JPH0198250A - Resin-sealed semiconductor device - Google Patents

Resin-sealed semiconductor device

Info

Publication number
JPH0198250A
JPH0198250A JP25680287A JP25680287A JPH0198250A JP H0198250 A JPH0198250 A JP H0198250A JP 25680287 A JP25680287 A JP 25680287A JP 25680287 A JP25680287 A JP 25680287A JP H0198250 A JPH0198250 A JP H0198250A
Authority
JP
Japan
Prior art keywords
lead
resin
section
chip
collector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25680287A
Other languages
Japanese (ja)
Inventor
Yoshiaki Sano
義昭 佐野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP25680287A priority Critical patent/JPH0198250A/en
Publication of JPH0198250A publication Critical patent/JPH0198250A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To prevent a short-circuit accident at the end section of a collector lead completely by sealing an insulating supporter, a chip loading section and a semiconductor chip into a resin molded form and positioning the underside of the chip loading section at a fixed distance from the underside of the resin molded form by the insulating supporter. CONSTITUTION:A base lead, an emitter and an external leading-out section 1B for a collector lead 1 are positioned onto the edge section of a recessed section 21 in a molding bottom force 20A in a lead frame 19 to which a chip 3 is loaded and wire bonding is completed, and the lead frame is placed onto the molding bottom force so that a chip loading section 1A for the collector lead 1, a collector lead nose section 1C1, to which an insulating supporter 13 is fixed, and the base lead and a wire bonding section for the emitter are positioned onto the recessed section 21. A molding top force 20B is lowered, and a resin is injected into a cavity section shaped between the molding bottom force 20A and the molding top force 20B and the chip 3 is molded with a resin. The sides of the nose sections 1C1 and 1C2 of the collector lead 1 are supported in required height by the insulating supporter 12.

Description

【発明の詳細な説明】 〔概 要〕 樹脂封止半導体装置、特に絶縁型の高電圧高出力樹脂モ
ールドトランジスタの構造に関し、絶縁型高電圧高出力
樹脂モールドトランジスタにおいて、高電圧が印加され
るコレクタリードの通電リードとして機能しない側の端
部が樹脂成形体の内部に封入され、該コレクタリード端
部における短絡事故を完全に防止した構造を提供するこ
とを目的とし、 半導体チップが搭載されるチップ搭載部と、該チップ搭
載部の一方の側に接続された外部導出部とを有するリー
ドと、該チップ搭載部の反対側端部に固着された絶縁支
持体とを備え、該絶縁支持体、チップ搭載部及び半導体
チップが樹脂成形体内に封入され、該絶縁支持体により
、該チップ搭載部の下面が該樹脂成形体の下面から所定
の距離隔てて位置せしめられてなる構成を有する。
[Detailed Description of the Invention] [Summary] Regarding the structure of a resin-sealed semiconductor device, particularly an insulated high-voltage, high-output resin-molded transistor, a collector to which a high voltage is applied in an insulated-type high-voltage, high-output resin-molded transistor. A chip on which a semiconductor chip is mounted, with the purpose of providing a structure in which the end of the lead that does not function as a current-carrying lead is sealed inside a resin molding, completely preventing short-circuit accidents at the end of the collector lead. A lead having a mounting part and an external lead-out part connected to one side of the chip mounting part, and an insulating support fixed to the opposite end of the chip mounting part, the insulating support; The chip mounting part and the semiconductor chip are enclosed in a resin molded body, and the lower surface of the chip mounting part is positioned a predetermined distance from the lower surface of the resin molded body by the insulating support.

〔産業上の利用分野〕[Industrial application field]

本発明は樹脂封止型半導体装置、特に絶縁型の高電圧高
出力樹脂モールドトランジスタの構造に関する。
The present invention relates to a resin-molded semiconductor device, and particularly to the structure of an insulated high-voltage, high-output resin-molded transistor.

絶縁型の高電圧高出力樹脂モールドトランジス夕は、高
電圧が印加されるコレクタリードにおけるチップ搭載部
の下面がモールド樹脂によって所要の厚さに覆われるこ
とによって、8亥コレクタリ一ド下面と該トランジスタ
が固定される放熱フィン等との間の高絶縁耐圧が保たれ
る構造を有しているが、コレクタリードの通電リードと
して機能しない側の切断端面がリード導出面に対向する
樹脂成形体の側面に表出した構造を有するために、該コ
レクタリード切断端面への導電性異物の接触、付着、或
いは該端面からの放電等によって該コレクタリードと隣
接部品との間に短絡を生じて素子性能が劣化するという
問題があり、改善が望まれている。
Insulated high voltage, high output resin molded transistors are manufactured by covering the lower surface of the chip mounting portion of the collector lead to which a high voltage is applied to a required thickness with molding resin, thereby creating a bond between the lower surface of the collector lead and the transistor. The side surface of the resin molded body has a structure that maintains high dielectric strength between it and the heat dissipation fins, etc. to which the collector lead is fixed, but the cut end surface of the side that does not function as a current-carrying lead of the collector lead faces the lead extraction surface. Due to the exposed structure, contact or adhesion of conductive foreign matter to the cut end surface of the collector lead, or discharge from the end surface may cause a short circuit between the collector lead and adjacent components, resulting in poor device performance. There is a problem of deterioration, and improvements are desired.

