JPH01184191A - Ic chip and ic card - Google Patents

Ic chip and ic card

Info

Publication number
JPH01184191A
JPH01184191A JP63008452A JP845288A JPH01184191A JP H01184191 A JPH01184191 A JP H01184191A JP 63008452 A JP63008452 A JP 63008452A JP 845288 A JP845288 A JP 845288A JP H01184191 A JPH01184191 A JP H01184191A
Authority
JP
Japan
Prior art keywords
chip
strength
card
bending
average roughness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63008452A
Other languages
Japanese (ja)
Inventor
Tsumoru Kuwabara
桑原 積
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asahi Chemical Industry Co Ltd
Original Assignee
Asahi Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Chemical Industry Co Ltd filed Critical Asahi Chemical Industry Co Ltd
Priority to JP63008452A priority Critical patent/JPH01184191A/en
Publication of JPH01184191A publication Critical patent/JPH01184191A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enhance the mechanical strength of an IC chip and to prevent the damage thereof by the bending of an IC card, by specifying the center line average roughness (Ra) of the back surface of the IC chip. CONSTITUTION:When the center line average roughness of the polished surface of a silicon wafer is large, an IC chip is low in strength and extremely easy to break, because the strength of the IC chip is affected by the small injury or minute crack on the polished surface of the silicon wafer. Therefore, the center line average roughness (Ra) is set to 0.05mum or less, pref., to 0.03mum or less. When this roughness (Ra) is reduced, the strength of the IC chip becomes high. That is, the IC chip becomes extremely hard to crack even when bending deformation is generated.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、ICチップ又はこれを利用したICカードに
関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an IC chip or an IC card using the same.

(従来技術と本発明が解決すべき問題点)近年、半導体
素子(以下ICチップという)は、多くの分野において
使用されるようになったが、今後増々多くの応用分野に
おいて小型化が望まれている。この様な中にあって、あ
る種の特定の用途、たとえば現在においてはICカード
やメモリーカード等においては、工Cチップを小屋化し
、厚みも薄くする必要があり、ICチップ自体の強度が
問題になってきている。
(Prior art and problems to be solved by the present invention) In recent years, semiconductor devices (hereinafter referred to as IC chips) have come to be used in many fields, but miniaturization is desired in an increasing number of application fields in the future. ing. Under these circumstances, for certain specific applications, such as IC cards and memory cards, it is necessary to make the engineered C chip thinner and thinner, and the strength of the IC chip itself becomes an issue. It is becoming.

例えば、ICカードは、l5O(国際標準化機構)で規
格が決まっており、カードの厚みは、0.76mである
。この様な薄いカード内にICテップを装着したICカ
ードは、カード外部から力を加えると容易に折り曲げる
ことができてしまうため、カード内部のICチップの破
損を如何に防止するかが問題となる。そこでICチップ
の破損を防止する方法として現在では、ICチップ周囲
の構造を強くする方法や、カード自体を強くする方法等
で、ICチップの破損を防止する方法が検討されている
For example, the standard for IC cards is determined by 15O (International Organization for Standardization), and the thickness of the card is 0.76 m. An IC card with an IC chip mounted inside such a thin card can be easily bent if force is applied from outside the card, so the problem is how to prevent damage to the IC chip inside the card. . Therefore, methods of preventing damage to the IC chip are currently being considered, such as by strengthening the structure around the IC chip or by strengthening the card itself.

本発明はICチップ自身の強度をアップする新たな技術
を提供し、さらに又外部から折り曲げ等の力が加わった
場合においても、ICチップの破損が防止可能な信頼性
の高い、ICカードをも提供する。
The present invention provides a new technology for increasing the strength of the IC chip itself, and also provides a highly reliable IC card that can prevent damage to the IC chip even when bending or other force is applied from the outside. provide.

