JPH0134058B2 - - Google Patents
Info
- Publication number
- JPH0134058B2 JPH0134058B2 JP57207847A JP20784782A JPH0134058B2 JP H0134058 B2 JPH0134058 B2 JP H0134058B2 JP 57207847 A JP57207847 A JP 57207847A JP 20784782 A JP20784782 A JP 20784782A JP H0134058 B2 JPH0134058 B2 JP H0134058B2
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- detector
- detectors
- turntable
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 claims description 56
- 230000005540 biological transmission Effects 0.000 claims description 12
- 238000013480 data collection Methods 0.000 claims description 12
- 238000003325 tomography Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 9
- 230000035945 sensitivity Effects 0.000 description 8
- 238000000034 method Methods 0.000 description 6
- 230000033001 locomotion Effects 0.000 description 5
- 238000001816 cooling Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000013519 translation Methods 0.000 description 2
- 239000011358 absorbing material Substances 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57207847A JPS5997649A (ja) | 1982-11-27 | 1982-11-27 | 放射線断層検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57207847A JPS5997649A (ja) | 1982-11-27 | 1982-11-27 | 放射線断層検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5997649A JPS5997649A (ja) | 1984-06-05 |
JPH0134058B2 true JPH0134058B2 (fr) | 1989-07-17 |
Family
ID=16546507
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57207847A Granted JPS5997649A (ja) | 1982-11-27 | 1982-11-27 | 放射線断層検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5997649A (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4420186B2 (ja) * | 2003-09-29 | 2010-02-24 | 株式会社島津製作所 | X線ct装置 |
JP4649150B2 (ja) * | 2003-10-03 | 2011-03-09 | キヤノン株式会社 | 放射線撮像装置及び撮像方法 |
JP4508789B2 (ja) * | 2004-09-07 | 2010-07-21 | キヤノン株式会社 | X線撮影装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5926607B2 (ja) * | 1975-12-02 | 1984-06-29 | 株式会社クラレ | シンキナアリルガタアルコ−ルノ セイゾウホウホウ |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5926607U (ja) * | 1982-08-11 | 1984-02-18 | 株式会社日立メデイコ | 医用x線装置 |
-
1982
- 1982-11-27 JP JP57207847A patent/JPS5997649A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5926607B2 (ja) * | 1975-12-02 | 1984-06-29 | 株式会社クラレ | シンキナアリルガタアルコ−ルノ セイゾウホウホウ |
Also Published As
Publication number | Publication date |
---|---|
JPS5997649A (ja) | 1984-06-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3449561B2 (ja) | X線ct装置 | |
US4010370A (en) | Computerized tomography apparatus with means to periodically displace radiation source | |
US4031395A (en) | Radiography | |
US11730439B2 (en) | Fast 3D radiography using X-ray flexible curved panel detector with motion compensated multiple pulsed X-ray sources | |
US3983399A (en) | Tomography system having axial scanning | |
CN101461714B (zh) | X射线ct设备 | |
JP2955165B2 (ja) | 断層撮影装置 | |
CN1989908A (zh) | X射线ct装置及其控制方法 | |
US4115696A (en) | Computed tomography scanner | |
Saito et al. | Large-area two-dimensional detector system for real-time three-dimensional CT (4D CT) | |
US4639941A (en) | Radiography | |
US4817119A (en) | Method and apparatus for computerized tomographic scanning with plural intersecting sets of parallel radiation beams | |
CN107271463B (zh) | 一种辐射态下核燃料元件的ct检测装置 | |
JPH0134058B2 (fr) | ||
EP0188782B1 (fr) | Procédé et dispositif de visualisation en radiographie sectionnelle | |
US6381299B1 (en) | X-ray examination apparatus and imaging method of X-ray image | |
JPH10307183A (ja) | 陽電子放出断層撮影法 | |
KR101665327B1 (ko) | 전산단층촬영장치 및 방법 | |
JPH0134059B2 (fr) | ||
US4160911A (en) | Fan beam CT apparatus the interbeam angle of which varies with position across the fan | |
JP3174621B2 (ja) | 産業用ct装置とそのスキャノグラム撮影方法 | |
JPH08275937A (ja) | X線断層撮影方法および装置 | |
JPS5997043A (ja) | 放射線断層検査装置 | |
JP3402722B2 (ja) | X線コンピュータ断層撮影装置 | |
JPH0779965A (ja) | X線ct装置 |