〔従来の技術〕[Conventional technology]

第6図は従来の絶縁型高電圧高出力樹脂モールドトラン
ジスタを模式的に示す透視平面図(al及びそのA−A
断面図(blである。
FIG. 6 is a perspective plan view (al and its A-A
Cross-sectional view (bl).

図において、51はコレクタリード、51Aは放熱効果
のために特に厚く形成されたコレクタリードのチップ搭
載部、51Bはコレクタリードの外部導出部、51C1
51C2はコレクタリードの先端部、51D+、51D
2はコレクタリードの切断端面、52はチップ固着用の
半田、53はトランジスタチップ、54はベースリード
、55はエミッタリード、56はベース電極、57はエ
ミッタ電極、58及び59はボンディングワイヤ、60
は樹脂成形体、60Aは0.4〜0.5鶴程度の所要の
絶縁耐圧を確保する厚さを有する樹脂成形体層を示す。
In the figure, 51 is a collector lead, 51A is a chip mounting part of the collector lead formed particularly thick for heat dissipation effect, 51B is an external lead-out part of the collector lead, and 51C1
51C2 is the tip of the collector lead, 51D+, 51D
2 is a cut end surface of a collector lead, 52 is solder for chip fixation, 53 is a transistor chip, 54 is a base lead, 55 is an emitter lead, 56 is a base electrode, 57 is an emitter electrode, 58 and 59 are bonding wires, 60
60A indicates a resin molded body, and 60A indicates a resin molded body layer having a thickness that ensures a required dielectric strength of about 0.4 to 0.5 mm.

同図に示されるように絶縁型高電圧高出力樹脂モールド
トランジスタにおいては、放熱効果のために特に厚く 
(2〜311程度)形成されたコレクタリード51のチ
ップ搭載部51への下面がモールド樹脂の成形体60中
に埋込まれ、該樹脂成形体60の下面と上記コレクタリ
ードのチップ搭載部51Aの下面との間に、高電圧が印
加される該コレクタリード51と該高電圧高出力樹脂モ
ールドトランジスタが直に固定される放熱フィンとの間
の高絶縁性を確保するための、0.4〜0.5mm程度
の厚さのモールド樹脂成形体層60Aが介在せしめられ
た構造を有することを特徴としているが、上記第6図に
示す従来の構造においては、これを形成するに際して、
第7図の模式平面図(al及びそのA−A断面図(b)
に示すようなモールド方法が用いられる。
As shown in the figure, insulated high-voltage, high-output resin-molded transistors are particularly thick for heat dissipation.
(about 2 to 311) The lower surface of the formed collector lead 51 to the chip mounting portion 51 is embedded in the molded resin molded body 60, and the lower surface of the resin molded body 60 and the chip mounting portion 51A of the collector lead are 0.4 to 0.4 to ensure high insulation between the collector lead 51 to which a high voltage is applied and the radiation fin to which the high voltage and high output resin molded transistor is directly fixed. It is characterized by having a structure in which a molded resin molded body layer 60A with a thickness of about 0.5 mm is interposed, but in the conventional structure shown in FIG. 6 above, when forming this,
Schematic plan view of Fig. 7 (al and its A-A sectional view (b)
A molding method as shown in is used.

即ちモールド下型61A上に、半導体チップ52が搭載
され第6図同様のワイヤボンディングが終わったリード
フレーム62を、コレクタリード51のチップ搭載部5
1A及び、ベースリード54とエミッタリード55のボ
ンディングワイヤ接続部が該モールド下型61Aの凹部
63上に位置せしめて載置し、部63の底面から例えば
0.4〜0,5 vnaの所要の高さ(h)になるよう
に、該リードフレームのベースリード54、エミッタリ
ード55、コレクタリードの導出部51B及びコレクタ
リードの先端部51Cい51C2の延長部によって該モ
ールド下型61Aの上面を介して支持しモールド成形が
行われる。図中、61Bはモールド上型を示す。
That is, the lead frame 62 on which the semiconductor chip 52 is mounted and wire bonding similar to that shown in FIG.
1A and the bonding wire connecting portion between the base lead 54 and the emitter lead 55 are positioned and placed on the recess 63 of the lower mold 61A, and the required distance of, for example, 0.4 to 0.5 vna from the bottom surface of the portion 63 is placed. The base lead 54 of the lead frame, the emitter lead 55, the collector lead lead-out part 51B, and the extension part of the collector lead tip 51C and 51C2 pass through the upper surface of the lower mold 61A so that the height (h) is reached. It is then supported and molded. In the figure, 61B indicates the upper mold.

