JPH0140064Y2 - - Google Patents
Info
- Publication number
- JPH0140064Y2 JPH0140064Y2 JP15157483U JP15157483U JPH0140064Y2 JP H0140064 Y2 JPH0140064 Y2 JP H0140064Y2 JP 15157483 U JP15157483 U JP 15157483U JP 15157483 U JP15157483 U JP 15157483U JP H0140064 Y2 JPH0140064 Y2 JP H0140064Y2
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- chamber
- lens barrel
- section
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 claims description 8
- 230000020169 heat generation Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15157483U JPS6059977U (ja) | 1983-09-30 | 1983-09-30 | 電子部品試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15157483U JPS6059977U (ja) | 1983-09-30 | 1983-09-30 | 電子部品試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6059977U JPS6059977U (ja) | 1985-04-25 |
JPH0140064Y2 true JPH0140064Y2 (de) | 1989-12-01 |
Family
ID=30335847
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15157483U Granted JPS6059977U (ja) | 1983-09-30 | 1983-09-30 | 電子部品試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6059977U (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4706019A (en) * | 1985-11-15 | 1987-11-10 | Fairchild Camera And Instrument Corporation | Electron beam test probe system for analyzing integrated circuits |
JP2854466B2 (ja) * | 1992-08-28 | 1999-02-03 | 株式会社日立製作所 | 荷電粒子線装置 |
-
1983
- 1983-09-30 JP JP15157483U patent/JPS6059977U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6059977U (ja) | 1985-04-25 |
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