apparatus, FIG. 4 is a side view showing a mounting state of electronic components, and FIG.
(A)-(d) is a top view of the detection image in each irradiation condition which shows the mounting board appearance inspection method in one Example of this invention.

【0012】図1、図2において、1はプリント基板、
2は電子部品(チップ部品)、3は電子部品2をプリン
ト基板1にはんだ付けにより実装した際のはんだフィレ
ットである。プリント基板1等はテーブル(図示省略)
に載せられて検査シーケンスによりXY方向へ移動す
る。4は電子部品2のプリント基板1に対する実装状態
を検査するため、被検査部を上方から照明する照明手段
であり、ドーム状のフレーム5の内側に90度ごとに別
々に点灯される多数の光源であるLED(発光ダイオー
ド)6a〜6dが備えられ、それぞれ照射された光がプ
リント基板1上のはんだフィレット3部に集光し得るよ
うに配置されている。7は照明手段4の頂部の穴8内に
配置され、上方より被検査部を撮像するテレビカメラで
ある。
1 and 2, 1 is a printed circuit board,
Reference numeral 2 is an electronic component (chip component), and 3 is a solder fillet when the electronic component 2 is mounted on the printed board 1 by soldering. The printed circuit board 1 etc. is a table (not shown)
And moves in the XY directions according to the inspection sequence. Reference numeral 4 denotes an illuminating means for illuminating an inspected portion from above in order to inspect a mounting state of the electronic component 2 on the printed circuit board 1, and a large number of light sources which are individually turned on every 90 degrees inside the dome-shaped frame 5. The LEDs (light emitting diodes) 6a to 6d are provided, and are arranged so that the emitted light can be condensed on the solder fillet 3 portion on the printed circuit board 1. Reference numeral 7 denotes a television camera which is arranged in the hole 8 at the top of the illumination means 4 and which images the portion to be inspected from above.

【0013】図3において、9は画像入力部、10はテ
レビカメラ7で撮像され、画像入力部9から送られた画
像を処理する画像処理部、11は画像処理部10から送
られた情報から部品2の実装状態を判定する判定処理
部、12は照明制御部であり、照明手段4のLED6
a、6b、6c、6dを順次切り換えて点灯させる。
In FIG. 3, 9 is an image input unit, 10 is an image processing unit for processing an image captured by the television camera 7 and sent from the image input unit 9, and 11 is information sent from the image processing unit 10. A determination processing unit for determining the mounting state of the component 2, 12 is an illumination control unit, and the LED 6 of the illumination means 4
A, 6b, 6c and 6d are sequentially switched to light.

【0014】以上の構成において、以下、外観検査方法
について説明する。照明制御部12により照明手段4の
LED6a、6b、6c、6dを順次切り換えて点灯さ
せながら、各々の照明条件で被検査部位であるはんだフ
ィレット3部をテレビカメラ7で撮像し、画像入力部9
を経て画像処理部10で画像処理する。このとき、複数
の異なる照射方向のLED6a、6b、6c、6dの照
明によるはんだフィレット3部の反射光像をテレビカメ
ラ7により撮像することができる。
With the above structure, the appearance inspection method will be described below. While the LEDs 6a, 6b, 6c, 6d of the illumination means 4 are sequentially switched and turned on by the illumination control unit 12, the television camera 7 captures images of the solder fillet 3 which is the inspected site under each illumination condition, and the image input unit 9
After that, the image processing unit 10 performs image processing. At this time, the television camera 7 can capture the reflected light image of the solder fillet 3 part by the illumination of the LEDs 6a, 6b, 6c, and 6d in different irradiation directions.