そして、モールド完了後、樹脂成形体60の外部に延在
している製品となってからの機能を持たないコレクタリ
ード51の先端部51C+、51C2の延長部を、該コ
レクタリード先端部51C+151cz側の樹脂成形体
側面に沿って切断することによって、従来の絶縁型高電
圧高出力モールドトランジスタは完成されていた。
After the molding is completed, the extended portions of the tip portions 51C+ and 51C2 of the collector lead 51, which extend outside the resin molded body 60 and have no function since the product becomes a product, are connected to the collector lead tip portion 51C+151cz side. Conventional insulated high-voltage, high-output molded transistors were completed by cutting along the sides of the resin molding.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記のように従来の絶縁型高電圧高出力樹脂モールドト
ランジスタでは、モールド完了後に、モールド時にリー
ドフレームの支持に用いられたコレクタリード先端部5
1Cい51C2の切断がなされるので、樹脂成形体60
のリード導出面と対向する側面にコレクタリード51の
切断端面510い51D2が表出する構造を有していた
As mentioned above, in the conventional insulated high-voltage, high-output resin-molded transistor, after molding is completed, the collector lead tip 5, which was used to support the lead frame during molding,
Since 1C and 51C2 cuts are made, the resin molded body 60
It had a structure in which the cut end surfaces 510 and 51D2 of the collector leads 51 were exposed on the side surface facing the lead lead-out surface.

しかし該絶縁型高電圧高出力モールドトランジスタにお
いては、コレクタリード51に1000 V以上の高電
圧が印加されるので、上記従来構造のように樹脂成形体
60の側面にコレクタリード51の切断端面510い5
1D2が表出する場合には、放電や導電性異物の接触、
付着等によって、該トランジスタが固定される放熱フィ
ンや高密度に配置される他の電子部品等との短絡を生じ
、該トランジスタの性能が損なわれるという問題を生ず
る。
However, in the insulated high-voltage, high-output molded transistor, a high voltage of 1000 V or more is applied to the collector lead 51, so the cut end surface 510 of the collector lead 51 is placed on the side surface of the resin molded body 60 as in the conventional structure. 5
When 1D2 appears, discharge or contact with a conductive foreign object,
Due to such adhesion, a short circuit occurs with the heat dissipation fin to which the transistor is fixed and other electronic components arranged in high density, resulting in a problem that the performance of the transistor is impaired.

そこで本発明は、絶縁型高電圧高出力樹脂モールドトラ
ンジスタにおいて、高電圧が印加されるコレクタリード
の通電リードとして機能しない側の端部が樹脂成形体の
内部に埋込まれ、該コレクタリード端部における短絡事
故を完全に防止した構造を提供することを目的とする。
Accordingly, the present invention provides an insulated high-voltage, high-output resin-molded transistor in which the end of the collector lead to which a high voltage is applied, on the side that does not function as a current-carrying lead, is embedded inside a resin molding, and the collector lead end The purpose is to provide a structure that completely prevents short-circuit accidents.

〔問題点を解決するための手段〕[Means for solving problems]

上記問題点は、半導体チップが搭載されるチップ搭載部
と、該チップ搭載部の一方の側に接続された外部導出部
とを有するリードと、該チップ搭載部の反対側端部に固
着された絶縁支持体とを備え、該絶縁支持体、チップ搭
載部及び半導体チップが樹脂成形体内に封入され、該絶
縁支持体により、該チップ搭載部の下面が該樹脂成形体
の下面から所定の距離隔てて位置せしめられてなる本発
明による樹脂封止半導体装置により解決される。
The above problem is caused by a lead having a chip mounting part on which a semiconductor chip is mounted, an external lead-out part connected to one side of the chip mounting part, and a lead fixed to the opposite end of the chip mounting part. an insulating support body, the insulating support body, the chip mounting part, and the semiconductor chip are encapsulated in a resin molded body, and the bottom surface of the chip mounting part is spaced a predetermined distance from the bottom surface of the resin molded body by the insulating support body. This problem is solved by the resin-sealed semiconductor device according to the present invention, which is located in the resin-sealed semiconductor device.

