JPH0138269B2 - - Google Patents
Info
- Publication number
- JPH0138269B2 JPH0138269B2 JP56042652A JP4265281A JPH0138269B2 JP H0138269 B2 JPH0138269 B2 JP H0138269B2 JP 56042652 A JP56042652 A JP 56042652A JP 4265281 A JP4265281 A JP 4265281A JP H0138269 B2 JPH0138269 B2 JP H0138269B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconducting layer
- continuity
- layer
- outer semiconducting
- capacitance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims description 12
- 239000010410 layer Substances 0.000 description 36
- 238000001514 detection method Methods 0.000 description 14
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 239000003973 paint Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 229910002804 graphite Inorganic materials 0.000 description 3
- 239000010439 graphite Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000011247 coating layer Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
【発明の詳細な説明】
本発明は電力ケーブルの外部半導電層の連続性
検知方法に係り、特に連続的に検知するのに好適
な検知方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting the continuity of an outer semiconducting layer of a power cable, and particularly to a method suitable for continuous detection.
プラスチツク絶縁電力ケーブルの外部半導電層
としては、(1)半導電性コンパウンドを押し出す。
(2)半導電性テープを巻く。(3)導電性ペイントを塗
る。(4)グラフアイトを塗布する。などの形成方法
があり、いずれも広く実用化されている。 The outer semiconducting layer of the plastic insulated power cable is (1) extruded with a semiconducting compound;
(2) Wrap semiconductive tape. (3) Apply conductive paint. (4) Apply graphite. There are several forming methods, all of which are widely put into practical use.
このうち(1)、(2)の方法は、確実であるが高価で
あるため、中電圧クラスのケーブルには、安価で
性能がよい(3)、(4)の方法が使用されることが多
い。しかしながら、(3)、(4)の方法には、塗布の均
一性、連続性を保つことが他の方法に比べて難し
く、信頼性に難点がある。 Among these, methods (1) and (2) are reliable but expensive, so methods (3) and (4), which are cheaper and have better performance, are used for medium voltage class cables. many. However, methods (3) and (4) have problems in reliability because it is more difficult to maintain uniformity and continuity of coating than other methods.
すなわち、導電性ペイントやグラフアイトの塗
布層を極めて薄く、しかも、均一に塗布すること
が難しい上に、従来、その均一性、連続性を検出
するのによい方法がなかつた。検知方法として
は、外部半導電層に２点で接触する電気接触子を
設け、この間の電気抵抗値を検出する方法が考え
られるが、これでは塗布層が薄く、しかも弱いた
め、外部半導電層を走行させて連続的に検知する
場合、電気接触子によつて、かえつて外部半導電
層を損傷してまうという危険があり、実用するこ
とができない。 That is, it is difficult to apply an extremely thin and even layer of conductive paint or graphite, and there has been no good method to detect the uniformity and continuity of the layer. A possible detection method is to provide an electrical contact that contacts the external semiconducting layer at two points and detect the electrical resistance between them, but in this case, the coating layer is thin and weak, so If the sensor is run for continuous detection, there is a risk that the external semiconducting layer may be damaged by the electric contact, and this cannot be put to practical use.
本発明は上記に鑑みてなされたので、その目的
とするところは、外部半導電層を傷めることな
く、それの連続性を連続的に検知することができ
る電力ケーブルの外部半導電層の連続性検知方法
を提供することにある。 The present invention has been made in view of the above, and its object is to provide continuity of the outer semiconducting layer of a power cable, the continuity of which can be continuously detected without damaging the outer semiconducting layer. The purpose is to provide a detection method.
本発明の特徴は、外部半導電層の外周に対向す
る位置２個所にそれぞれ上記外部半導電層の表面
と微小間隔を隔てて設けた検知電極間の静電容量
を測定し、上記外部半導電層の走行にともなう測
定値の変動から上記外部半導電層の連続性の有無
を検知するようにした点にある。 The feature of the present invention is to measure the capacitance between sensing electrodes provided at two opposing positions on the outer periphery of the outer semiconducting layer with a small distance from the surface of the outer semiconducting layer. The present invention is characterized in that the presence or absence of continuity of the external semiconductive layer is detected from fluctuations in measured values as the layer travels.
以下本発明の方法の一実施例を第１図ないし第
３図を用いて詳細に説明する。 An embodiment of the method of the present invention will be described in detail below with reference to FIGS. 1 to 3.
第１図は本発明に係る検知方法による外部半導
電層の連続性検知の位置付けを説明するための一
例を示す電力ケーブルの製造工程の一部の説明図
である。第１図において、１は送り出しドラム、
２は外部半導電層塗布装置、３は本発明に係る方
法を適用した外部半導電層連続性検知装置、４は
ケーブル、５は巻取ドラムであり、外部半導電層
塗布後、これの連続性を検知するようにしてあ
る。 FIG. 1 is an explanatory diagram of a part of the manufacturing process of a power cable, showing an example for explaining the positioning of detecting the continuity of an external semiconducting layer by the detection method according to the present invention. In Fig. 1, 1 is a delivery drum;
2 is an external semiconductive layer coating device, 3 is an external semiconductive layer continuity detection device to which the method according to the present invention is applied, 4 is a cable, and 5 is a winding drum, which detects the continuity of the external semiconductive layer after coating it. It is designed to detect gender.