(問題点解決の手段) 本発明はICチップ裏面の中心線平均粗さ(Ra)が0
.05μ以下であるICチップ又はこれを装着したIC
カードを提供する。
(Means for solving the problem) The present invention has a center line average roughness (Ra) of 0 on the back surface of an IC chip.
.. IC chip with a size of 0.05μ or less or an IC equipped with it
provide the card.

本発明者はICチップの研磨状態(表面粗度)によって
ICチップの強度が大きく影響される事を発見した。す
なわちICチップ裏面の表面粗度を小さくする事によっ
てICチップ自身の強度は大巾にアップする。表面粗度
は、JISBO601−1982の表面粗さ規格により
、中心線平均粗さ(Ra)で表示される数値である。
The present inventor discovered that the strength of an IC chip is greatly influenced by the polishing state (surface roughness) of the IC chip. That is, by reducing the surface roughness of the back surface of the IC chip, the strength of the IC chip itself can be greatly increased. The surface roughness is a numerical value expressed as center line average roughness (Ra) according to the surface roughness standard of JISBO601-1982.

本発明者の実験によれば、通常用いられるICチップと
くに厚さが500μ以下のICチップ裏面の中心線平均
粗さ(Ra )を0.05μ以下にすることによりIC
テップ自身の強度は大巾にアンプすることが明らかにな
った。
According to experiments conducted by the present inventor, IC chips can be
It became clear that Tep's own strength was greatly amplified.

例えば、ICチップの用途の一つであるICカードにお
いてICカード内部に装着するICチップは、薄いカー
ド内に装着する為に、ICチップの裏面を研磨し、30
0μ程度の薄さにする必要があるがこの場合においても
、ICチップ裏面のよりICチップ自身の強度は大巾に
アンプすることが明らかになった。
For example, in an IC card, which is one of the uses for IC chips, the back side of the IC chip is polished to allow it to be installed inside a thin card.
Although it is necessary to make the thickness about 0 μm, it has become clear that even in this case, the strength of the IC chip itself is greatly amplified by the strength of the back surface of the IC chip.

ICチップの研磨方法としては、通常電気回路をウェハ
ー上に焼き付けた後に、シリコンウエノ・−を所定の厚
みに研磨し、薄くしてから、ダイシングにより分割し、
ICチップにする方法が一般的に行われている。シリコ
ンウェハーの研磨方法としては、通常用いられている方
法である平面研磨機やグラインダーを用いて研磨する。
The method of polishing IC chips is usually to bake an electric circuit onto a wafer, then polish the silicon wafer to a predetermined thickness, make it thinner, and then divide it by dicing.
A commonly used method is to make it into an IC chip. The silicon wafer is polished using a commonly used method such as a surface polisher or a grinder.

この時のシリコンウェハーの研磨状態、すなわちシリコ
ンウェハーの研磨面の粗度によってICチップの強度が
変化する事を本発明者は発見した。すなわちシリコンウ
ェハーの研磨面の中心線平均粗さ(Ra)が大きいとI
Cチップの強度は弱く、非常に割れやすい。これはシリ
コンウェハー研磨面の、小さなキズや微小なりラックが
ICチップの強度に影響している為である。必要な中心
線平均粗さ(Ra)は、用途によっても異るが通常0.
05μ以下、好ましくは0.03μ以下より好ましくは
0.02μ以下である。この粗さ(Ra)を小さくすれ
ばICテップの強度は大きくなる。すなわち曲げ変形が
発生してもICテンプは非常に割れK<くなる。
The present inventor discovered that the strength of the IC chip changes depending on the polishing state of the silicon wafer at this time, that is, the roughness of the polished surface of the silicon wafer. In other words, if the center line average roughness (Ra) of the polished surface of the silicon wafer is large, I
The strength of C-chip is weak and it is very easy to break. This is because small scratches and minute racks on the polished surface of the silicon wafer affect the strength of the IC chip. The required center line average roughness (Ra) varies depending on the application, but is usually 0.
0.05μ or less, preferably 0.03μ or less, more preferably 0.02μ or less. If this roughness (Ra) is reduced, the strength of the IC tip will be increased. That is, even if bending deformation occurs, the IC balance will be severely cracked.