〔作 用〕[For production]

即ち本発明においては、コレクタリードの通電リードと
して用いられない側の端部を、該端部が向かう樹脂成形
体の側面から所要の深さに没するように短く切断し一該
端部に、チップ溶着の温度に耐え得る程度の耐熱性を有
し、且つ該コレクタリードの厚(形成されたチップ搭載
部の下面を樹脂成形体の下面を規定する樹脂成形型の凹
部の底面から所要の距離隔たった位置に保持し得る外形
を有する絶縁支持体を固着し、これによって樹脂成形に
際して上記コレクタリード□のチップ搭載部の下部領域
における所要の絶縁耐圧及び熱伝導率を有する所要の樹
脂厚を確保する。
That is, in the present invention, the end of the collector lead that is not used as the current-carrying lead is cut short so that it is sunk to a required depth from the side surface of the resin molded body toward which the end is directed, and then It has heat resistance to the extent that it can withstand the temperature of chip welding, and the thickness of the collector lead (the required distance from the bottom surface of the recess of the resin mold that defines the bottom surface of the formed chip mounting part to the bottom surface of the resin molded body). An insulating support having an external shape that can be held at a separate position is fixed, thereby ensuring the required resin thickness with the required dielectric strength voltage and thermal conductivity in the lower region of the chip mounting portion of the collector lead □ during resin molding. do.

かくて前記コレクタリードの端部を該端部が向かう樹脂
成形体の側面から所要の深さに埋没せしめて樹脂成形す
ることが可能になり、従来該コレクタリードの端部にお
いて発生していた短絡障害は完全に防止される。
In this way, it becomes possible to mold the collector lead by burying the end of the collector lead to a required depth from the side of the resin molded body toward which the end faces, thereby eliminating the short circuit that conventionally occurred at the end of the collector lead. Failure is completely prevented.

〔実施例〕〔Example〕

以下本発明を、図示実施例により具体的に説明する。 The present invention will be specifically explained below with reference to illustrated embodiments.

第1図は本発明の一実施例を模式的に示す透視平面図(
a)及びそのA−A断面図(b)、第2図は本発明の一
実施例における絶縁支持体を模式的に示す平面図(al
及び側断面図(b)、第3図は本発明の一実施例におけ
るリードフレームを模式的に示す平面図(a)及びA−
A断面図(b)、第4図は本発明の一実施例における絶
縁支持体の固着方法を示す模式側断面図、第5図は本発
明の一実施例における樹′脂モールドの方法を示す模式
側断面図である。
FIG. 1 is a perspective plan view schematically showing an embodiment of the present invention (
a), its A-A sectional view (b), and FIG. 2 are plan views (al
and a side sectional view (b), and FIG. 3 is a plan view (a) and A-
A sectional view (b), FIG. 4 is a schematic side sectional view showing a method of fixing an insulating support in an embodiment of the present invention, and FIG. 5 shows a method of resin molding in an embodiment of the present invention. It is a schematic side sectional view.

全図を通じ同一対象物は同一符合で示す。Identical objects are indicated by the same reference numerals throughout the figures.

本発明に係る絶縁型高電圧高出力樹脂モールドトランジ
スタの一実施例を示す第1図(a)、fb)において、
1はコレクタリード、IAはトランジスタチップの放熱
をよくするために特に2〜3n程度に厚く形成されたコ
レクタリードのチップ搭載部、IBはコレクタリードの
外部導出部、IC1、IC2はコレクタリードの切断端
面ID+及びIDzがリード導出面に対向する樹脂成形
体の側面から100OV程度の所要の絶縁耐圧が確保で
きる0、4〜0.51程度の所定の距離後退する長さに
切断された通電に機能しないコレクタリードの先端部、
2はチップ固着用半田、3はトランジスタチップ、4は
ベースリード、5はエミッタリード、6はベース電極、
7はエミッタ電極、8及び9はボンディング・ワイヤ、
10は樹脂成形体、IOAは所要の絶縁耐圧及び熱伝導
率が得られる0、4〜0.5+n程度の所要厚さ(tl
)を有する樹脂成形層、11はコレクタリード先端部が
該先端部を覆う樹脂成形体の厚さ(t2)のほぼ中心部
にくるようにしたコレクタリード先端の折り曲げ部、1
2は絶縁支持体を示す。
In FIGS. 1(a) and 1(fb) showing an embodiment of an insulated high voltage high output resin molded transistor according to the present invention,
1 is the collector lead, IA is the chip mounting part of the collector lead, which is especially thick to about 2 to 3 nm in order to improve heat dissipation of the transistor chip, IB is the external lead-out part of the collector lead, and IC1 and IC2 are the cutting parts of the collector lead. Functions for energization when the end faces ID+ and IDz are cut to a length set back a predetermined distance of about 0.4 to 0.51 to ensure the required dielectric strength voltage of about 100 OV from the side of the resin molded body facing the lead lead-out surface. The tip of the collector lead that does not
2 is a solder for fixing the chip, 3 is a transistor chip, 4 is a base lead, 5 is an emitter lead, 6 is a base electrode,
7 is an emitter electrode, 8 and 9 are bonding wires,
10 is a resin molded body, IOA is a required thickness of about 0, 4 to 0.5+n (tl
); 11 is a bent portion of the tip of the collector lead such that the tip of the collector lead is located approximately at the center of the thickness (t2) of the resin molded body covering the tip; 1;
2 indicates an insulating support.