【0015】図4(a)〜(d)に示す各照明条件にお
ける検出画像図では、はんだフィレット3において明る
く光り、二値化画像の白に相当する部分eを斜線で示
し、暗く見え、二値化画像の黒に相当する部分fを白抜
きで示している。そして、図4(a)に示すように、L
ED6aによる照明では、二値化画像の白部eの形状が
フィレット3の裾部から上端部に至るに従い、次第に幅
狭となる。図4(b)に示すように、LED6bによる
照明では、二値化画像の白部eの形状がフィレット3の
一側部で裾部から上端部に至るに従い、次第に幅広とな
る。図4(c)に示すように、LED6cによる照明で
は、フィレット3の全体が電子部品2の影になり、二値
化画像の黒fになる。図4(d)に示すように、LED
6dによる照明では、二値化画像の白部eの形状がフィ
レット3の他側部で裾部から上端部に至るに従い、次第
に幅広となる。
In the detection image diagrams under the respective illumination conditions shown in FIGS. 4A to 4D, the solder fillet 3 shines brightly, and the portion e corresponding to white in the binarized image is indicated by diagonal lines and appears dark, and A portion f corresponding to black in the binarized image is shown in white. Then, as shown in FIG.
In the illumination by the ED 6a, the shape of the white part e of the binarized image becomes gradually narrower from the skirt to the top of the fillet 3. As shown in FIG. 4B, in the illumination by the LED 6b, the shape of the white part e of the binarized image becomes gradually wider from one side of the fillet 3 to the upper end. As shown in FIG. 4C, in the illumination by the LED 6c, the entire fillet 3 becomes the shadow of the electronic component 2 and becomes the black f of the binarized image. As shown in FIG. 4 (d), the LED
In the illumination by 6d, the shape of the white part e of the binarized image gradually widens from the hem part to the upper end part on the other side part of the fillet 3.

【0016】このようにLED6a〜6dの各照明方向
により二値化画像の白部eの形状、大きさ、位置が変化
し、また、はんだフィレット3の形状により、やはりフ
ィレット3の各々の特徴を表す。したがって、判定処理
部11で処理情報を総合してはんだ付けフィレット3部
の良、不良を判定する。
As described above, the shape, size, and position of the white portion e of the binarized image changes depending on the illumination direction of the LEDs 6a to 6d, and the shape of the solder fillet 3 also determines the characteristics of each fillet 3. Represent Therefore, the determination processing unit 11 comprehensively processes the processing information and determines whether the soldering fillet 3 is good or bad.

【0017】[0017]

【発明の効果】以上説明したように本発明によれば、は
んだ付け部位等の被検査部位の表面へ方向の異なる光を
順次照射し、被検査部位の各反射光像のパターンを撮像
し、被検査部位が有する曲面要素の配向性を検出するこ
とにより、被検査部位の立体的形状を検出することがで
きる。したがって、検出精度を向上させることができ
る。
As described above, according to the present invention, the surface of the inspected portion such as the soldering portion is sequentially irradiated with light in different directions, and the pattern of each reflected light image of the inspected portion is picked up, By detecting the orientation of the curved surface element of the inspected part, the three-dimensional shape of the inspected part can be detected. Therefore, the detection accuracy can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例における実装基板外観検査装
置を示す斜視図
FIG. 1 is a perspective view showing a mounting board appearance inspection device according to an embodiment of the present invention.

【図2】(a)本発明の一実施例における実装基板外観
検査装置を示す断面図 (b)は同外観検査装置に用いる光源の配置説明図
FIG. 2A is a cross-sectional view showing a mounting board appearance inspection device according to an embodiment of the present invention, and FIG. 2B is a layout explanatory view of a light source used in the appearance inspection device.

【図3】本発明の一実施例における実装基板外観検査装
置に用いる画像処理回路を示すブロック図
FIG. 3 is a block diagram showing an image processing circuit used in a mounting board appearance inspection device according to an embodiment of the present invention.

【図4】(a)は電子部品の実装状態を示す側面図FIG. 4A is a side view showing a mounting state of electronic components.

【図5】(a)〜(d)は本発明の一実施例における実
装基板外観検査方法を示し、各照明条件における検出画
像の平面図
5A to 5D show a mounting board appearance inspection method according to an embodiment of the present invention, which is a plan view of a detection image under each illumination condition.

【図6】従来の実装基板外観検査方法を示す説明図FIG. 6 is an explanatory view showing a conventional mounting board appearance inspection method.