第２図は本発明の方法の一実施例を説明するた
めの検知装置の一例を示す原理図である。 FIG. 2 is a principle diagram showing an example of a detection device for explaining an embodiment of the method of the present invention.
第２図において、６は電力ケーブル、７はケー
ブル導体および内部半導電層、８はケーブル絶縁
体、９は外部半導電層、１０，１１は外部半導電
層９の外周に対向する位置２個所にそれぞれ外部
半導電層９の表面と微小間隙を隔てて設けた検知
電極、１２は検知電極１０，１１間の静電容量を
測定する静電容量測定器である。 In FIG. 2, 6 is a power cable, 7 is a cable conductor and an inner semiconducting layer, 8 is a cable insulator, 9 is an outer semiconducting layer, and 10 and 11 are two positions facing the outer periphery of the outer semiconducting layer 9. 12 is a capacitance measuring device for measuring the capacitance between the detection electrodes 10 and 11, respectively.
第３図は検知電極１０，１１で測定される静電
容量の等価回路図である。第３図において、C1
は検知電極１０（以下電極Ａと称す）と外部半導
電層９のＣ部間の静電容量、C2は検知電極１１
（以下電極Ｂと称す）と外部半導電層９のＤ部間
の静電容量、C3はＣ部と導体および内部半導電
層７（以下Ｅで示す）間の静電容量、C4はＤ部
とＥ間の静電容量でる。 FIG. 3 is an equivalent circuit diagram of the capacitance measured by the sensing electrodes 10 and 11. In Figure 3, C 1
is the capacitance between the sensing electrode 10 (hereinafter referred to as electrode A) and the C section of the outer semiconducting layer 9, and C2 is the sensing electrode 11
(hereinafter referred to as electrode B) and the D part of the outer semiconducting layer 9, C3 is the capacitance between the C part and the conductor and the inner semiconducting layer 7 (hereinafter referred to as E), and C4 is There is a capacitance between part D and E.
この場合、電極Ａ，Ｂ間の静電容量CABは外
部半導電層９の状態により次式で示される。 In this case, the capacitance CAB between the electrodes A and B is expressed by the following equation depending on the state of the external semiconducting layer 9.
(i) Ｃ−Ｄ間に導通があるとき（均一に塗布され
ているとき）
CAB＝C1・C2／C1＋C2≒１／２C1 …(1)
(ii) Ｃ−Ｄ間に導通がないとき（均一に塗布され
ていないとき）
CAB＝１／C1＋C3／C1・C3＋C2C4／C2・C4≒C1・C3／
２（C1＋C3）＝１／２C1−C1 2／２（C1＋C3）＝１／２C
1（１−１／１＋C3／C1）…(2)
ただし、C1≒C2、C3≒C4と仮定
ところで、一般にC1、C2＜C3、C4であるが、
半導電層塗布装置２と検出装置３（第１図参照）
の間が短かいと、C3≪C4となる。このときは、
CAB≒１／C1＋C3／C1・C3＋１／C2≒１／C1＋C3／C
1・C3＋C3／C1＝１／２C1（１−１／１＋2C3／C1）…(3
)
となる。したがつてＣ−Ｄ間の導通の有無によ
り、測定される静電容量CABには、
△CAB＝１／２C1・１／１＋C3／C1 …(4)
または、
△CAB＝１／２C1・１／１＋２C3／C1 …(5)
の差が生じる。以上により、測定した静電容量値
に△CABの差が生じたか否かを検出することに
よつて、Ｃ−Ｄ間の導通の有無、つまり、外部半
導電層９の均一性、連続性をオンラインで検知す
ることができる。なお、検知電極１０，１１の電
極面積を大きくすることによつて、△CABを充
分検知可能な大きさにすることができる。(i) When there is continuity between C and D (when the coating is uniform) CAB=C 1・C 2 /C 1 +C 2 ≒1/2C 1 …(1) (ii) Between C and D When there is no continuity (when the coating is not uniform) CAB=1/C 1 +C 3 /C 1・C 3 +C 2 C 4 /C 2・C 4 ≒C 1・C 3 /
2( C1 + C3 )=1/2C1 - C12 / 2 ( C1 + C3 )=1/2C
1 (1-1/1+C 3 /C 1 )...(2) However, assuming that C 1 ≒ C 2 and C 3 ≒ C 4 By the way, generally C 1 , C 2 < C 3 , C 4 ,
Semiconductor layer coating device 2 and detection device 3 (see Figure 1)
If the interval is short, C 3 ≪ C 4 . In this case, CAB≒1/C 1 +C 3 /C 1・C 3 +1/C 2 ≒1/C 1 +C 3 /C
1・C 3 +C 3 /C 1 = 1/2C 1 (1-1/1 + 2C 3 /C 1 )…(3
) becomes. Therefore, depending on the presence or absence of continuity between C and D, the measured capacitance CAB is: △CAB=1/2C 1・1/1+C 3 /C 1 ...(4) Or, △CAB=1/2C A difference of 1・1/1+2C 3 /C 1 ...(5) occurs. As described above, by detecting whether or not there is a difference in ΔCAB in the measured capacitance values, the presence or absence of conduction between C and D, that is, the uniformity and continuity of the outer semiconducting layer 9 can be determined. Can be detected online. Note that by increasing the electrode area of the detection electrodes 10 and 11, ΔCAB can be made large enough to be detected.
