Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix CorpfiledCriticalSony Tektronix Corp
Priority to JP4975684ApriorityCriticalpatent/JPS60194369A/ja
Publication of JPS60194369ApublicationCriticalpatent/JPS60194369A/ja
Publication of JPH0137696B2publicationCriticalpatent/JPH0137696B2/ja
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R13/00—Arrangements for displaying electric variables or waveforms
G01R13/20—Cathode-ray oscilloscopes
G01R13/22—Circuits therefor
G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)