コレクタリード1の先端部IC+ 、ICzが折り曲げ
られた上記一実施例における絶縁支持体12は、例えば
第2図(a)、(blに示すように、コレクタリード先
端部IC+ 、ICzを覆う樹脂成形体の厚さ(t2)
よりもモールドに際しての余裕寸法に相当する例えば(
1,05mm程度のごく僅かな寸法だけ小さい外形を有
する厚さQ 、4 **程度の銅リング13内に、ガラ
ス扮をシンターして形成され中心部にリード挿入孔14
を有するガラスタブレット15が圧入された構造を存す
る。なお銅リングを用いたのはモールド樹脂との密着性
がよいためである。
The insulating support 12 in the above embodiment in which the tip portions IC+ and ICz of the collector lead 1 are bent is, for example, a resin molded material that covers the tip portions IC+ and ICz of the collector lead 1, as shown in FIGS. 2(a) and (bl). Body thickness (t2)
For example, (
A lead insertion hole 14 is formed by sintering glass material inside a copper ring 13 with a thickness of Q, 4**, which has a very small outer diameter of about 1.05 mm, and has a lead insertion hole 14 in the center.
It has a structure in which a glass tablet 15 having a shape is press-fitted. Note that the copper ring was used because it has good adhesion to the mold resin.

また上記実施例におけるリードフレームは、例えば第3
図(al、(blに示すように、コレクタリード1が片
側の外部16によって片持ちされた構造となり、該コレ
クタリード1の先端部IC+ 、IC2が樹脂成形体の
内部に前述した所要の深さに埋没するように短く切断さ
れ、且つ前述したように該先端部IC+ 、1C2が該
部分を覆う樹脂成形体の厚さの中心位置に位置するよう
に折り曲げられたコレクタリード1の先端部IC+ 、
ICzに例えば上記第2図に示す構成を有する絶縁支持
体12が固着された構造に形成される。なお同図におい
て17は後に切断除去される中桟を示す。
Further, the lead frame in the above embodiment is, for example, a third
As shown in Figures (al and bl), the collector lead 1 has a structure in which it is cantilevered by the exterior 16 on one side. The tip part IC+ of the collector lead 1 is cut short so as to be buried in the collector lead 1, and is bent so that the tip part IC+, 1C2 is located at the center of the thickness of the resin molded body covering the part, as described above.
The insulating support 12 having the structure shown in FIG. 2, for example, is fixed to the ICz. In addition, in the figure, 17 indicates a middle crosspiece which will be cut and removed later.

上記リードフレームのコレクタリードの先端部IC+ 
、ICzへの上記絶縁支持体12の固着は、例えば第4
図に示すように、カーボン発熱体18の上に該発熱体1
8面の凹部を介して所定の間隔で向きを揃えて並置し、
これらの絶縁支持体12のリード挿入孔14に例えばI
O連程度の連続したリードフレームにおける各コレクタ
リード1の先端部IC+、ICzをそれぞれ挿入し、上
記カーボン発熱体18によって、例えば400〜500
℃程度に加熱しガラスタブレット15を溶融することに
よって、該リードフレームにチップを搭載する以前に簡
単って行われる。
The tip of the collector lead of the above lead frame IC+
, the fixation of the insulating support 12 to the ICz is performed, for example, by the fourth
As shown in the figure, the heating element 1 is placed on the carbon heating element 18.
Arranged in parallel with the same orientation at a predetermined interval through the recesses on 8 sides,
For example, I
The tips IC+ and ICz of each collector lead 1 in a continuous lead frame of approximately O series are inserted, and the carbon heating element 18 is heated to a temperature of 400 to 500, for example.
This can be easily done by heating the glass tablet 15 to about .degree. C. and melting it before mounting the chip on the lead frame.

本発明の一実施例に示す絶縁型高電圧高出力樹脂モール
ドトランジスタは、上記構造のリードフレームを用い、
第1図に参照されるように、鉛半田等よりなるチップ固
着用半田2により該リードフレームのコレクタリード1
のチップ搭載部IA上にトランジスタチップ3を固着し
、該トランジスタチップ3のベース電極6及びエミッタ
電極7と該リードフレームのベースリード4及びエミッ
タリード5とがそれぞれボンディング・ワイヤ8若しく
は9によってそれぞれ接続された後、樹脂モールドがな
される。
An insulated high voltage high output resin molded transistor shown in an embodiment of the present invention uses a lead frame having the above structure,
As shown in FIG. 1, the collector lead 1 of the lead frame is connected to the chip fixing solder 2 made of lead solder or the like.
A transistor chip 3 is fixed on the chip mounting part IA of the transistor chip 3, and the base electrode 6 and emitter electrode 7 of the transistor chip 3 are connected to the base lead 4 and emitter lead 5 of the lead frame by bonding wires 8 and 9, respectively. After that, a resin mold is made.