上記したように、本発明の実施例によれば、外
部半導電層９の連続性（均一性）をオンラインで
検知することができ、しかも、検知電極１０，１
１は外部半導電層９からわずか離れているので、
外部半導電層９を機械的に損傷させることがな
い。このため、導電性ペイントあるいはグラフア
イト塗布による外部半導電層９に高い信頼性をも
たせることができる。 As described above, according to the embodiment of the present invention, the continuity (uniformity) of the outer semiconducting layer 9 can be detected online, and the sensing electrodes 10, 1
1 is slightly away from the outer semiconducting layer 9, so
The outer semiconducting layer 9 is not mechanically damaged. Therefore, the external semiconductive layer 9 coated with conductive paint or graphite can have high reliability.
なお、本発明は外部半導電層のみならず、絶縁
物上に導電性塗料を塗布する場合の連続性検知に
はすべて適用可能であることはいうまでもない。 It goes without saying that the present invention is applicable not only to the external semiconductive layer but also to any continuity detection in the case of applying conductive paint on an insulating material.
以上説明したように、本発明によれば、外部半
導電層を損傷させることなく、それの連続性をオ
ンラインで検知することができ、外部半導電層の
信頼性を高めることができるという効果がある。 As explained above, according to the present invention, the continuity of the outer semiconducting layer can be detected online without damaging the outer semiconducting layer, and the reliability of the outer semiconducting layer can be improved. be.
第１図は電力ケーブルの製造工程の一部の説明
図、第２図は本発明の検知方法の一実施例を説明
するための検知装置の一例を示す原理図、第３図
は第２図の２つの検知電極で測定される静電容量
の等価回路図である。
３：半導電層連続性検知装置、６：電力ケーブ
ル、７：ケーブル導体および内部半導電層、８：
ケーブル絶縁体、９：外部半導電層、１０，１
１：検知電極、１２：静電容量測定器。
FIG. 1 is an explanatory diagram of a part of the manufacturing process of a power cable, FIG. 2 is a principle diagram showing an example of a detection device for explaining an embodiment of the detection method of the present invention, and FIG. FIG. 2 is an equivalent circuit diagram of capacitance measured by two sensing electrodes. 3: Semiconducting layer continuity detection device, 6: Power cable, 7: Cable conductor and internal semiconducting layer, 8:
Cable insulation, 9: outer semiconducting layer, 10,1
1: Sensing electrode, 12: Capacitance measuring device.
Claims (1)
る位置２個所にそれぞれ前記外部半導電層の表面
と微小間隙を隔てて設けた検知電極間の静電容量
を測定し、前記外部半導電層の走行に伴う測定値
の変動から前記外部半導電層の連続性の有無を検
知することを特徴とする電力ケーブルの外部半導
電層の連続性検知方法。1. Measure the capacitance between sensing electrodes provided at two positions facing the outer periphery of the outer semiconducting layer of the power cable with a micro gap between the surface of the outer semiconducting layer and the outer semiconducting layer. A method for detecting continuity of an outer semiconductive layer of a power cable, comprising detecting the presence or absence of continuity of the outer semiconductive layer from fluctuations in measured values during running.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56042652A JPS57172260A (en) | 1981-03-24 | 1981-03-24 | Continuity detecting method of external semiconductive electric layer of power cable |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56042652A JPS57172260A (en) | 1981-03-24 | 1981-03-24 | Continuity detecting method of external semiconductive electric layer of power cable |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57172260A JPS57172260A (en) | 1982-10-23 |
| JPH0138269B2 true JPH0138269B2 (en) | 1989-08-11 |
Family
ID=12641934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56042652A Granted JPS57172260A (en) | 1981-03-24 | 1981-03-24 | Continuity detecting method of external semiconductive electric layer of power cable |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57172260A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2557701B1 (en) * | 1983-12-28 | 1986-04-11 | Crouzet Sa | CONTINUITY CHECK DEVICE FOR PRINTED CIRCUITS |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54107798A (en) * | 1978-02-13 | 1979-08-23 | Showa Electric Wire & Cable Co | Method of judging degree of baking of enameled wire |
-
1981
- 1981-03-24 JP JP56042652A patent/JPS57172260A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54107798A (en) * | 1978-02-13 | 1979-08-23 | Showa Electric Wire & Cable Co | Method of judging degree of baking of enameled wire |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57172260A (en) | 1982-10-23 |
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