JPH0121616B2 - - Google Patents

Info

Publication number
JPH0121616B2
JPH0121616B2 JP6547379A JP6547379A JPH0121616B2 JP H0121616 B2 JPH0121616 B2 JP H0121616B2 JP 6547379 A JP6547379 A JP 6547379A JP 6547379 A JP6547379 A JP 6547379A JP H0121616 B2 JPH0121616 B2 JP H0121616B2
Authority
JP
Japan
Prior art keywords
wafer
electron beam
warpage
points
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6547379A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55157231A (en
Inventor
Hisashi Sugyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Original Assignee
CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHO ERU ESU AI GIJUTSU KENKYU KUMIAI filed Critical CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Priority to JP6547379A priority Critical patent/JPS55157231A/ja
Publication of JPS55157231A publication Critical patent/JPS55157231A/ja
Publication of JPH0121616B2 publication Critical patent/JPH0121616B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304Controlling tubes by information coming from the objects or from the beam, e.g. correction signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP6547379A 1979-05-25 1979-05-25 Method of forming pattern by electron beam Granted JPS55157231A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6547379A JPS55157231A (en) 1979-05-25 1979-05-25 Method of forming pattern by electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6547379A JPS55157231A (en) 1979-05-25 1979-05-25 Method of forming pattern by electron beam

Publications (2)

Publication Number Publication Date
JPS55157231A JPS55157231A (en) 1980-12-06
JPH0121616B2 true JPH0121616B2 (enrdf_load_stackoverflow) 1989-04-21

Family

ID=13288105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6547379A Granted JPS55157231A (en) 1979-05-25 1979-05-25 Method of forming pattern by electron beam

Country Status (1)

Country Link
JP (1) JPS55157231A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62159425A (ja) * 1986-01-08 1987-07-15 Toshiba Mach Co Ltd 荷電ビ−ム描画方法
KR100319898B1 (ko) * 2000-03-20 2002-01-10 윤종용 웨이퍼의 치수인자 측정방법 및 그 장치
KR100461024B1 (ko) * 2002-04-15 2004-12-13 주식회사 이오테크닉스 칩 스케일 마커 및 마킹 방법

Also Published As

Publication number Publication date
JPS55157231A (en) 1980-12-06

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