JPH0138269B2 - - Google Patents
Info
- Publication number
- JPH0138269B2 JPH0138269B2 JP56042652A JP4265281A JPH0138269B2 JP H0138269 B2 JPH0138269 B2 JP H0138269B2 JP 56042652 A JP56042652 A JP 56042652A JP 4265281 A JP4265281 A JP 4265281A JP H0138269 B2 JPH0138269 B2 JP H0138269B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconducting layer
- continuity
- layer
- outer semiconducting
- capacitance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56042652A JPS57172260A (en) | 1981-03-24 | 1981-03-24 | Continuity detecting method of external semiconductive electric layer of power cable |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56042652A JPS57172260A (en) | 1981-03-24 | 1981-03-24 | Continuity detecting method of external semiconductive electric layer of power cable |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57172260A JPS57172260A (en) | 1982-10-23 |
| JPH0138269B2 true JPH0138269B2 (enrdf_load_stackoverflow) | 1989-08-11 |
Family
ID=12641934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56042652A Granted JPS57172260A (en) | 1981-03-24 | 1981-03-24 | Continuity detecting method of external semiconductive electric layer of power cable |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57172260A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2557701B1 (fr) * | 1983-12-28 | 1986-04-11 | Crouzet Sa | Dispositif de controle de continuite des circuits imprimes |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5827872B2 (ja) * | 1978-02-13 | 1983-06-11 | 昭和電線電纜株式会社 | エナメル線の焼度判定方法 |
-
1981
- 1981-03-24 JP JP56042652A patent/JPS57172260A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57172260A (en) | 1982-10-23 |
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