JPH0136667B2 - - Google Patents
Info
- Publication number
- JPH0136667B2 JPH0136667B2 JP58071107A JP7110783A JPH0136667B2 JP H0136667 B2 JPH0136667 B2 JP H0136667B2 JP 58071107 A JP58071107 A JP 58071107A JP 7110783 A JP7110783 A JP 7110783A JP H0136667 B2 JPH0136667 B2 JP H0136667B2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- movement
- shaft
- sample
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000033001 locomotion Effects 0.000 claims description 60
- 230000003287 optical effect Effects 0.000 claims description 14
- 238000010894 electron beam technology Methods 0.000 claims description 7
- 230000009977 dual effect Effects 0.000 claims description 2
- 239000002184 metal Substances 0.000 description 5
- 238000011109 contamination Methods 0.000 description 2
- 239000000314 lubricant Substances 0.000 description 2
- 238000005096 rolling process Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
- G21K5/08—Holders for targets or for other objects to be irradiated
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7110783A JPS59196549A (ja) | 1983-04-22 | 1983-04-22 | 電子線装置等用試料装置 |
US06/601,652 US4587431A (en) | 1983-04-22 | 1984-04-18 | Specimen manipulating mechanism for charged-particle beam instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7110783A JPS59196549A (ja) | 1983-04-22 | 1983-04-22 | 電子線装置等用試料装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59196549A JPS59196549A (ja) | 1984-11-07 |
JPH0136667B2 true JPH0136667B2 (ru) | 1989-08-01 |
Family
ID=13450994
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7110783A Granted JPS59196549A (ja) | 1983-04-22 | 1983-04-22 | 電子線装置等用試料装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59196549A (ru) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2627065B2 (ja) * | 1987-06-22 | 1997-07-02 | 東芝機械株式会社 | 試料のセット装置 |
JP5403560B2 (ja) * | 2010-11-17 | 2014-01-29 | コリア ベイシック サイエンス インスティテュート | 透過電子顕微鏡の、3方向以上から試片を観察し分析するための3軸駆動が可能な試片ホルダー |
CN115200970B (zh) * | 2022-09-16 | 2023-01-03 | 常州隆斯克普电子科技有限公司 | 一种可旋转持续制冷样品台 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2489589A1 (fr) * | 1980-08-29 | 1982-03-05 | Onera (Off Nat Aerospatiale) | Dispositif de reglage de la position et de l'orientation autour d'un axe d'un porte-echantillon pour microscope electronique |
-
1983
- 1983-04-22 JP JP7110783A patent/JPS59196549A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59196549A (ja) | 1984-11-07 |
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