JPH0159521B2 - - Google Patents
Info
- Publication number
- JPH0159521B2 JPH0159521B2 JP1977479A JP1977479A JPH0159521B2 JP H0159521 B2 JPH0159521 B2 JP H0159521B2 JP 1977479 A JP1977479 A JP 1977479A JP 1977479 A JP1977479 A JP 1977479A JP H0159521 B2 JPH0159521 B2 JP H0159521B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- defect
- wafer
- pulse
- face plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP1977479A JPS55112502A (en) | 1979-02-23 | 1979-02-23 | Plate automatic examination unit | 
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP1977479A JPS55112502A (en) | 1979-02-23 | 1979-02-23 | Plate automatic examination unit | 
Publications (2)
| Publication Number | Publication Date | 
|---|---|
| JPS55112502A JPS55112502A (en) | 1980-08-30 | 
| JPH0159521B2 true JPH0159521B2 (OSRAM) | 1989-12-18 | 
Family
ID=12008674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP1977479A Granted JPS55112502A (en) | 1979-02-23 | 1979-02-23 | Plate automatic examination unit | 
Country Status (1)
| Country | Link | 
|---|---|
| JP (1) | JPS55112502A (OSRAM) | 
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| WO2021069982A1 (en) | 2019-10-07 | 2021-04-15 | Ricoh Company, Ltd. | Imaging optical system and camera | 
| EP3859421A1 (en) | 2020-01-29 | 2021-08-04 | Ricoh Company, Ltd. | Imaging lens and camera apparatus and mobile object | 
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS6013248A (ja) * | 1983-07-04 | 1985-01-23 | Koyo Jidoki Kk | レ−ザ光による被検査物表面の欠陥部と塵埃の判別方法 | 
| US4659220A (en) * | 1984-10-22 | 1987-04-21 | International Business Machines Corporation | Optical inspection system for semiconductor wafers | 
| JPS61278739A (ja) * | 1985-06-03 | 1986-12-09 | Hitachi Electronics Eng Co Ltd | 異物検査装置 | 
| JPS6211148A (ja) * | 1985-06-28 | 1987-01-20 | Hitachi Electronics Eng Co Ltd | 異物検査装置 | 
| JPS6275336A (ja) * | 1985-09-30 | 1987-04-07 | Hitachi Electronics Eng Co Ltd | 異物検査装置 | 
| US20040057044A1 (en) | 1994-12-08 | 2004-03-25 | Mehrdad Nikoonahad | Scanning system for inspecting anamolies on surfaces | 
| WO1997046865A1 (en) | 1996-06-04 | 1997-12-11 | Tencor Instruments | Optical scanning system for surface inspection | 
- 
        1979
        - 1979-02-23 JP JP1977479A patent/JPS55112502A/ja active Granted
 
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| WO2021069982A1 (en) | 2019-10-07 | 2021-04-15 | Ricoh Company, Ltd. | Imaging optical system and camera | 
| EP3859421A1 (en) | 2020-01-29 | 2021-08-04 | Ricoh Company, Ltd. | Imaging lens and camera apparatus and mobile object | 
Also Published As
| Publication number | Publication date | 
|---|---|
| JPS55112502A (en) | 1980-08-30 | 
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