JPH0158444B2 - - Google Patents

Info

Publication number
JPH0158444B2
JPH0158444B2 JP56109029A JP10902981A JPH0158444B2 JP H0158444 B2 JPH0158444 B2 JP H0158444B2 JP 56109029 A JP56109029 A JP 56109029A JP 10902981 A JP10902981 A JP 10902981A JP H0158444 B2 JPH0158444 B2 JP H0158444B2
Authority
JP
Japan
Prior art keywords
thickness
measured
point
plate
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56109029A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5810604A (ja
Inventor
Tatsuo Tsujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Toshiba Corp
Original Assignee
Toshiba Corp
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Kawasaki Steel Corp filed Critical Toshiba Corp
Priority to JP56109029A priority Critical patent/JPS5810604A/ja
Publication of JPS5810604A publication Critical patent/JPS5810604A/ja
Publication of JPH0158444B2 publication Critical patent/JPH0158444B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Control Of Metal Rolling (AREA)
JP56109029A 1981-07-13 1981-07-13 板厚測定装置 Granted JPS5810604A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56109029A JPS5810604A (ja) 1981-07-13 1981-07-13 板厚測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56109029A JPS5810604A (ja) 1981-07-13 1981-07-13 板厚測定装置

Publications (2)

Publication Number Publication Date
JPS5810604A JPS5810604A (ja) 1983-01-21
JPH0158444B2 true JPH0158444B2 (de) 1989-12-12

Family

ID=14499794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56109029A Granted JPS5810604A (ja) 1981-07-13 1981-07-13 板厚測定装置

Country Status (1)

Country Link
JP (1) JPS5810604A (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6161004A (ja) * 1984-08-31 1986-03-28 Rheon Autom Mach Co Ltd 食品材料の連続体の連続計量方法
JPS623605A (ja) * 1985-06-29 1987-01-09 Kobe Steel Ltd 圧延材の幅方向の形状認識方法
JPS6420406A (en) * 1987-07-15 1989-01-24 Nippon Metal Ind Automatic plate thickness measuring instrument for hot-rolled steel sheet
JPH0459114A (ja) * 1990-06-27 1992-02-26 Kawasaki Steel Corp 圧延機の板厚制御方法
JP2006170883A (ja) * 2004-12-17 2006-06-29 Toshiba Corp 厚さプロファイル測定装置
EP2527055A1 (de) 2011-05-25 2012-11-28 Siemens Aktiengesellschaft Verfahren sowie Vorrichtung zur Bestimmung einer Dicke eines Walzguts
CN109269423A (zh) * 2018-11-18 2019-01-25 湖南融灏实业有限公司 一种手机壳规格检测装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940569A (de) * 1972-08-19 1974-04-16
JPS51137441A (en) * 1975-05-10 1976-11-27 Heath Gloucester Ltd Radiation gauge for measuring outline of moving strip
JPS53101458A (en) * 1977-02-16 1978-09-04 Toshiba Corp Calibrating method for sectional thickness shape measuring apparatus of plate materials
JPS5467458A (en) * 1977-11-09 1979-05-30 Hitachi Ltd Mutual interference compensator for thickness meter

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940569A (de) * 1972-08-19 1974-04-16
JPS51137441A (en) * 1975-05-10 1976-11-27 Heath Gloucester Ltd Radiation gauge for measuring outline of moving strip
JPS53101458A (en) * 1977-02-16 1978-09-04 Toshiba Corp Calibrating method for sectional thickness shape measuring apparatus of plate materials
JPS5467458A (en) * 1977-11-09 1979-05-30 Hitachi Ltd Mutual interference compensator for thickness meter

Also Published As

Publication number Publication date
JPS5810604A (ja) 1983-01-21

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