第5図は該−実施例における樹脂モールドの方法を示し
た図である。
FIG. 5 is a diagram showing the method of resin molding in this embodiment.

同図に示されるようにチップ搭載が終わり、図示されな
いワイヤボンディングの完了したリードフレーム19は
、モールド下型20^の凹部21のti郡部上図示され
ないベースリード、エミッタ及びコレクタリード1の外
部導出部IBが位置し、且つ該凹部21上にコレクタリ
ード1のチップ搭載部1^及び、絶縁支持体12が固着
されたコレクタリード先端部IC8、及び図示されない
ベースリード及びエミッタのワイヤボンディング部が位
置するようにモールド下型上に載置し、モールド上型2
0Bを下降し、モールド下型20Aとモールド上型20
Bとの間に形成される空洞部に樹脂が注入されて樹脂モ
ールドがなされる。
As shown in the figure, the lead frame 19 on which chip mounting has been completed and wire bonding (not shown) has been completed is placed above the ti group of the concave portion 21 of the lower mold 20^ and at the external lead-out portions of the base lead, emitter, and collector lead 1 (not shown). IB is located, and the chip mounting part 1^ of the collector lead 1, the collector lead tip IC8 to which the insulating support 12 is fixed, and the wire bonding parts of the base lead and emitter (not shown) are located on the recess 21. Place the mold on the lower mold as shown, and then place the upper mold 2
Descend 0B, mold lower mold 20A and mold upper mold 20
Resin is injected into the cavity formed between B and B to form a resin mold.

ここで咳実施例においてはリードフレームの一側面側は
図示されないベースリード及びエミッタリードの外部導
出部及びコレクタリード1の外部導出部IBによって支
持され、コレクタリード1の先端部IC,及び図示され
ないIC,の側は前記絶縁支持体12によって所要の高
さに支持され、これによってコレクタリード1のチップ
搭載部IAの下面とモールド下型2OAの凹部21の底
面との距離は、該コレクタリード1のチップ搭載部IA
下部に設けようとする例えば0.4〜0.5fl程度の
成形樹脂層の厚さに相当する所定の寸法に保持されて、
樹脂モールドがなされる。これによってコレクタリード
lのチップ搭載部IAの下面を覆う成形樹脂層の厚さは
所要の均一な厚さに形成される。
In the cough embodiment, one side of the lead frame is supported by the external lead-out portions of the base lead and emitter lead (not shown) and the external lead-out portion IB of the collector lead 1, and the tip IC of the collector lead 1 and the IC (not shown). , are supported at a required height by the insulating support 12, so that the distance between the bottom surface of the chip mounting portion IA of the collector lead 1 and the bottom surface of the recess 21 of the lower mold 2OA is the same as that of the collector lead 1. Chip mounting part IA
It is maintained at a predetermined dimension corresponding to the thickness of the molded resin layer of, for example, about 0.4 to 0.5 fl to be provided at the bottom,
A resin mold is made. As a result, the thickness of the molded resin layer covering the lower surface of the chip mounting portion IA of the collector lead l is formed to a required uniform thickness.

またコレクタリード1の絶縁支持体12が固着されてい
る先端部IC+ 、ICzは前述のように、予め樹脂成
形体における該リード先端部IC+ 、IC2が向かう
側面から0.4〜0.5龍程度の絶縁耐圧を確保するの
に必要な所要の距離後退するような長さに切断されてい
るので、該絶縁支持体12が固着されているコレクタリ
ード先端部IC+ 、ICgはモールド下型凹部19の
該コレクタリード先端部IC+、lc2が向かう側面か
ら前記所要の距離後退した場所に位置し、上記樹脂モー
ルドに際して該コレクタリードの先端部IC+等の端面
 IDz等の上部は前記所要厚さの成形樹脂層によって
覆われる。
Further, as described above, the tip ends IC+ and ICz of the collector lead 1 to which the insulating support 12 is fixed are approximately 0.4 to 0.5 times away from the side face of the lead tips IC+ and IC2 in the resin molded body. Since the collector lead tips IC+ and ICg to which the insulating support 12 is fixed are cut to a length that is set back the required distance to ensure the dielectric strength of the insulating support 12, It is located at a place set back the required distance from the side surface toward which the collector lead tips IC+ and lc2 face, and when molded with the resin, the upper part of the end face IDz, etc. of the collector lead tip IC+ is formed into a molded resin layer of the required thickness. covered by.

