JPH0152897B2 - - Google Patents
Info
- Publication number
- JPH0152897B2 JPH0152897B2 JP62131773A JP13177387A JPH0152897B2 JP H0152897 B2 JPH0152897 B2 JP H0152897B2 JP 62131773 A JP62131773 A JP 62131773A JP 13177387 A JP13177387 A JP 13177387A JP H0152897 B2 JPH0152897 B2 JP H0152897B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- light
- circular contour
- incident
- absence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 22
- 230000002093 peripheral effect Effects 0.000 claims description 13
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 163
- 230000007246 mechanism Effects 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 12
- 230000005855 radiation Effects 0.000 description 12
- 238000012545 processing Methods 0.000 description 11
- 238000012546 transfer Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000009966 trimming Methods 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
Landscapes
- Geophysics And Detection Of Objects (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62131773A JPS63299245A (ja) | 1987-05-29 | 1987-05-29 | ウエハ存否検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62131773A JPS63299245A (ja) | 1987-05-29 | 1987-05-29 | ウエハ存否検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63299245A JPS63299245A (ja) | 1988-12-06 |
JPH0152897B2 true JPH0152897B2 (enrdf_load_stackoverflow) | 1989-11-10 |
Family
ID=15065816
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62131773A Granted JPS63299245A (ja) | 1987-05-29 | 1987-05-29 | ウエハ存否検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63299245A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3456930B2 (ja) | 1999-07-16 | 2003-10-14 | サンクス株式会社 | 板状部材検出装置 |
JP2002098586A (ja) * | 2000-09-27 | 2002-04-05 | Sunx Ltd | 反射型センサ |
-
1987
- 1987-05-29 JP JP62131773A patent/JPS63299245A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS63299245A (ja) | 1988-12-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6053983A (en) | Wafer for carrying semiconductor wafers and method detecting wafers on carrier | |
US4458152A (en) | Precision specular proximity detector and article handing apparatus employing same | |
US6532403B2 (en) | Robot alignment system and method | |
JP2000314611A (ja) | 物体位置決定システム | |
JPH07115773B2 (ja) | 基板搬送装置 | |
US20100034621A1 (en) | End effector to substrate offset detection and correction | |
JPH0147721B2 (enrdf_load_stackoverflow) | ||
US6900451B2 (en) | Mapping sensor system for detecting positions of flat objects | |
US4786816A (en) | Wafer detecting device wherein light receiver has an effective surface larger than the dimensional range covering all the wafers being detected | |
US6943364B2 (en) | Multi-functioned wafer aligner | |
JPH0447976B2 (enrdf_load_stackoverflow) | ||
KR970018342A (ko) | 매거진의 매거진 선반들을 위한 인덱서 및 그안에 내장된 웨이퍼형상으로 된 대상물 | |
JPH04127585U (ja) | シート形態の対象物検出装置 | |
US5257714A (en) | Method and apparatus for electronic component lead inspection | |
JPH0152897B2 (enrdf_load_stackoverflow) | ||
JP4575727B2 (ja) | 基板状態検出装置、ロボットハンド及び基板搬送用ロボット | |
US4806773A (en) | Wafer position detecting method and apparatus | |
JP2626582B2 (ja) | ウエハ位置の計測ユニットならびにウエハアライメントユニットおよび方法 | |
JP2000314608A (ja) | 撮像装置アライメントシステム及び方法 | |
US7190393B2 (en) | Camera with improved illuminator | |
CN115206852A (zh) | 工件搬运装置及映射方法 | |
JPH08124994A (ja) | ペレット分類装置 | |
JPH08148546A (ja) | ウェハ配列検出装置 | |
CN115206853A (zh) | 工件的输送装置及映射方法 | |
JP2887219B2 (ja) | 搬送装置及びその方法 |