【符号の説明】[Explanation of symbols]

1 プリント基板 2 電子部品 3 はんだフィレット 4 照明手段 6 LED 7 テレビカメラ 9 画像入力部 10 画像処理部 11 判定処理部 12 照明制御部 DESCRIPTION OF SYMBOLS 1 Printed circuit board 2 Electronic component 3 Solder fillet 4 Illumination means 6 LED 7 Television camera 9 Image input section 10 Image processing section 11 Judgment processing section 12 Lighting control section

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 被検査物を異なった複数の方向から順次
照明し、その都度得られる画像の特徴から総合して良、
不良を判定する実装基板外観検査方法。
1. An object to be inspected is sequentially illuminated from a plurality of different directions, and the characteristics of the image obtained in each case are comprehensive,
Mounting board appearance inspection method for determining defects.
【請求項2】 ドーム状に配置され、複数方向に分割さ
れた照明手段と、この照明手段を複数方向に分割して順
次点灯し、照明方向を切り換える制御手段と、上記ドー
ム状の照明手段のドーム頂部から被検査物を撮像する撮
像手段と、この撮像手段で撮像された画像を処理して
良、不良を判定する手段とを備えた実装基板外観検査装
置。
2. A dome-shaped illuminating means divided into a plurality of directions, a control means for dividing the illuminating means into a plurality of directions and sequentially lighting them, and switching the illuminating direction, and the dome-like illuminating means. A mounting board appearance inspection device comprising: an image pickup unit that picks up an image of an object to be inspected from the top of a dome;
JP9051292A 1992-04-10 1992-04-10 Appearance inspecting method for mounted board and its device Pending JPH05288527A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9051292A JPH05288527A (en) 1992-04-10 1992-04-10 Appearance inspecting method for mounted board and its device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9051292A JPH05288527A (en) 1992-04-10 1992-04-10 Appearance inspecting method for mounted board and its device

Publications (1)

Publication Number Publication Date
JPH05288527A true JPH05288527A (en) 1993-11-02

Family

ID=14000523

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9051292A Pending JPH05288527A (en) 1992-04-10 1992-04-10 Appearance inspecting method for mounted board and its device

Country Status (1)

Country Link
JP (1) JPH05288527A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997028420A1 (en) * 1996-02-02 1997-08-07 Komatsu Ltd. Lead inspection apparatus of ic package
KR100377116B1 (en) * 2000-06-07 2003-03-26 (주)스탠다드레이저시스템 Lighting instrument using light emitting diode and curved surface reflecting mirror and automatized defect inspection system comprising the same lighting instrument
US8192050B2 (en) 2009-03-31 2012-06-05 Sony Corporation Illumination device for visual inspection and visual inspection apparatus
DE102013216196A1 (en) * 2013-08-14 2015-02-19 Asm Assembly Systems Gmbh & Co. Kg Detecting the 3D structure of a deposited on a component carrier depot of solder paste
KR20150119884A (en) 2013-02-20 2015-10-26 다이이치지쯔교 비스위루 가부시키가이샤 Inspection device
KR20200090092A (en) 2019-01-18 2020-07-28 다이이치지쯔교 비스위루 가부시키가이샤 Inspection apparatus
KR20220023591A (en) * 2020-08-21 2022-03-02 최종명 Soldering inspection equipment and soldering inspection method using the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03218407A (en) * 1989-09-11 1991-09-26 Toshiba Corp Shape measuring device, shape measuring method and correcting method for shape measuring device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03218407A (en) * 1989-09-11 1991-09-26 Toshiba Corp Shape measuring device, shape measuring method and correcting method for shape measuring device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997028420A1 (en) * 1996-02-02 1997-08-07 Komatsu Ltd. Lead inspection apparatus of ic package
KR100377116B1 (en) * 2000-06-07 2003-03-26 (주)스탠다드레이저시스템 Lighting instrument using light emitting diode and curved surface reflecting mirror and automatized defect inspection system comprising the same lighting instrument
US8192050B2 (en) 2009-03-31 2012-06-05 Sony Corporation Illumination device for visual inspection and visual inspection apparatus
KR20150119884A (en) 2013-02-20 2015-10-26 다이이치지쯔교 비스위루 가부시키가이샤 Inspection device
DE102013216196A1 (en) * 2013-08-14 2015-02-19 Asm Assembly Systems Gmbh & Co. Kg Detecting the 3D structure of a deposited on a component carrier depot of solder paste
KR20200090092A (en) 2019-01-18 2020-07-28 다이이치지쯔교 비스위루 가부시키가이샤 Inspection apparatus
KR20220023591A (en) * 2020-08-21 2022-03-02 최종명 Soldering inspection equipment and soldering inspection method using the same

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