以上、本発明のICチップの具体的用途の一例として、
本発明のICカードについて説明したが、ICチップの
小型化及び薄型化が必要な分野においてICチップの強
度が大きな問題であり、本発明のICチップの必要性は
非常に高く、本発明は工業的にきわめて有意義である。
As mentioned above, as an example of a specific application of the IC chip of the present invention,
Although the IC card of the present invention has been described, the strength of the IC chip is a major problem in the field where IC chips need to be made smaller and thinner, and the need for the IC chip of the present invention is very high. This is extremely meaningful.

(実施例) まず以下に図面の簡単な説明すると 第1図は、本発明の実施例に係るICチップの曲げ強度
を測定する為の定義を説明するための図である。1は曲
げ治具(先端R= 1 mri )、速度0.451R
m/min、  2はICチップ(研磨面下側)、3は
曲げ用台(間隔4 m )を示す。
(Example) First, a brief description of the drawings will be given below. FIG. 1 is a diagram for explaining the definition for measuring the bending strength of an IC chip according to an example of the present invention. 1 is a bending jig (tip R = 1 mri), speed 0.451R
2 indicates an IC chip (lower side of the polished surface), and 3 indicates a bending table (distance: 4 m).

第2図は、ICカードの耐曲げ試験における曲げ量の定
義を説明するための図である。1はカード、2はICモ
ジュール、dはカード曲げ量を示す。
FIG. 2 is a diagram for explaining the definition of the amount of bending in the bending resistance test of an IC card. 1 indicates the card, 2 indicates the IC module, and d indicates the amount of card bending.

実施例1 −5 = シリコンウェハーの裏面を研磨し、厚みを260μにす
ると共に裏面の中心線平均粗さ(Ra)を7種類の粗度
に加工し、それぞれダイシングにより5.7 HX 5
.71!11のチップに切断し曲げ強度を測定した。曲
げ強度は、第1図に示す測定法により測定した。測定結
果は第1表および第3図に示す。
Example 1-5 = The back surface of a silicon wafer was polished to a thickness of 260μ, and the center line average roughness (Ra) of the back surface was processed to seven types of roughness, each of which was 5.7 HX 5 by dicing.
.. It was cut into 71!11 chips and the bending strength was measured. The bending strength was measured by the measuring method shown in FIG. The measurement results are shown in Table 1 and Figure 3.

この測定結果から明らかなように、中心線平均粗さ(R
a )とチップ強度は、関係があり、中心線平均粗さ(
Ra )を小さくする事により、チップ強度は、大きく
なりICチップの破損を防止することができる。
As is clear from this measurement result, the centerline average roughness (R
There is a relationship between a) and chip strength, and the centerline average roughness (
By reducing Ra ), the chip strength increases and damage to the IC chip can be prevented.

第  1  表 実施例2 実施例1で作成したICチップをモジュール化し、カー
ドに実装し、耐曲げ試験を行なった。耐曲げ試験は、I
SOの最新提案に従い、カード短辺方向について第2図
に定義される曲げ量d二1゜朋の曲げを1分間に30回
のサイクルで250回与えた。試験結果は第2表に示す
。第2表に示されるようにICチップ中心線平均粗さ(
Ra)が大きいものはICチップは割れるが、中心線平
均粗さ(Ra)の小さいものは、チップは割れない。
Table 1 Example 2 The IC chip produced in Example 1 was made into a module, mounted on a card, and subjected to a bending resistance test. The bending resistance test is I
In accordance with SO's latest proposal, the card was bent 250 times in the short side direction by a bending amount d21° defined in FIG. 2 at a cycle of 30 times per minute. The test results are shown in Table 2. As shown in Table 2, the IC chip centerline average roughness (
If the center line average roughness (Ra) is large, the IC chip will crack, but if the center line average roughness (Ra) is small, the chip will not break.