従って該コレクタリードlの先端面IDI、ID2にお
ける放電、導電性異物付着による短絡事故は完全に防止
される。
Therefore, short-circuit accidents caused by electrical discharge and adhesion of conductive foreign matter at the tip surfaces IDI and ID2 of the collector leads 1 are completely prevented.

上記実施例においては、コレクタリードの先端部を、該
先端部を覆う樹脂成形体の厚さの中心位置になるように
折り曲げたが、該リード先端部は折り曲げないでも勿論
さしつかえない。但しこの場合には前記ガラスタブレッ
トのリード挿入孔は該タブレットの中心から上方に所要
の距離ずれた位置に形成する必要がある。
In the above embodiment, the tip of the collector lead was bent to be at the center of the thickness of the resin molded body covering the tip, but the tip of the lead may of course not be bent. However, in this case, the lead insertion hole of the glass tablet needs to be formed at a position shifted upward by a required distance from the center of the tablet.

また第2図に示された構造の絶縁支持体に用いる絶縁物
質は前記ガラスタブレットに限らず、°ジアリルフタレ
ート或いはシリコーン等の耐熱性樹脂タブレットを使用
してもよい。
Furthermore, the insulating material used for the insulating support having the structure shown in FIG. 2 is not limited to the above-mentioned glass tablets, but heat-resistant resin tablets such as diallyl phthalate or silicone may also be used.

更にまた絶縁支持体は前記銅等の金属リングを用いずに
、上記耐熱樹脂のみよりなる成形体であってもよい。
Furthermore, the insulating support may be a molded body made only of the heat-resistant resin without using the copper or other metal ring.

〔発明の効果〕〔Effect of the invention〕

以上説明のように、本発明によれば絶縁型高電圧高出力
樹脂モールドトランジスタにおいて、樹脂成形体におけ
るコレクタリードのチップ搭載部の下部領域の樹脂厚を
所要の絶縁耐圧及び所要の熱伝導性が得られる所要厚さ
に維持し、且つ該樹脂成形体のリード導出面に対向する
側面にコレクタリードの切断端面を表出させず且つ所要
の絶縁耐圧が得られる所要厚さの樹脂で覆った状態で樹
脂成形を行うことができる。
As explained above, according to the present invention, in an insulated high-voltage, high-output resin-molded transistor, the resin thickness of the lower region of the chip mounting portion of the collector lead in the resin molded body is adjusted to the required dielectric strength voltage and required thermal conductivity. A state in which the resin molded body is covered with a resin of a required thickness that maintains the required thickness, does not expose the cut end surface of the collector lead on the side opposite to the lead lead-out surface, and provides the required dielectric strength. Resin molding can be done with.

従って放電、導電性異物の付着等によって生じていたコ
レクタリード切断端面倒の短絡事故は完全に防止され、
該絶縁型高電圧高出力樹脂モールドトランジスタの性能
が確保される。
Therefore, short-circuit accidents at the cut end of the collector lead, which were caused by discharge, adhesion of conductive foreign matter, etc., are completely prevented.
The performance of the insulated high voltage, high output resin molded transistor is ensured.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の模式図、 第2図は本発明の一実施例における絶縁支持体の模式図
、 第3図は本発明の一実施例におけるリードフレームの模
式図、 第4図は本発明の一実施例における絶縁支持体の固着方
法を示す模式側断面図、 第5図は本発明の一実施例における樹脂モールドの方法
を示す模式側断面図 第6図は従来構造の模式図、 第7図は従来構造の樹脂モールドの方法を示す模式図 である。 図において、 ■はコレクタリード、 IAはコレクタリードのチップ搭載部、1Bはコレクタ
リードの外部導出部、 IC+ 、ICzはコレクタリードの先端部、2はチッ
プ固着用半田、 3はトランジスタチップ・ 4はベースリード、 5はエミッタリード、 6はベース電極、 7はエミッタ電極、 8.9はボンディング・ワイヤ、 10は樹脂成形体、 11は折り曲げ部、 12は絶縁支持体 を示す。 (’0)A−A鶴叫閲 α 平耐閾        b、A則断茜閃Aく有−間
の一系加4グ圭−ゎけ3摩色才45支率1ルトの木逢べ
し1隼2 回 Cb)A−A断誼酊 撫可の−9<5屓辷Aグ°11二b1丁3リードフレー
ムθ挟べ2ゴ寮3 園 第5 園 (b)A−A訪@図 不ξ来構蚤L tr、橿べ、図 第6 聞
FIG. 1 is a schematic diagram of an embodiment of the present invention; FIG. 2 is a schematic diagram of an insulating support in an embodiment of the present invention; FIG. 3 is a schematic diagram of a lead frame in an embodiment of the present invention; Fig. 4 is a schematic side sectional view showing a method of fixing an insulating support in an embodiment of the present invention, Fig. 5 is a schematic side sectional view showing a method of resin molding in an embodiment of the invention, and Fig. 6 is a conventional structure. FIG. 7 is a schematic diagram showing a method of resin molding of a conventional structure. In the figure, ■ is the collector lead, IA is the chip mounting part of the collector lead, 1B is the external lead-out part of the collector lead, IC+, ICz are the tips of the collector leads, 2 is the solder for fixing the chip, 3 is the transistor chip, and 4 is the transistor chip. A base lead, 5 an emitter lead, 6 a base electrode, 7 an emitter electrode, 8.9 a bonding wire, 10 a resin molded body, 11 a bent portion, and 12 an insulating support. ('0) A-A crane cry review α average tolerance threshold b, A-law breaking Akane flash A-Kuai-ma's one-line addition 4-g Kei-ke 3 maki-sai 45 branch rate 1 Ruto's wood meeting 1 Hayabusa 2 times Cb) A-A cut off -9 < 5 A g ° 11 2 b 1 cho 3 lead frame θ sandwiched 2 Go dormitory 3 Garden 5 Garden (b) A-A visit @ diagram No. 6 of the 6th edition