第  2  表 (発明の効果) 以上のように本発明によってiCチップの機械的強度を
大きく向上でき、又、本発明のICチップを実装したI
Cカードはカードの折り曲げ等によるICチップの破損
が有効に防止され、信頼性の高いICカードを提供する
ことができる。
Table 2 (Effects of the Invention) As described above, the present invention can greatly improve the mechanical strength of the iC chip, and the IC chip mounted with the IC chip of the present invention.
In the C card, damage to the IC chip due to bending of the card or the like is effectively prevented, and a highly reliable IC card can be provided.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の実施例に係るICチップの曲げ強度
を測定する為の定義を説明するための図である。1・・
・曲げ治具(先端R:1mm)、速度0.51mi n
、2 ・I Cチップ(研磨面下側)、3・・・曲げ用
台(間隔4 mm )、第2図は、ICカードの耐曲げ
試験における曲げ量の定義を説明するための図である。 l・・・カード、2・−・ICモジュール、d・・・カ
ード曲げ量、第3図は、実施例1におけるICチップの
中心線平均粗さと曲げ破壊強度との関係を示す。 特許出願人 旭化成工業株式会社 第1図 第2図 第3図
FIG. 1 is a diagram for explaining the definition for measuring the bending strength of an IC chip according to an embodiment of the present invention. 1...
・Bending jig (tip R: 1mm), speed 0.51min
, 2 - IC chip (lower polished surface), 3... bending table (distance: 4 mm), Figure 2 is a diagram for explaining the definition of the amount of bending in the bending test of IC cards. . 1...Card, 2...IC module, d...Card bending amount FIG. 3 shows the relationship between the centerline average roughness and bending fracture strength of the IC chip in Example 1. Patent applicant: Asahi Kasei Industries, Ltd. Figure 1 Figure 2 Figure 3

Claims (2)

【特許請求の範囲】[Claims] (1)ICチツプ裏面の中心線平均粗さ(Ra)が0.
05μ以下であるICチツプ
(1) The center line average roughness (Ra) of the back surface of the IC chip is 0.
IC chip with a thickness of 05μ or less
(2)ICチツプ裏面の中心線平均粗さ(Ra)が0.
05μ以下であるICチツプを装着したICカード
(2) The center line average roughness (Ra) of the back surface of the IC chip is 0.
IC card equipped with an IC chip of 0.05μ or less
JP63008452A 1988-01-20 1988-01-20 Ic chip and ic card Pending JPH01184191A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63008452A JPH01184191A (en) 1988-01-20 1988-01-20 Ic chip and ic card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63008452A JPH01184191A (en) 1988-01-20 1988-01-20 Ic chip and ic card

Publications (1)

Publication Number Publication Date
JPH01184191A true JPH01184191A (en) 1989-07-21

Family

ID=11693520

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63008452A Pending JPH01184191A (en) 1988-01-20 1988-01-20 Ic chip and ic card

Country Status (1)

Country Link
JP (1) JPH01184191A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2740906A1 (en) * 1995-11-07 1997-05-09 Solaic Sa Integrated circuit module for plastic card
FR2741009A1 (en) * 1995-11-15 1997-05-16 Solaic Sa INTEGRATED CIRCUIT CARD AND INTEGRATED CIRCUIT MODULE

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2740906A1 (en) * 1995-11-07 1997-05-09 Solaic Sa Integrated circuit module for plastic card
FR2741009A1 (en) * 1995-11-15 1997-05-16 Solaic Sa INTEGRATED CIRCUIT CARD AND INTEGRATED CIRCUIT MODULE
WO1997018531A1 (en) * 1995-11-15 1997-05-22 Solaic Integrated circuit card and integrated circuit module

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