Claims (1)

【特許請求の範囲】  半導体チップが搭載されるチップ搭載部と、該チップ
搭載部の一方の側に接続された外部導出部とを有するリ
ードと、該チップ搭載部の反対側端部に固着された絶縁
支持体とを備え、 該絶縁支持体、チップ搭載部及び半導体チップが樹脂成
形体内に封入され、 該絶縁支持体により、該チップ搭載部の下面が該樹脂成
形体の下面から所定の距離隔てて位置せしめられてなる
ことを特徴とする樹脂封止半導体装置。
[Claims] A lead having a chip mounting part on which a semiconductor chip is mounted, an external lead-out part connected to one side of the chip mounting part, and a lead fixed to the opposite end of the chip mounting part. an insulating support, the insulating support, the chip mounting part, and the semiconductor chip are encapsulated in a resin molded body, and the insulating support keeps the lower surface of the chip mounting part a predetermined distance from the lower surface of the resin molded body. 1. A resin-sealed semiconductor device characterized in that the semiconductor devices are separated from each other.
JP25680287A 1987-10-12 1987-10-12 Resin-sealed semiconductor device Pending JPH0198250A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25680287A JPH0198250A (en) 1987-10-12 1987-10-12 Resin-sealed semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25680287A JPH0198250A (en) 1987-10-12 1987-10-12 Resin-sealed semiconductor device

Publications (1)

Publication Number Publication Date
JPH0198250A true JPH0198250A (en) 1989-04-17

Family

ID=17297643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25680287A Pending JPH0198250A (en) 1987-10-12 1987-10-12 Resin-sealed semiconductor device

Country Status (1)

Country Link
JP (1) JPH0198250A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998002920A1 (en) * 1996-07-16 1998-01-22 Siemens Aktiengesellschaft Semiconductor module

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998002920A1 (en) * 1996-07-16 1998-01-22 Siemens Aktiengesellschaft Semiconductor module

Similar Documents

Publication Publication Date Title
JP5241177B2 (en) Semiconductor device and manufacturing method of semiconductor device
JPH02121356A (en) Automatic-positioning electronic device
TW200522328A (en) Semiconductor device and manufacturing method thereof
US7091603B2 (en) Semiconductor device
CN102693953A (en) Semiconductor apparatus and method for manufacturing the same
JP2005167075A (en) Semiconductor device
CN104916614A (en) Semiconductor device and method of manufacturing the same
JP5826234B2 (en) Semiconductor device and manufacturing method of semiconductor device
JP5895549B2 (en) Semiconductor device and manufacturing method thereof
US4910581A (en) Internally molded isolated package
JPH0198250A (en) Resin-sealed semiconductor device
JPS6132434A (en) Manufacture of resin molded semiconductor device
JPH0254665B2 (en)
JP7422945B2 (en) Power semiconductor equipment
JP3234614B2 (en) Semiconductor device and manufacturing method thereof
JPH0244147B2 (en)
JP4277168B2 (en) Resin-sealed semiconductor device and manufacturing method thereof
JP4055700B2 (en) Semiconductor device
JP4258391B2 (en) Semiconductor device
JPH0415942A (en) Semiconductor device
JPH0332048A (en) Semiconductor device
JPS6138193Y2 (en)
JPH05299453A (en) Manufacture of semiconductor device sealed with resin
JP2917928B2 (en) Method for manufacturing semiconductor device
JP2927246B2 (en) Resin-sealed circuit components